Inspection system
The present invention discloses an inspection system comprising a plurality of detectors ( 10 ) for inspecting an object, the plurality of detectors ( 10 ) sharing one or more imaging chains for inspecting a plurality of regions of interest on the object being inspected, wherein the detectors ( 10 ) capture images of the object using a combination of different imaging modes, and each region of interest is inspected by one or more detectors ( 10 ).
1 . An inspection system, comprising:
a control module; and
a plurality of detectors for inspecting an object;
wherein the detectors include one or more linear scan detectors and one or more area mode detectors;
wherein the linear scan detectors are part of one imaging chain, and the area mode detectors are part of another imaging chain; and
wherein the control module is configured to assign one or a combination of imaging chains to inspect a plurality of regions of interest on the object based on optimization of a cost function that is subjected to constraints which include image quality metrics, for the detectors of the assigned imaging chains to capture images of the object and inspect each region of interest on the object using one or a combination of different imaging modes as conducted by the linear scan detectors, the area mode detectors, or a combination thereof.
2 . The inspection system according to claim 1 , wherein the area mode detector includes a flat panel detector.
3 . The inspection system according to claim 1 , wherein the imaging modes include a linear scan imaging mode conducted by the linear scan detector, an area imaging mode conducted by the area mode detector, or a combination thereof.
4 . The inspection system according to claim 1 , wherein the imaging chain utilize x-ray detectors which operate simultaneously.
5 . The inspection system according to claim 1 , wherein the cost function measures any one or a combination of inspection time and inspection cost.
6 . The inspection system according to claim 1 , wherein the cost function is based on a model of system behaviour, experimental data collection from system operation, or a combination thereof.
7 . The inspection system according to claim 1 , wherein the cost function is a function of an area of the region of interest, a thickness of the region of interest, a size of inspectable features within the region of interest, or a combination thereof.
8 . The inspection system according to claim 1 , wherein the image quality metrics include any one or a combination of signal-to-noise ratio, resolution, bit depth, and other metrics known to measure goodness of images.
9 . A method for inspecting an object comprising the steps of:
providing a control module; and
capturing images of the object using an inspection system that comprises a plurality of detectors;
wherein the detectors include one or more linear scan detectors and one or more area mode detectors;
wherein the linear scan detectors are part of one imaging chain, and the area mode detectors are part of another imaging chain; and
wherein the control module is configured to assign one or a combination of imaging chains to inspect a plurality of regions of interest on the object based on optimization of a cost function that is subjected to constraints which include image quality metrics, for the detectors of the assigned imaging chains to capture images of the object and inspect each region of interest on the object using one or a combination of different imaging modes as conducted by the linear scan detectors, the area mode detectors, or a combination thereof.
10 . The method according to claim 9 , wherein the area mode detector is a flat panel detector.
11 . The method according to claim 9 , further comprising utilizing x-ray detectors by the imaging chains which operate simultaneously.
12 . The method according to claim 9 , wherein the cost function measures any one or a combination of inspection time and inspection cost.
13 . The method according to claim 12 , wherein the cost function is based on a model of system behavior, experimental data collection from system operation, or a combination thereof.
14 . The method according to claim 13 , wherein the cost function is a function of an area of the region of interest, a thickness of the region of interest, a size of inspectable features within the region of interest, or a combination thereof.
15 . The method according to claim 9 , wherein the image quality metrics include any one or a combination of signal-to-noise ratio, resolution, angular entropy, and bit depth.
16 . The method according to claim 15 , wherein optimization is achieved when either or both inspection time is minimized and image quality is maximized.
17 . The method according to claim 9 , wherein the constraints are sorted to regroup the regions of interest when constraint values are either met or exceeded.