Shape inspection device, processing device, height image processing device
Provided are a shape inspection device, a processing device, a height image processing method, and a height image processing program capable of accurately inspecting a measurement object. A profile data generation unit sequentially generates a plurality of pieces of profile data as the measurement object relatively moves in a Y-axis direction. A height image generation unit extracts characteristic points for the respective pieces of profile data, and moves the respective pieces of profile data in a plane intersecting with a Y axis such that the extracted characteristic points are aligned in a line in a direction corresponding to the Y axis. Then, the height image generation unit arranges the moved profile data in a direction corresponding to the Y axis to correct a height image.
1 . A shape inspection device comprising:
a light projector that irradiates a measurement object relatively moving in a direction of a Y axis, which intersects with an X axis, with slit light spreading in a direction of the X axis or spot light scanning in the X-axis direction;
a light receiver that receives reflected light from each position in the X-axis direction and outputs a light reception signal indicating a light receiving amount;
a profile data generation unit that generates profile data of the measurement object in a plane intersecting with the Y-axis direction based on the light reception signal;
an inspection unit that inspects a shape of the measurement object based on the profile data generated by the profile data generation unit;
a height image generation unit that sequentially acquires the profile data of the measurement object relatively moving in the Y-axis direction and generates a height image of the measurement object based on a plurality of pieces of the sequentially acquired profile data;
a display controller that causes a display to display a height image for a setting generated by the height image generation unit; and
a setting unit that receives a setting of a two-dimensional region, which extends in the direction corresponding to the Y axis as a correction reference region, on the height image for a setting displayed on the display,
wherein the height image generation unit further
identifies profile data included in the correction reference region and calculates an inclination value of the profile data for each of the pieces of profile data generated by the profile data generation unit, and
corrects the height image by moving each of the pieces of profile data in a rotation direction in a plane, which intersects with the direction corresponding to the Y axis, based on a difference between the calculated inclination value and a predetermined correction reference angle.
2 . The shape inspection device according to claim 1 , wherein
the setting unit
receives an inclination value of one piece of the profile data included in the correction reference region as the correction reference angle, and
dynamically stores the correction reference angle in accordance with an inclination value of the measurement object for each of the height images for inspection.
3 . The shape inspection device according to claim 1 , wherein
the height image generation unit arranges the pieces of profile data, offset in the rotation direction and generates the height image representing a three-dimensional shape of the measurement object.
4 . The shape inspection device according to claim 1 , wherein
the setting unit receives an input of an angle and sets the input angle as the correction reference angle.
5 . The shape inspection device according to claim 1 , wherein
the height image generation unit projects the profile data along a straight line relative to the correction reference angle so as to correct the height image by moving each of the pieces of profile data in a rotation direction in a plane.
6 . The shape inspection device according to claim 1 , wherein
the height image generation unit rotates the profile data in accordance with the difference between the calculated inclination value and a predetermined correction reference angle so as to correct the height image by moving each of the pieces of profile data in a rotation direction in a plane.
7 . The shape inspection device according to claim 1 , wherein
wherein the height image generation unit further
extracts a characteristic point included in the correction reference region for each of the pieces of profile data generated by the profile data generation unit, and
corrects the height image by moving each of the pieces of profile data in a plane intersecting with a direction corresponding to the Y axis based on positions of a plurality of the extracted characteristic points.