Electronic device and method for testing image stabilization function thereof
An electronic device and a method for testing an image stabilization function thereof are provided. The method is adapted for the electronic device including an image capturing module, and includes the following. While the electronic device is in a static state, a static image of a test pattern is captured through the image capturing module. While the electronic device is in the static state, a vibration simulation signal is provided to the image capturing module. During a period of providing the vibration simulation signal to the image capturing module, a vibration compensation image of the test pattern is captured using an Optical Image Stabilization (OIS) function through the image capturing module. According to a pattern size of the test pattern in the static image and a pattern size of the test pattern in the vibration compensation image, a test result of the OIS function is generated.
1 . A method for testing image stabilization function, adapted for an electronic device comprising an image capturing module that has an optical image stabilization function, the method comprising:
capturing a static image of a test pattern through the image capturing module while the electronic device is in a static state;
providing a vibration simulation signal to the image capturing module while the electronic device is in the static state;
capturing a vibration compensation image of the test pattern using the optical image stabilization function through the image capturing module during a period of providing the vibration simulation signal to the image capturing module; and
generating a test result of the optical image stabilization function according to a pattern size of the test pattern in the static image and a pattern size of the test pattern in the vibration compensation image.
2 . The method for testing image stabilization function according to claim 1 , wherein generating the test result of the optical image stabilization function according to the pattern size of the test pattern in the static image and the pattern size of the test pattern in the vibration compensation image comprises:
determining a simulated blur size of the test pattern according to the pattern size of the test pattern in the static image, a distance between the image capturing module and the test pattern, and a preset jitter angle; and
generating a performance test parameter of the optical image stabilization function by comparing the simulated blur size with the pattern size of the test pattern in the vibration compensation image.
3 . The method for testing image stabilization function according to claim 2 , wherein generating the performance test parameter of the optical image stabilization function by comparing the simulated blur size with the pattern size of the test pattern in the vibration compensation image comprises:
obtaining a difference between the simulated blur size and the pattern size of the test pattern in the static image;
obtaining an absolute difference between the simulated blur size and the pattern size of the test pattern in the vibration compensation image; and
generating the performance test parameter of the optical image stabilization function according to a ratio of the difference to the absolute difference.
4 . The method for testing image stabilization function according to claim 2 , wherein determining the simulated blur size of the test pattern according to the pattern size of the test pattern in the static image, the distance between the image capturing module and the test pattern, and the preset jitter angle comprises:
calculating a jitter offset amount according to a tangent value of the preset jitter angle and the distance; and
obtaining the simulated blur size of the test pattern according to the jitter offset amount and the pattern size of the test pattern in the static image.
5 . The method for testing image stabilization function according to claim 2 , wherein generating the test result of the optical image stabilization function according to the pattern size of the test pattern in the static image and the pattern size of the test pattern in the vibration compensation image further comprises:
determining that the optical image stabilization function of the electronic device is qualified in response to the performance test parameter being greater than a threshold value; and
determining that the optical image stabilization function of the electronic device is unqualified in response to the performance test parameter being not greater than the threshold value.
6 . The method for testing image stabilization function according to claim 1 , wherein the image capturing module captures the static image during a period when the optical image stabilization function is disabled.
7 . The method for testing image stabilization function according to claim 1 , wherein the test pattern comprises at least one line, the pattern size of the test pattern in the static image comprises a line width of the at least one line in the static image, and the pattern size of the test pattern in the vibration compensation image comprises a line width of the at least one line in the vibration compensation image.
8 . The method for testing image stabilization function according to claim 1 , wherein pixel values of a plurality of pixels that determine the line width of the at least one line in the vibration compensation image are within a preset range.
9 . An electronic device, comprising:
an image capturing module, having an optical image stabilization function and comprising a controller; and
a processor, coupled to the image capturing module and configured to:
capture a static image of a test pattern through the image capturing module while the electronic device is in a static state;
provide a vibration simulation signal to the controller of the image capturing module while the electronic device is in the static state;
capture a vibration compensation image of the test pattern using the optical image stabilization function through the image capturing module during a period of providing the vibration simulation signal to the controller of the image capturing module; and
generate a test result of the optical image stabilization function according to a pattern size of the test pattern in the static image and a pattern size of the test pattern in the vibration compensation image.
10 . The electronic device according to claim 9 , wherein the processor is configured to:
determine a simulated blur size of the test pattern according to the pattern size of the test pattern in the static image, a distance between the image capturing module and the test pattern, and a preset jitter angle; and
generate a performance test parameter of the optical image stabilization function by comparing the simulated blur size with the pattern size of the test pattern in the vibration compensation image.
11 . The electronic device according to claim 10 , wherein the processor is configured to:
obtain a difference between the simulated blur size and the pattern size of the test pattern in the static image;
obtain an absolute difference between the simulated blur size and the pattern size of the test pattern in the vibration compensation image; and
generate the performance test parameter of the optical image stabilization function according to a ratio of the difference to the absolute difference.
12 . The electronic device according to claim 10 , wherein the processor is configured to:
calculate a jitter offset amount according to a tangent value of the preset jitter angle and the distance; and
obtain the simulated blur size of the test pattern according to the jitter offset amount and the pattern size of the test pattern in the static image.
13 . The electronic device according to claim 10 , wherein the processor is configured to:
determine that the optical image stabilization function of the electronic device is qualified in response to the performance test parameter being greater than a threshold value; and
determine that the optical image stabilization function of the electronic device is unqualified in response to the performance test parameter being not greater than the threshold value.
14 . The electronic device according to claim 9 , wherein the image capturing module captures the static image during a period when the optical image stabilization function is disabled.
15 . The electronic device according to claim 9 , wherein the test pattern comprises at least one line, the pattern size of the test pattern in the static image comprises a line width of the at least one line in the static image, and the pattern size of the test pattern in the vibration compensation image comprises a line width of the at least one line in the vibration compensation image.
16 . The electronic device according to claim 9 , wherein pixel values of a plurality of pixels that determine a line width of at least one line in the vibration compensation image are within a preset range.