IP Library › Granted Patent US 12,433,049
Granted Patent B2
US 12,433,049 · App. 18/004,478 · Granted Sep 30, 2025

Imaging device and electronic apparatus

Inventor: Kouji Matsuura (Kanagawa, JP)
Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
H10F39/80373H04N25/709H04N25/78
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Quick Facts
Patent No.
US 12,433,049
App. No.
18/004,478
Granted
Sep 30, 2025
Kind
B2
Abstract

The present disclosure provides an imaging device capable of suppressing, when an analog pixel signal is compared with a predetermined reference signal, an error in inversion timing of the comparison result. The imaging device according to the present disclosure includes: a load current source; a comparator that is provided between a signal line for transmitting an analog pixel signal read from a pixel and the load current source and compares the analog pixel signal with a predetermined reference signal; and a negative capacitance circuit connected to the signal line. The load current source has two cascode-connected transistors. The negative capacitance circuit applies a voltage of the signal line to a common connection node of the two transistors of the load current source via a capacitive element without logic inversion.

Claims (34)

1. An imaging device comprising:

a load current source;

a comparator that is provided between a signal line for transmitting an analog pixel signal read from a pixel and the load current source and compares the analog pixel signal with a predetermined reference signal; and

a negative capacitance circuit connected to the signal line, wherein

the load current source includes two cascode-connected transistors, and

the negative capacitance circuit applies a voltage of the signal line to a common connection node of the two transistors of the load current source via a capacitive element without logic inversion.

2. The imaging device according to claim 1 , wherein

the load current source includes an input-side load current source and an output-side load current source, and

the comparator includes:

an input transistor connected between the signal line and the input-side load current source and having a predetermined reference signal as a gate input; and

an output transistor connected between the signal line and the output-side load current source and having an output of the input transistor as a gate input.

3. The imaging device according to claim 2 , wherein the negative capacitance circuit applies the voltage of the signal line to a common connection node of two cascode-connected transistors of the input-side load current source via the capacitive element without logic inversion.

4. The imaging device according to claim 2 , wherein the negative capacitance circuit applies the voltage of the signal line to a common connection node of two cascode-connected transistors of the output-side load current source via the capacitive element without logic inversion.

5. The imaging device according to claim 2 , wherein the negative capacitance circuit applies the voltage of the signal line to a common connection node of two cascode-connected transistors of the input-side load current source and a common connection node of two cascode-connected transistors of the output-side load current source via the capacitive element without logic inversion.

6. The imaging device according to claim 2 , wherein

a load current source for signal line having two cascode-connected transistors is connected to the signal line, and

the negative capacitance circuit applies the voltage of the signal line to a common connection node of the two cascode-connected transistors of the load current source for signal line via the capacitive element without logic inversion.

7. The imaging device according to claim 6 , further comprising:

a first adjustment unit that adjusts bias voltages of the two cascode-connected transistors of the input-side load current source and bias voltages of the two cascode-connected transistors of the output-side load current source; and

a second adjustment unit that adjusts bias voltages of the two cascode-connected transistors of the load current source for signal line.

8. The imaging device according to claim 1 , wherein

the negative capacitance circuit includes a non-inverting amplifier having an input end connected to the signal line, and

another end of the non-inverting amplifier is connected to another end of the capacitive element that has one end connected to the common connection node of the two cascode-connected transistors of the load current source.

9. The imaging device according to claim 8 , wherein

the non-inverting amplifier includes: a transistor that is connected between a high-potential-side power supply and the other end of the capacitive element and that has a gate electrode connected to the signal line; and a current source connected between the other end of the capacitive element and a low-potential-side power supply.

10. The imaging device according to claim 9 , wherein

the negative capacitance circuit includes a clamp transistor connected in parallel to the transistor constituting the non-inverting amplifier.

11. An electronic apparatus, comprising:

an imaging device that includes:

a load current source;

a comparator that is provided between a signal line for transmitting an analog pixel signal read from a pixel and the load current source and compares the analog pixel signal with a predetermined reference signal; and

a negative capacitance circuit connected to the signal line, wherein

the load current source includes two cascode-connected transistors, and

the negative capacitance circuit applies a voltage of the signal line to a common connection node of the two transistors of the load current source via a capacitive element without logic inversion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2023
From: MATSUURA, KOUJI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 062295/0686 →
Priority Claims (1)
JP 2020-120361 · Jul 14, 2020 · national
Continuity (1)
Related Publication 20230326940A1 · Oct 12, 2023
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