IP Library › Granted Patent US 12,504,330
Granted Patent B2
US 12,504,330 · App. 18/646,379 · Granted Dec 23, 2025

Electronic detection system

Inventor: Hsien-Te Chen (Taipei, TW)
Assignee: ULTRA DISPLAY TECHNOLOGY CORP.
G01J9/0246G01J1/4257G01J2009/0284
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Quick Facts
Patent No.
US 12,504,330
App. No.
18/646,379
Granted
Dec 23, 2025
Kind
B2
Abstract

An electronic detection system includes an electronic device, a detector and a memory. The electronic device includes a circuit substrate, a plurality of photoelectric components, and a plurality of tunable current source circuits. Each photoelectric component has one or more peak emission wavelengths in response to a plurality of current values. The tunable current source circuits are disposed on the circuit substrate and electrically connected to the photoelectric components. The detector captures a feature value of a corresponding one of the photoelectric components. One or more lookup tables stored in the memory are based on the feature values and the current values of the photoelectric components. Each tunable current source circuit transmits an input current to a corresponding one of the photoelectric components in response to the lookup table(s) to perform a selected peak emission wavelength.

Claims (20)

1 . An electronic detection system, comprising:

an electronic device, comprising:

a circuit substrate,

a plurality of photoelectric components electrically connected to the circuit substrate, wherein each of the photoelectric components has one or more peak emission wavelengths in response to a plurality of current values, and

a plurality of tunable current source circuits disposed on the circuit substrate and electrically connected to the photoelectric components;

a detector separated from the electronic device with a predetermined distance, wherein the detector captures a feature value of a corresponding one of the photoelectric components; and

a memory storing one or more lookup tables, wherein the one or more lookup tables are based on the feature values and the current values of the photoelectric components;

wherein, each of the tunable current source circuits transmits an input current to a corresponding one of the photoelectric components in response to the one or more lookup tables to perform a selected one of the peak emission wavelengths.

2 . The electronic detection system of claim 1 , wherein the feature value comprises an emission wavelength value of the corresponding one of the photoelectric components.

3 . The electronic detection system of claim 2 , wherein the feature value further comprises an environmental temperature value corresponding to the emission wavelength value.

4 . The electronic detection system of claim 2 , wherein the feature value further comprises a brightness value corresponding to the corresponding one of the photoelectric components.

5 . The electronic detection system of claim 1 , wherein the detector and the photoelectric components are arranged in a one-on-multiple manner, and the detector captures an overall image of the photoelectric components.

6 . The electronic detection system of claim 1 , wherein the electronic device comprises a plurality of pixels, and each of the pixels comprises one or at least two of the photoelectric components.

7 . The electronic detection system of claim 1 , wherein a wavelength range of the peak emission wavelength of each of the photoelectric components is within 10 nm.

8 . The electronic detection system of claim 1 , wherein a wavelength range of the peak emission wavelength of each of the photoelectric components is 30 nm or more.

9 . The electronic detection system of claim 1 , wherein the photoelectric components are arranged on the circuit substrate, a carrier board or a stamp.

10 . The electronic detection system of claim 1 , further comprising:

a Michelson interferometer disposed between the detector and the electronic device; and

a functional analysis device electrically connected to the detector and the Michelson interferometer;

wherein, lights emitted from the photoelectric components are processed by the Michelson interferometer and then absorbed by the detector so as to be converted into electrical signals, and the electrical signals are transmitted to the functional analysis device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2024
From: CHEN, HSIEN-TE
To: ULTRA DISPLAY TECHNOLOGY CORP.
Reel/Frame 068822/0286 →
Continuity (2)
Provisional Application 63462870 · Apr 28, 2023
Related Publication 20240361185A1 · Oct 31, 2024
References Cited (2)
US 10012520B2 · Ip · 2018 [cited by examiner]
US 20250012847A1 · Hasegawa · 2025 [cited by examiner]