Semiconductor device
A semiconductor device includes: a data clock signal generator circuit configured to output a plurality of data clock signals that have different phases and that are used to generate a plurality of internal data clock signals of a memory device; a data transmitter configured to generate a data signal based on a test pattern transitioned once, delay the data signal once transitioned according to a delay value, and output the data signal to the memory device; a data receiver configured to receive an output signal from the memory device that includes first sampling data, the first sampling data being obtained by sampling the data signal based on a first internal data clock signal from the plurality of internal data clock signals; and a training circuit configured to change the delay value and determine a final value of the delay value based on the first sampling data.
1 . A semiconductor device comprising:
a data clock signal generator circuit configured to output a plurality of data clock signals that have different phases and that are used to generate a plurality of internal data clock signals of a memory device;
a data transmitter configured to generate a data signal based on a test pattern transitioned once, delay the data signal once transitioned according to a delay value, and output the data signal to the memory device;
a data receiver configured to receive an output signal from the memory device that includes first sampling data, the first sampling data being obtained by sampling the data signal based on a first internal data clock signal from the plurality of internal data clock signals; and
a training circuit configured to change the delay value and determine a final value of the delay value based on the first sampling data.
2 . The semiconductor device of claim 1 , wherein
the training circuit is configured to determine the final value of the delay value based on a sampling delay value of the first sampling data, and
wherein the sampling delay value corresponds to when a bit value of the first sampling data is transitioned.
3 . The semiconductor device of claim 1 , wherein
the training circuit is configured to determine the final value of the delay value based on an intermediate value of sampling delay values of the first sampling data,
wherein the intermediate value is between a first sampling delay value and a second sampling delay value of the sampling delay values,
wherein the first sampling delay value corresponds to when a first bit value of the first sampling data is transitioned, and the second sampling delay value corresponds to when a second bit value of the first sampling data is transitioned, and
wherein the first and second bit values are both transitioned from a same one of 1 to 0 or 0 to 1.
4 . The semiconductor device of claim 1 , wherein
the training circuit is configured to change a bit value of the test pattern, after determining the final value of the delay value, such that a timing when the data signal is transitioned is changed,
wherein the data receiver is configured to receive an output signal from the memory device that includes second sampling data, the second sampling data being obtained by sampling the data signal that has the timing changed based on a second internal data clock signal from the plurality of internal data clock signals, and
wherein the training circuit is configured to adjust a code that is used to generate the second internal data clock signal of the memory device, and is configured to determine a final value of the code based on the second sampling data.
5 . The semiconductor device of claim 4 , wherein
the training circuit is configured to determine the final value of the code based on a sampling value of the code obtained from the second sampling data, and
wherein the sampling value of the code corresponds to when a bit value of the second sampling data is transitioned.
6 . The semiconductor device of claim 4 , wherein
the training circuit is configured to change the timing when the data signal is transitioned by one unit interval (UI) by changing one bit value of the test pattern.
7 . The semiconductor device of claim 4 , wherein
the code is used to adjust a delay of a data clock signal from the plurality of data clock signals and to generate the second internal data clock signal, and
wherein the second internal data clock signal has a delay that is based on the code.
8 . The semiconductor device of claim 4 , wherein
the first internal data clock signal and the second internal data clock signal have a phase difference of 90 degrees.
9 . A method for operating a semiconductor device, comprising:
outputting a plurality of data clock signals having different phases and used in generating a plurality of internal data clock signals of a memory device;
generating a data signal based on a test pattern transitioned once, delaying the data signal once transitioned according to a delay value, and outputting the data signal to the memory device;
receiving an output signal from the memory device including first sampling data, the first sampling data being obtained by sampling the data signal based on a first internal data clock signal from the plurality of internal data clock signals; and
determining a final value of the delay value based on the first sampling data.
10 . The method of claim 9 , wherein
the determining of the final value of the delay value comprises determining a sampling delay value of the first sampling data, and
wherein the sampling delay value corresponds to when a bit value of the first sampling data is transitioned.
11 . The method of claim 9 , wherein
the determining of the final value of the delay value comprises determining an intermediate value of sampling delay values of the first sampling data,
wherein the intermediate value is between a first sampling delay value and a second sampling delay value of the sampling delay values,
wherein the first sampling delay value corresponds to when a first bit value of the first sampling data is transitioned, and the second sampling delay value corresponds to when a second bit value of the first sampling data is transitioned, and
wherein the first and second bit values are both transitioned from a same one of 1 to 0 or 0 to 1.
12 . The method of claim 9 , further comprising:
changing a bit value of the test pattern, after determining the final value of the delay value, to change a timing when the data signal is transitioned;
receiving an output signal including second sampling data from the memory device, the second sampling data being obtained by sampling the data signal that has the timing change based on a second internal data clock signal from the plurality of internal data clock signals;
adjusting a code for generating the second internal data clock signal of the memory device; and
determining a final value of the code based on the second sampling data.
13 . The method of claim 12 , wherein
the determining of the final value of the code comprises determining a sampling value of the code obtained from the second sampling data, and
wherein the sampling value of the code corresponds to when a bit value of the second sampling data is transitioned.
14 . The method of claim 12 , wherein
the changing of the bit value of the test pattern comprises changing the timing when the data signal is transitioned by one unit interval (UI).
15 . The method of claim 12 , wherein
the code is used to adjust a delay of a data clock signal from the plurality of data clock signals and to generate the second internal data clock signal, and
wherein the second internal data clock signal has a delay that is based on the code.
16 . A computing system comprising:
a memory device comprising:
a clock signal control circuit configured to receive and buffer a plurality of data clock signals with different phases and generate a plurality of internal data clock signals; and
a plurality of sampler circuits configured to sample a data signal based on the plurality of internal data clock signals and output a plurality of sampling data; and
a system on chip configured to serialize a test pattern to generate the data signal, delay the data signal according to a delay value, output the data signal to the memory device, determine a final value of the delay value based on a value of first sampling data from the plurality of sampling data, delay the data signal according to the final value of the delay value, and output the data signal that is delayed according to the final value of the delay value,
wherein the first sampling data is obtained by sampling the data signal based on a first internal data clock signal from the plurality of internal data clock signals, and
wherein the first internal data clock signal is synchronized with a timing when the data signal is transitioned.
17 . The computing system of claim 16 , wherein
the clock signal control circuit is configured to generate a second internal data clock signal from the plurality of internal data clock signals by adjusting a phase of a data clock signal from the plurality of data clock signals according to a code,
wherein the system on chip is configured to change one bit value of the test pattern to arrange a timing when the data signal is transitioned to correspond to an edge of the second internal data clock signal, adjust a value of the code, determine a final value of the code based on second sampling data, and store the final value of the code in the memory device, and
wherein the second sampling data is obtained by sampling the data signal based on the second internal data clock signal.
18 . The computing system of claim 17 , wherein
the clock signal control circuit comprises a buffer configured to generate the second internal data clock signal, and configured to adjust a delay of the data clock signal according to the code.
19 . The computing system of claim 17 , wherein
the first internal data clock signal and the second internal data clock signal have a phase difference of 90 degrees.
20 . The computing system of claim 17 , wherein
the system on chip is configured to determine the final value of the code based on a sampling value of the code obtained from the second sampling data, and
wherein the sampling value of the code corresponds to when a bit value of the second sampling data is transitioned.