Cross-shaped high-temperature three-dimensional hall sensor and preparation method thereof
A cross-shaped high-temperature three-dimensional Hall sensor includes the X column, the Y column and the Z column all made of third-generation semiconductor materials. The X column, the Y column and the Z column are vertically connected to each other. An electrode C1 and an electrode C2 are respectively arranged at two ends of the Z column. An electrode C3 and an electrode C4 are respectively arranged at two sides of the Y column. An electrode C5 and an electrode C6 are respectively arranged at two sides of the X column. The current description uses the excellent high temperature performance of the third generation semiconductor to make the sensor work in the high temperature environment, the new structure greatly reduces the volume compared with the other device packaging combined Hall sensor, and makes the sensor work in very narrow space.
1 . A cross-shaped high-temperature resistant three-dimensional Hall sensor, characterized by comprising: X-column, Y-column, Z-column, electrode C1, electrode C2, electrode C3, electrode C4, electrode C5, and electrode C6; the X-column, the Y-column, and the Z-column are all made of third-generation semiconductor materials, and the X-column, the Y-column, and the Z-column are vertically connected to each other; electrodes C1 and C2 are respectively set at both ends of the Z-column, electrodes C3 and C4 are set on both sides of the Y-column, and electrodes C5 and C6 are set on both sides of the X-column.
2 . The cross-shaped high-temperature three-dimensional Hall sensor according to claim 1 , wherein the X-column, the Y-column, and the Z-column form an integral molded structure.
3 . The cross-shaped high-temperature three-dimensional Hall sensor according to claim 1 , wherein the third-generation semiconductor materials is any one of gallium nitride, silicon carbide, zinc oxide, or diamond.
4 . The cross-shaped high-temperature three-dimensional Hall sensor according to claim 1 , wherein, detecting the magnetic field Bz perpendicular to this surface is detected through a plane cross-shaped structure where the electrodes C3, C4, C5, and C6 are located, electrodes C3 and C4 serve as excitation input terminals receiving input voltage or current excitation, and electrodes C5 and C6 detect output potential difference signals; or electrodes C5 and C6 can be used as excitation input terminals, receiving input voltage or current excitation, while electrodes C3 and C4 detect the output potential difference signal.
5 . The cross-shaped high-temperature three-dimensional Hall sensor according to claim 1 , wherein, when detecting the horizontal direction magnetic field, the magnitude of the By direction magnetic field is measured through the electrodes C1, C2, C5, and C6, electrodes C1, C2, or electrodes C5, C6 serve as excitation input terminals receiving input voltage or current excitation, and the magnitude of the By magnetic field is measured by detecting the potential difference between electrodes C5, C6, or electrodes C1, C2.
6 . The cross-shaped high-temperature three-dimensional Hall sensor according to claim 1 , wherein, the magnitude of the Bx direction magnetic field is measured through electrodes C1, C2, C3, and C4, electrodes C1, C2, or electrodes C3, C4 serve as excitation input terminals receiving input voltage or current excitation, and the magnitude of the Bx magnetic field is measured by detecting the potential difference between electrodes C3, C4, or electrodes C1, C2.