Granted Patent B2

US 12,511,208 · App. 18/121,312 · Granted Dec 30, 2025

Inventors: Danilo Caraccio (Milan, IT); Daniele Balluchi (Cernusco Sul Naviglio, IT); Niccolò Izzo (Vignate, IT); Alessandro Orlando (Milan, IT)

Assignee: Micron Technology, Inc.

G06F11/263G06F11/2221G06F11/273

Abstract

Claims (54)

1 . A method, comprising:

transmitting to a host by a controller coupled to and physically located on a first electronic device, signals indicative of a quantity of tests supported by a second electronic device and a respective test descriptor for each test in response to a first command from the host;

wherein the second electronic device is coupled to the controller and physically located on the first electronic device; and

wherein the quantity of tests is a number representing a total count of how many different tests the second electronic device is capable of performing and wherein the number is stored as data by the second electronic device;

receiving from the host by the controller, signals indicative of a selection of at least one test via a second command from the host;

configuring, by the controller, all selected tests according to first configuration information associated with the second command;

configuring, by the controller, each selected test according to respective second configuration information associated with the second command; and

causing, by the controller, the at least one of the quantity of tests to be run in response to a start maintenance command from the host.

2 . The method of claim 1 , further comprising:

configuring an output log according to the first configuration information;

transmitting signals indicative of results of the at least one of the quantity of tests as the configured output log from the controller to the host in response to a get test results command from the host.

3 . The method of claim 2 , wherein configuring the output log comprises setting a format of the output log to long or short.

4 . The method of claim 2 , wherein configuring the output log comprises setting single error reporting or all error reporting.

5 . The method of claim 2 , wherein configuring the output log comprises setting a threshold quantity of errors to be reported.

6 . The method of claim 1 , wherein configuring all selected tests comprises configuring a quantity of iterations according to the first configuration information.

7 . The method of claim 1 , wherein configuring all selected tests comprises configuring a maximum execution time according to the first configuration information.

8 . The method of claim 1 , wherein configuring all selected tests comprises defining a starting address to be tested and a range of addresses to be tested according to the first configuration information.

9 . The method of claim 1 , wherein configuring each selected test comprises setting a test pattern according to the respective second configuration information.

10 . The method of claim 1 , further comprising mutually authenticating the second electronic device and the host via a security protocol and data model (SPDM) standard.

11 . An apparatus, comprising a first electronic device:

a host interface;

an electronic device interface;

a second electronic device physically located on the first electronic device and coupled to the electronic device interface; and

a controller physically located on the first electronic device and coupled to the host interface and the electronic device interface, wherein the controller is configured to:

in response to a first command received via the host interface, transmit signals via the host interface indicative of:

a quantity of tests supported by the second electronic device, wherein the quantity of tests is a number representing a total count of how many different tests the second electronic device is capable of performing and wherein the number is stored as data by the second electronic device; and

a corresponding test descriptor for each of the quantity of tests;

configure at least one of the quantity of tests according to a second command received via the host interface;

cause the at least one of the quantity of tests to be run in response to a start maintenance command from the host; and

transmit signals indicative of results of the at least one of the quantity of tests via the host interface in response to a get test results command from the host.

12 . The apparatus of claim 11 , wherein the second electronic device comprises a power management integrated circuit (PMIC).

13 . The apparatus of claim 11 , wherein the second electronic device comprises a memory device;

wherein the electronic device interface comprises a memory interface;

wherein the controller is configured to operate the host interface via a compute express link (CXL) protocol and to operate the memory interface via a double data rate (DDR) protocol.

14 . The apparatus of claim 13 , wherein the controller is configured to receive signals indicative of the test descriptors and the quantity of tests via the memory interface; and

cause the at least one of the quantity of tests to be run on the memory device coupled to the memory interface.

15 . A system, comprising:

a host; and

an electronic device coupled to the host, wherein the electronic device is configured to transmit signals indicative of:

a quantity of tests supported by the electronic device, wherein the quantity of tests is a number representing a total count of how many different tests the electronic device is capable of performing, wherein the number is stored as data by the electronic device; and

a corresponding test descriptor for each of the quantity of tests, in response to a first command received from the host;

wherein the host is configured to transmit signals to the electronic device indicative of:

a selection of at least one of the quantity of tests;

first configuration information applicable to all selected tests; and

respective second configuration information for each selected test, in a second command; and

wherein the electronic device is configured to run the selected at least one of the quantity of tests in response to a start maintenance command from the host.

16 . The system of claim 15 , wherein the host is configured to:

transmit the signals indicative of the first configuration information in a common test configuration header of the second command; and

transmit the signals indicative of the respective second configuration information in respective test configuration elements of the second command.

17 . The system of claim 15 , wherein the first configuration information includes an output log configuration selected from one of the test descriptors.

18 . The system of claim 17 , wherein the electronic device is configured to transmit signals indicative of results, comprising the output log, of the selected at least one of the quantity of tests to the host in response to a get test results command from the host.

19 . The system of claim 15 , wherein the first configuration information includes an indication of a quantity of iterations for the selected tests.

20 . The system of claim 19 , wherein the second configuration information includes a selection of a test identifier and a test pattern from one of the test descriptors.

21 . The system of claim 15 , wherein the electronic device is configured to transmit the signals indicative of the quantity of tests supported by the electronic device in a common test capability header of the response to the first command.

Assignments (1)

Continuity (2)

References Cited (9)