Photonic integrated circuit distance measuring interferometer
A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a laser source implemented on the photonic integrated circuit configured to provide light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, a first multiplexer implemented on the photonic integrated circuit configured to split the measurement beam into a plurality of channels, and a plurality of detectors implemented on the photonic integrated circuit configured to detect an intensity value of each channel to measure a distance between the digital measuring device and the moving object.
1 . A digital measuring device implemented on a photonic integrated circuit, the digital measuring device comprising:
a laser source implemented on the photonic integrated circuit and configured to provide light;
a first waveguide structure implemented on the photonic integrated circuit and configured to direct a first portion of the light from the laser source at a moving object and receive light reflected from the moving object;
a second waveguide structure implemented on the photonic integrated circuit and configured to combine a second portion of the light from the laser source with the light reflected from the moving object to produce a measurement beam;
a first multiplexer implemented on the photonic integrated circuit and configured to split the measurement beam into a plurality of channels spaced in frequency; and
a first plurality of detectors implemented on the photonic integrated circuit and configured to detect an intensity value of each channel of the plurality of channels to measure a distance between the digital measuring device and the moving object.
2 . The digital measuring device of claim 1 , further comprising:
a controller configured to receive the intensity values detected by the plurality of detectors and measure the distance between the digital measuring device and the moving object.
3 . The digital measuring device of claim 1 , wherein the first waveguide structure, the second waveguide structure, the first multiplexer, and the first plurality of detectors are configured as a Michelson interferometer.
4 . The digital measuring device of claim 1 , wherein the laser source and the first plurality of detectors are disposed on a first substrate of the photonic integrated circuit.
5 . The digital measuring device of claim 4 , wherein the first substrate is an Indium Phosphide (InP) substrate.
6 . The digital measuring device of claim 4 , wherein the first waveguide structure, the second waveguide structure, and the first multiplexer are integrated with the laser source and the first plurality of detectors on the first substrate.
7 . The digital measuring device of claim 4 , wherein the first waveguide structure, the second waveguide structure, and the first multiplexer are integrated on a second substrate of the photonic integrated circuit.
8 . The digital measuring device of claim 7 , wherein the second substrate is a Silicon Nitride (SiN) substrate.
9 . The digital measuring device of claim 7 , wherein an edge of the first substrate is coupled to an edge of the second substrate.
10 . The digital measuring device of claim 9 , further comprising:
one or more mirrors included in the edges of the first and second substrates and configured to direct light between the first and second substrates.
11 . The digital measuring device of claim 1 , further comprising:
a third waveguide structure implemented on the photonic integrated circuit and configured to receive and reflect a third portion of the light from the laser source;
a fourth waveguide structure implemented on the photonic integrated circuit and configured to receive and reflect a fourth portion of the light from the laser source that combines with the reflected third portion of the light to produce a calibration beam;
a second multiplexer configured to split the calibration beam into a second plurality of channels spaced in frequency; and
a second plurality of detectors implemented on the photonic integrated circuit and configured to measure an intensity value of each channel of the second plurality of channels.
12 . The digital measuring device of claim 11 , wherein at least one length of at least one of the third waveguide structure or the fourth waveguide structure corresponds to a reference distance.
13 . The digital measuring device of claim 12 , wherein the digital measuring device is configured to use the intensity values measured by the second plurality of detectors to calibrate the digital measuring device.
14 . A method comprising:
generating light using a laser source implemented on a photonic integrated circuit of a digital measuring device;
directing a first portion of the light from the laser source at a moving object and receiving light reflected from the moving object using a first waveguide structure implemented on the photonic integrated circuit;
combining a second portion of the light from the laser source with the light reflected from the moving object to produce a measurement beam using a second waveguide structure implemented on the photonic integrated circuit;
splitting the measurement beam into a plurality of channels spaced in frequency using a first multiplexer implemented on the photonic integrated circuit;
detecting an intensity value of each channel of the plurality of channels using a first plurality of detectors implemented on the photonic integrated circuit; and
measuring a distance between the digital measuring device and the moving object based on the intensity values measured by the first plurality of detectors.
15 . The method of claim 14 , wherein the laser source and the first plurality of detectors are disposed on a first substrate of the photonic integrated circuit.
16 . The method of claim 15 , wherein the first waveguide structure, the second waveguide structure, and the first multiplexer are integrated with the laser source and the first plurality of detectors on the first substrate.
17 . The method of claim 15 , wherein the first waveguide structure, the second waveguide structure, and the first multiplexer are integrated on a second substrate of the photonic integrated circuit.
18 . The method of claim 17 , wherein:
an edge of the first substrate is coupled to an edge of the second substrate; and
the method further comprises directing light between the first and second substrates using one or more mirrors included in the edges of the first and second substrates.
19 . The method of claim 14 , further comprising:
receiving and reflect a third portion of the light from the laser source using a third waveguide structure implemented on the photonic integrated circuit;
receiving and reflecting a fourth portion of the light from the laser source using a fourth waveguide structure implemented on the photonic integrated circuit, the fourth portion of the light combining with the reflected third portion of the light to produce a calibration beam;
splitting the calibration beam into a second plurality of channels spaced in frequency using a second multiplexer;
measuring an intensity value of each channel of the second plurality of channels using a second plurality of detectors implemented on the photonic integrated circuit; and
using the intensity values measured by the second plurality of detectors to calibrate the digital measuring device.
20 . The method of claim 19 , wherein at least one length of at least one of the third waveguide structure or the fourth waveguide structure corresponds to a reference distance.