IP Library Granted Patent US 12,532,787
Granted Patent B2
US 12,532,787 · App. 18/212,453 · Granted Jan 20, 2026

Semiconductor package

Inventors: Jung Min Ko (Suwon-si, KR); Hyeon Jun Song (Suwon-si, KR); Hyeong Mun Kang (Suwon-si, KR); Tae Hyeong Kim (Suwon-si, KR); Young Woo Lim (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H01L25/0657H01L23/3107H01L23/49822H01L24/16H01L24/32H01L24/73H01L24/81H01L2224/16148H01L2224/16227H01L2224/26145H01L2224/26175H01L2224/32059H01L2224/32145H01L2224/32225H01L2224/73204H01L2224/81203H01L2225/06513H01L2225/06517H01L2225/06541H01L2924/1431H01L2924/1432H01L2924/1436H01L2924/1437H01L2924/1441
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Quick Facts
Patent No.
US 12,532,787
App. No.
18/212,453
Granted
Jan 20, 2026
Kind
B2
Abstract

A semiconductor package comprises a base substrate, a first semiconductor chip on the base substrate, a first dam structure which overlaps a corner of the first semiconductor chip from a plan view and is placed on the base substrate and a first fillet layer which is placed vertically between the base substrate and the first semiconductor chip, and vertically between the first dam structure and the first semiconductor chip.

Claims (56)

1 . A semiconductor package comprising:

a base substrate;

a first semiconductor chip on the base substrate;

a first dam structure which overlaps a corner of the first semiconductor chip from a plan view, and is placed on the base substrate; and

a first fillet layer which is placed vertically between the base substrate and the first semiconductor chip, and vertically between the first dam structure and the first semiconductor chip.

2 . The semiconductor package of claim 1 , wherein the first fillet layer includes a non-conductive film.

3 . The semiconductor package of claim 1 , further comprising:

a molding member which covers the base substrate, the first semiconductor chip, and the first fillet layer,

wherein the molding member is not placed between the base substrate and the first semiconductor chip.

4 . The semiconductor package of claim 1 , wherein the first fillet layer protrudes outward beyond a side surface of the first semiconductor chip.

5 . The semiconductor package of claim 1 , wherein the first dam structure includes a plurality of dams, and a combined width of the dams of the first dam structure, from a cross-sectional view, is 10% to 20% of a width of the base substrate from the cross-sectional view.

6 . The semiconductor package of claim 1 , wherein:

the first dam structure includes a first sub-dam and a second sub-dam,

the first sub-dam is nearer to a center of the first semiconductor chip than the second sub-dam, and

a height of the first sub-dam is less than a height of the second sub-dam.

7 . The semiconductor package of claim 1 , further comprising:

a second semiconductor chip on the first semiconductor chip;

a second fillet layer placed between the first semiconductor chip and the second semiconductor chip; and

a molding member which covers the base substrate, the first semiconductor chip, the first fillet layer, the second semiconductor chip, and the second fillet layer.

8 . The semiconductor package of claim 7 , further comprising:

a second dam structure which overlaps the corner of the second semiconductor chip and is placed on the first semiconductor chip,

wherein a height of the second dam structure is less than the height of the first dam structure.

9 . The semiconductor package of claim 7 , wherein the first fillet layer protrudes outward from a side surface of the first semiconductor chip beyond the second fillet layer.

10 . The semiconductor package of claim 7 , further comprising:

a connection pad and a connection bump which are placed in the second fillet layer between the first semiconductor chip and the second semiconductor chip, and electrically connect the first semiconductor chip and the second semiconductor chip.

11 . The semiconductor package of claim 1 , wherein the first dam structure does not contact the first semiconductor chip.

12 . The semiconductor package of claim 1 , wherein the first dam structure includes a plurality of dams overlapping respective corners of the first semiconductor chip from the plan view, and includes spaces between the dams along side surfaces of the first semiconductor chip.

13 . A semiconductor package comprising:

a base substrate;

a first semiconductor chip on the base substrate;

a first dam structure which overlaps a corner of the first semiconductor chip and is placed on the base substrate; and

a first filling layer formed of a non-conductive material, placed vertically between the base substrate and the first semiconductor chip, and vertically between the first dam structure and the first semiconductor chip,

wherein the first filling layer protrudes outward from an outer surface of the first dam structure and from a side surface of the first semiconductor chip.

14 . The semiconductor package of claim 13 , wherein the outer surface of the first dam structure is on the same plane as the side surface of the first semiconductor chip.

15 . The semiconductor package of claim 13 , wherein the first dam structure includes a plurality of dams, and a combined width of the dams of the first dam structure, from a cross-sectional view, is 10% to 20% of a width of the base substrate from the cross-sectional view.

16 . The semiconductor package of claim 13 , wherein the first dam structure does not contact the first semiconductor chip.

17 . The semiconductor package of claim 13 , further comprising:

a second semiconductor chip on the first semiconductor chip;

a second filling layer placed between the first semiconductor chip and the second semiconductor chip; and

a second dam structure which vertically overlaps a corner of the second semiconductor chip and is placed on the first semiconductor chip between the first semiconductor chip and the second semiconductor chip.

18 . A semiconductor package comprising:

a base substrate;

a first semiconductor chip on the base substrate;

a first dam, which vertically overlaps a first corner of the first semiconductor chip, is disposed on the base substrate, and does not contact the first semiconductor chip;

a first filling layer disposed vertically between the base substrate and the first semiconductor chip, and vertically between the first dam and the first semiconductor chip;

a second semiconductor chip on the first semiconductor chip;

a second filling layer filled vertically between the first semiconductor chip and the second semiconductor chip; and

a molding member which covers the base substrate, the first semiconductor chip, the first filling layer, and the second semiconductor chip,

wherein the molding member is not disposed between the base substrate and the first semiconductor chip.

19 . The semiconductor package of claim 18 , further comprising:

at least a second dam, which vertically overlaps a second corner of the first semiconductor chip, is disposed on the base substrate at the same vertical level as the first dam, and does not contact the first semiconductor chip,

wherein the first filling layer protrudes beyond a side surface of the first semiconductor chip, a side surface of the first dam, and a side surface of the second dam in a space between the first dam and the second dam.

20 . The semiconductor package of claim 18 , further comprising:

a second dam that overlaps a corner of the second semiconductor chip, is placed on the first semiconductor chip, and does not contact the second semiconductor chip,

wherein the first dam is vertically between the base substrate and the first semiconductor chip, and the second dam is vertically between the first semiconductor chip and the second semiconductor chip, and

wherein a height of the second dam is less than a height of the first dam.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 18, 2023
From: KO, JUNG MIN; SONG, HYEON JUN; KANG, HYEONG MUN; KIM, TAE HYEONG; LIM, YOUNG WOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 064301/0556 →
Priority Claims (1)
KR 10-2022-0088241 · Jul 18, 2022 · national
Continuity (1)
Related Publication 20240021581A1 · Jan 18, 2024
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