Method and system for intelligent selectivity of material application
A method and system for applying materials to an electronic device may include generating an electromagnetic (EM) map of the device. The EM map may indicate locations of EM radiation emitted from the electronic device. The method may also include generating a thermal map of the electronic device that may indicate locations of thermal energy emitted from the device. The method may also include generating a shielding map from the EM thermal maps. The shielding map may include instructions to control a shielding apparatus, including locations on the electronic device to apply an EM shielding material and a thermal material. The method may also include controlling a shielding apparatus to apply the EM shielding material and thermal material to the electronic device, according to the shielding map. The EM shielding material and thermal material may be applied to varying depths on the electronic device.
1 . A method of controlling processes for applying material to an electronic device, the method comprising:
generating an electromagnetic (EM) map of an electronic device that indicates locations of EM radiation emitted from the electronic device;
generating a thermal map of the electronic device that indicates locations of thermal energy emitted from the electronic device;
generating, from the EM map and the thermal map, a shielding map comprising instructions to control a shielding apparatus, comprising:
locations on the electronic device to apply an EM shielding material; and
locations on the electronic device to apply a thermal material; and
controlling, using the shielding map, a shielding apparatus to apply the EM shielding material and the thermal material to the electronic device.
2 . The method of claim 1 wherein generating the EM map further comprises:
simulating a model of the electronic device to measure EM radiation;
determining locations of EM radiation on the electronic device;
creating a mapping of the locations of EM radiation on the electronic device; and
determining EM shielding materials to be applied at locations on the electronic device.
3 . The method of claim 2 , further comprising:
generating a model of the electronic device.
4 . The method of claim 1 wherein generating the thermal map comprises:
simulating a model of the electronic device to measure a thermal behavior of the electronic device;
determining locations of thermal energy on the electronic device;
creating a heat map of the electronic device; and
determining thermal materials to be applied at locations on the electronic device.
5 . The method of claim 1 wherein generating the EM map further comprises:
receiving data from probing a prototype of the electronic device;
measuring EM radiation from a scan of the electronic device;
determining locations of EM radiation generated on the electronic device; and
creating a map of the locations of EM radiation on the electronic device.
6 . The method of claim 1 wherein generating the thermal map further comprises:
receiving data from probing a prototype of the electronic device;
receiving data from a thermal scan of the electronic device;
determining locations of thermal energy on the electronic device; and
creating a heat map of the electronic device.
7 . The method of claim 1 wherein the EM map and the thermal map comprise (x,y,z) coordinates.
8 . The method of claim 1 wherein generating the EM map comprises identifying locations that are vulnerable to EM attacks.
9 . The method of claim 8 wherein identifying the locations that are vulnerable to EM attacks comprises identifying locations of antennas.
10 . A non-transitory computer-readable medium comprising instructions that, when executed by one or more processors, cause the one or more processors to perform operations comprising:
receiving an electromagnetic (EM) map of an electronic device that indicates locations of EM radiation generated on the electronic device;
receiving a thermal map of the electronic device that indicates locations of thermal energy generated on the electronic device; and
generating, from the EM map and the thermal map, a shielding map comprising instructions to control a shielding apparatus, comprising:
locations on the electronic device to apply an EM shielding material; and
locations on the electronic device to apply a thermal material; and
providing the shielding map to a shielding apparatus to apply the EM shielding material and the thermal material to the electronic device.
11 . The non-transitory computer-readable medium of claim 10 wherein generating the shielding map further comprises:
determining one or more EM shielding materials to be applied to each location based on one or more frequencies; and
determining a depth of each thermal material to be applied to each location based on a magnitude of each frequency.
12 . The non-transitory computer-readable medium of claim 10 wherein generating the shielding map further comprises:
mapping one or more thermal materials to each location based on a predetermined threshold of thermal performance; and
mapping a shielding depth of each thermal material to each location based on a magnitude of thermal energy.
13 . The non-transitory computer-readable medium of claim 10 wherein providing the shielding map comprises sending the shielding map from a first computing device to a shielding apparatus operable to deposit an EM shielding material and a thermal material on the electronic device.
14 . The non-transitory computer-readable medium of claim 10 wherein providing the shielding map comprises causing components of a computing device to execute commands which control a shielding apparatus operable to deposit an EM shielding material and a thermal material on the electronic device.
15 . A system comprising:
a shielding apparatus operable to deposit an electromagnetic (EM) shielding material and a thermal material on an electronic device;
one or more processors; and
one or more memory devices comprising instructions that, when executed by the one or more processors, cause the one or more processors to perform operations comprising:
receiving an electromagnetic (EM) map of an electronic device that indicates locations of EM radiation generated on the electronic device;
receiving a thermal map of the electronic device that indicates locations of thermal energy generated on the electronic device;
generating, from the EM map and the thermal map, a shielding map comprising instructions to control a shielding apparatus, comprising:
locations on the electronic device to apply an EM shielding material; and
locations on the electronic device to apply a thermal material; and
providing the shielding map to the shielding apparatus to apply the EM shielding material and the thermal material to the electronic device.
16 . The system of claim 15 wherein the shielding apparatus is operable to apply the EM shielding material and the thermal material according to the shielding map via electroplating.
17 . The system of claim 15 wherein the shielding apparatus is operable to apply the EM shielding material and the thermal material via sputtering according to the shielding map, wherein the shielding apparatus is further operable to deposit at least one layer of EM shielding material to a first shielding depth as a function of a frequency of EM radiation and deposit a layer of thermal material to a material depth.
18 . The system of claim 17 wherein the at least one layer of EM shielding material comprises a layer of an electrical conductor for high frequency EM shielding and a layer of a magnetic conductor for low frequency shielding.
19 . The system of claim 17 wherein the at least one layer of EM shielding material comprises a layer of alloy providing high frequency EM shielding and low frequency EM shielding to within a predetermined threshold.
20 . The system of claim 15 wherein the electronic device comprises one or more integrated circuit packages mounted on a substrate fabricated from glass or an organic material.