Sensor device
View Patent ↗Some of electromagnetic waves being emitted from an emission unit ( 110 ) and being reflected by a movable reflection unit ( 120 ) are reflected or scattered by a target object such as an object existing outside a sensor device ( 10 ). Some other of the electromagnetic waves being emitted by the emission unit ( 110 ) and being reflected by the movable reflection unit ( 120 ) are reflected or scattered by a structure ( 200 ) positioned closer to the movable reflection unit ( 120 ) than the target object is. A detection unit ( 122 ) detects deflection angles of the movable reflection unit ( 120 ) in a first direction (X) and a second direction (Y). An amendment unit ( 150 ) amends a detection result by the detection unit ( 122 ), based on a receiving result of the electromagnetic waves by a receiving unit ( 130 ), the electromagnetic waves being reflected or scattered by the structure ( 200 ).
1 . A sensor device comprising:
a movable reflection unit reflecting an electromagnetic wave toward inside a predetermined scanning range;
a detection unit detecting a deflection angle of the movable reflection unit;
a receiving unit receiving the electromagnetic wave reflected or scattered by a structure in which partially is positioned in the scanning range; and
an amendment unit amending a detection result by the detection unit, based on a receiving result of the electromagnetic wave by the receiving unit, the electromagnetic wave being reflected by the structure,
wherein the amendment unit amends the detection result by the detection unit, based on a relation between a first receiving value of the electromagnetic wave by the receiving unit, the electromagnetic wave being reflected or scattered by a first part of the structure, and a second receiving value of the electromagnetic wave by the receiving unit, the electromagnetic wave being reflected or scattered by a second part of the structure.
2 . The sensor device according to claim 1 , wherein
the amendment unit amends the detection result by the detection unit, based on a comparison result between the relation between the first receiving value and the second receiving value, and a relation between a first reference receiving value of the electromagnetic wave by the receiving unit, the electromagnetic wave being reflected or scattered by the first part of the structure, when the detection unit operates in a reference state and a second reference receiving value of the electromagnetic wave by the receiving unit, the electromagnetic wave being reflected or scattered by the second part of the structure, when the detection unit operates in the reference state.
3 . The sensor device according to claim 2 , further comprising
a first adjustment unit adjusting a position of the structure such that the relation between the first reference receiving value and the second reference receiving value is a predetermined reference relation.
4 . The sensor device according to claim 2 , wherein
the movable reflection unit reflects, toward inside the scanning range, the electromagnetic wave emitted from an emission unit, and
the sensor device further comprises a second adjustment unit adjusting an emission timing of the electromagnetic wave from the emission unit such that the relation between the first reference receiving value and the second reference receiving value is a predetermined reference relation.
5 . The sensor device according to claim 1 , wherein
the first part and the second part of the structure deviate in a linear drive direction of the movable reflection unit.
6 . The sensor device according to claim 1 , wherein
the first part and the second part of the structure deviate in a resonance drive direction of the movable reflection unit.
7 . The sensor device according to claim 1 , wherein
the structure is positioned outside a region where a scanning line of the movable reflection unit is formed.
8 . The sensor device according to claim 1 , wherein
the structure intersects a scanning line of the movable reflection unit.