IP Library › Granted Patent US 12,461,144
Granted Patent B2
US 12,461,144 · App. 18/485,863 · Granted Nov 4, 2025

Rubber socket with built-in component

Inventors: Seon A Kim (Cheonan-si, KR); Yun Chan Nam (Cheonan-si, KR)
Assignee: TSE CO., LTD.
G01R31/2879G01R1/0416G01R1/0466H01R13/2414H01R13/6683
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Quick Facts
Patent No.
US 12,461,144
App. No.
18/485,863
Granted
Nov 4, 2025
Kind
B2
Abstract

Provided is a rubber socket having a structure with a built-in component. In the rubber socket with a built-in component, a connection sheet having components attached to an upper surface, a lower surface, or upper and lower surfaces of a conductive sheet composed of a conductive part and an insulating part is detachably coupled to the upper surface, the lower surface, or the upper and lower surfaces, and a guide sheet made of an inelastic insulating material is attached to an upper side, a lower side, or upper and lower sides of the connection sheet, and characteristics of a tester or a device to be tested may be tested using the components.

Claims (22)

1 . A rubber socket for connecting a device to be tested to a tester for generating a test signal to perform an electrical test on the device to be tested, wherein the tester comprises a tester pad including electrode pads each electrically connected to a plurality of terminals of the device to be tested, and a pair of communication pads at adjacent positions,

wherein the rubber socket comprises:

a conductive sheet comprising a conductive part formed in a form in which a plurality of conductive particles are included in an elastic insulating material and comprising an electrode conductive part disposed at a position corresponding to the electrode pad and a pair of communication conductive parts disposed at a position corresponding to the communication pad, and an insulating part configured to insulate adjacent conductive parts while supporting the conductive part;

a connection sheet made of an insulating material detachably coupled to an upper surface side of the conductive sheet, having connection holes formed at each position corresponding to the conductive part, and in which a connection conductive part is disposed in the connection hole corresponding to the electrode conductive part, and in which a pair of connectors are disposed in the connection hole corresponding to the communication conductive part;

a component disposed at an upper surface of the pair of connectors of the connection sheet; and

a guide sheet made of an insulating material attached to an upper surface side of the connection sheet and having guide holes formed at each position corresponding to the connection conductive part and the component,

wherein characteristics of the tester are tested through the component.

2 . The rubber socket of claim 1 , wherein the component is a resistor, an inductor, a capacitor, or an electromagnetic device in which the resistor, the inductor, and the capacitor are coupled.

3 . The rubber socket of claim 1 , wherein the connection sheet further comprises a bridge hole extended from the connection hole corresponding to the communication conductive part, and

the connector is formed in any one of a form that fills both the connection hole and the bridge hole, a form that fills a portion of the connection hole and the bridge hole, or a form that fills only the bridge hole.

4 . The rubber socket of claim 1 , wherein a thickness of the guide sheet is greater than that of the component.

5 . The rubber socket of claim 1 , wherein the connection sheet and the guide sheet are made of any one of polyimide film, engineering plastic, or synthetic resin which are inelastic insulating materials.

6 . The rubber socket of claim 1 , wherein the conductive part further comprises a conductive part lower bump protruding downward from the insulating part.

7 . The rubber socket of claim 6 , wherein a lower insulating sheet configured to support the conductive part lower bump is attached to a lower surface of the insulating part.

8 . A rubber socket for connecting a device to be tested to a tester for generating a test signal to perform an electrical test on the device to be tested, wherein the device to be tested comprises terminals of the device to be tested including electrode terminals each electrically connected to a plurality of pads of the tester, and a pair of communication terminals at adjacent positions,

wherein the rubber socket comprises:

a conductive sheet comprising a conductive part formed in a form in which a plurality of conductive particles are included in an elastic insulating material and comprising an electrode conductive part disposed at a position corresponding to the electrode terminal and a pair of communication conductive parts disposed at a position corresponding to the communication terminal, and an insulating part configured to insulate adjacent conductive parts while supporting the conductive part;

a connection sheet made of an insulating material detachably coupled to a lower surface side of the conductive sheet, having connection holes formed at each position corresponding to the conductive part and in which a connection conductive part is disposed in the connection hole corresponding to the electrode conductive part, and in which a pair of connectors are disposed in the connection hole corresponding to the communication conductive part;

a component disposed at a lower surface of the pair of connectors of the connection sheet;

a guide sheet made of an insulating material attached to a lower surface side of the connection sheet and having guide holes formed at each position corresponding to the connection conductive part and the component; and

a conductive part lower bump formed in the guide hole at a position corresponding to the connection conductive part of the guide sheet,

wherein characteristics of the device to be tested are tested through the component.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2023
From: KIM, SEON A; NAM, YUN CHAN
To: TSE CO., LTD.
Reel/Frame 065206/0087 →
Priority Claims (1)
KR 10-2022-0132927 · Oct 17, 2022 · national
Continuity (1)
Related Publication 20240125845A1 · Apr 18, 2024
References Cited (6)
US 9423419B2 · Lee · 2016 [cited by examiner]
US 9696344B2 · Lee · 2017 [cited by applicant]
US 11131707B1 · Oh · 2021 [cited by examiner]
US 11506705B2 · Oh · 2022 [cited by examiner]
US 20150084658A1 · Lee · 2015 [cited by applicant]
KR 101284212B1 · 2013 [cited by applicant]