Granted Patent B1

US 12,474,392 · App. 19/254,162 · Granted Nov 18, 2025

Inventors: Yingqi Ma (Beijing, CN); Tian Yu (Hohhot, CN)

Assignee: National Space Science Center, Chinese Academy of Sciences

G01R31/265G01R31/2642G01R31/303G11C29/52

Abstract

Claims (18)

1 . A method for single event effect testing of large capacity solid state drives based on high-energy particles, comprising:

performing an solid state drive (SSD) user data preset experiment, directing data packets according to a specified size into data of an SSD under test and adding verification information to each of the data packets;

initiating irradiation testing based on the SSD user data preset experiment, judging whether electronic components in the SSD experience functional interruption or single event latch-up under irradiation conditions, and determining a judgment result;

performing functional testing according to the judgment result, obtaining a functional testing result, and performing silent data corruption testing and stuck bit error testing in a post-irradiation testing phase based on the functional testing result;

according to the silent data corruption testing and the stuck bit error testing, recording a number of silent data corruption data blocks and stuck bit error data; and

based on the number of the silent data corruption data blocks and the stuck bit error data, performing a quantitative calculation of error characteristics, and outputting a calculation result.

2 . The method for the single event effect testing of the large capacity solid state drives based on the high-energy particles according to claim 1 , wherein initiating the irradiation testing based on the SSD user data preset experiment comprises:

in a high-energy particle irradiation environment, executing a 4K Verify mixed random read-write operation test on the SSD under test in batches via a test server to obtain performance information and error information of the SSD.

3 . The method for the single event effect testing of the large capacity solid state drives based on the high-energy particles according to claim 1 , wherein judging whether the electronic components in the SSD experience the functional interruption and the single event latch-up under the irradiation conditions, and determining the judgment result comprise:

when the single event latch-up occurs, powering off and collecting overcurrent warning logs from a baseboard management controller (BMC) of a test server; and

when no single event latch-up occurs, performing the functional testing.

4 . The method for the single event effect testing of the large capacity solid state drives based on the high-energy particles according to claim 3 , wherein performing the silent data corruption testing and the stuck bit error testing in the post-irradiation testing phase based on the functional testing result comprises:

when the functional testing fails, collecting log data, performing functional recovery and firmware rewriting, and then performing the silent data corruption testing after a success; and

when the functional testing succeeds, performing the silent data corruption testing and the stuck bit error testing according to collected error log information.

5 . The method for the single event effect testing of the large capacity solid state drives based on the high-energy particles according to claim 1 , wherein according to the silent data corruption testing and the stuck bit error testing, recording the number of the silent data corruption data blocks and the stuck bit error data comprises:

performing read testing using a verify function of fio, wherein when a read data error occurs and a controller does not report the read data error, a silent data corruption error is considered to have occurred, and the number of the silent data corruption data blocks is recorded; and when repeated error correction records at fixed physical addresses are found in a dynamic random access memory during the read testing, the stuck bit error data is recorded.

6 . The method for the single event effect testing of the large capacity solid state drives based on the high-energy particles according to claim 1 , wherein based on the number of the silent data corruption data blocks and the stuck bit error data, performing the quantitative calculation of the error characteristics, and outputting the calculation result comprise:

using error data generated by a controller and a dynamic random access memory, and using the stuck bit error data to perform the quantitative calculation of the error characteristics, and counting and outputting the calculation result.

Assignments (1)

Priority Claims (1)

References Cited (11)