IP Library Granted Patent US 12,461,815
Granted Patent B2
US 12,461,815 · App. 18/512,613 · Granted Nov 4, 2025

Operation method of storage controller for nonvolatile memory device

Inventors: Youngjoo Seo (Suwon-si, KR); Youngdeok Seo (Suwon-si, KR); Sangkwon Moon (Suwon-si, KR); Hyunkyo Oh (Suwon-si, KR); Hee-Tai Oh (Suwon-si, KR); Heewon Lee (Suwon-si, KR); Jisoo Kim (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G06F11/1068G06F11/076
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Quick Facts
Patent No.
US 12,461,815
App. No.
18/512,613
Granted
Nov 4, 2025
Kind
B2
Abstract

An operation method for controlling a nonvolatile memory device includes initiating a first instance of a respective reliability operation for a respective memory block included in the nonvolatile memory device. The respective reliability operation includes detecting a degradation level of the respective memory block and setting a respective skip reference value based on the detected degradation level. The operation method also includes determining whether a respective number of consecutively skipped instances of the respective reliability operation is less than the respective skip reference value. The operation method further includes selectively skipping or performing a next instance of the respective reliability operation based on the determination result.

Claims (38)

1 . An operation method of a storage controller which is configured to control a nonvolatile memory device, the method comprising:

initiating a first instance of a respective reliability operation for a respective memory block included in the nonvolatile memory device, the respective reliability operation including detecting a degradation level of the respective memory block and setting a respective skip reference value based on the detected degradation level;

determining whether a respective number of consecutively skipped instances of the respective reliability operation is less than the respective skip reference value;

selectively skipping or performing a next instance of the respective reliability operation based on the determination result, wherein the selectively skipping or performing of the respective reliability operation includes:

when the number of consecutively skipped instances of the respective reliability operation is less than the respective skip reference value, skipping the next instance of the respective reliability operation; and

when the number of consecutively skipped instances of the respective reliability operation is equal to or greater than the respective skip reference value, performing the next instance of the respective reliability operation to obtain respective error information of the respective memory block; and

when the respective error information is less than a threshold value, updating the respective skip reference value of the respective memory block based on the respective error information, wherein the updated respective skip reference value is less than the respective skip reference value.

2 . The method of claim 1 , wherein the respective reliability operation is initiated based on a given interval indicating a read count period of the respective memory block.

3 . The method of claim 1 , wherein the respective reliability operation comprises reading data from memory cells connected with at least one word-line included in the respective memory block, and detecting and correcting an error of the read data.

4 . The method of claim 1 , further comprising:

when the respective error information is greater than or equal to a threshold value, performing a reclaim operation on the respective memory block.

5 . The method of claim 1 , wherein, when the respective error information exceeds a given reference value less than the threshold value, a second skip reference value is reset.

6 . The method of claim 1 , further comprising:

initiating a second instance of the respective reliability operation of the respective memory block;

after the first instance of the respective reliability operation is performed, determining whether a respective number of consecutively skipped instances of the respective reliability operation is equal to or greater than the updated respective skip reference value; and

selectively skipping or performing the second instance of the respective reliability operation based on the determination result.

7 . The method of claim 6 , wherein an interval between a first read count at which the first instance of the respective reliability operation is performed and a second read count at which the second instance of the respective reliability operation is performed corresponds to a reference interval.

8 . The method of claim 1 , wherein the respective skip reference value is set based on initial error information obtained by the respective reliability operation performed for a first time after a program operation is performed on the respective memory block.

9 . The method of claim 1 , wherein the respective skip reference value is set based on initial error information obtained by the respective reliability operation performed for a first time after a program operation is performed on the respective memory block and the number of program/erase cycles of the respective memory block.

10 . An operation method of a storage controller which is configured to control a nonvolatile memory device, the method comprising:

performing a respective reliability operation on a respective memory block included in the nonvolatile memory device to obtain respective error information of the respective memory block;

setting a respective skip reference value of the respective memory block based on the respective error information;

skipping the respective reliability operation on the respective memory block a number of times, wherein the number is a natural number corresponding to the respective skip reference value;

after the respective reliability operation on the respective memory block is skipped the number of times, performing the respective reliability operation on the respective memory block to obtain updated respective error information;

when the updated respective error information is smaller than a reclaim threshold value, setting an updated respective skip reference value of the respective memory block based on the updated respective error information; and

skipping the respective reliability operation of the respective memory block another number of times, wherein the other number is a natural number corresponding to the updated respective skip reference value, wherein the updated respective skip reference value is smaller than the respective skip reference value.

11 . The method of claim 10 , further comprising:

when the updated respective error information is a value that is equal to or greater than a reclaim threshold value, performing a reclaim operation on the respective memory block.

12 . The method of claim 10 , wherein the respective reliability operation of the respective memory block is initiated based on a given interval indicating a read count period of the respective memory block.

13 . An operation method of a storage controller which is configured to control a nonvolatile memory device, the method comprising:

performing a respective reliability operation on a first memory block included in the nonvolatile memory device to obtain first error information of the first memory block;

setting a first interval of the first memory block based on the first error information;

performing the respective reliability operation on the first memory block based on the first interval to obtain second error information of the first memory block;

setting a second interval of the first memory block based on the second error information; and

performing the respective reliability operation on the first memory block based on the second interval to obtain third error information of the first memory block,

wherein each of the first interval and the second interval indicates a read count of the first memory block, and the second interval is shorter than the first interval.

14 . The method of claim 13 , further comprising:

when the third error information is a value that is equal to or greater than a reclaim threshold value, performing a reclaim operation on the first memory block.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2023
From: SEO, YOUNGJOO; SEO, YOUNGDEOK; MOON, SANGKWON; OH, HYUNKYO; OH, HEE-TAI; LEE, HEEWON; KIM, JISOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 065602/0401 →
Priority Claims (3)
KR 10-2022-0155039 · Nov 18, 2022 · national
KR 10-2023-0115347 · Aug 31, 2023 · national
KR 10-2023-0136251 · Oct 12, 2023 · national
Continuity (1)
Related Publication 20240176700A1 · May 30, 2024
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