IP Library › Granted Patent US 12,535,502
Granted Patent B2
US 12,535,502 · App. 18/567,420 · Granted Jan 27, 2026

Measuring device

Inventor: Toshiyuki Sawada (Toyota, JP)
Assignee: FUJI CORPORATION
G01R1/073
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Quick Facts
Patent No.
US 12,535,502
App. No.
18/567,420
Granted
Jan 27, 2026
Kind
B2
Abstract

This is an improvement of a measuring device, for example, it is possible to stably measure an electrical characteristic even when a component is small. In the present measuring device, a recessed portion capable of accommodating at least a part of the components is provided in at least one of the pair of probes that grips the components. As described above, since a part of the components is accommodated in the recessed portion, it is possible to obtain at least one of the following: it is possible to more favorably grip the component by the pair of probes, and it is possible to grip the component at a fixed position by the pair of probes. As a result, it is possible to stably measure the electrical characteristic of the component.

Claims (23)

1 . A measuring device to be installed on a mounter for mounting a component supplied by a component supply device on a circuit board, the measuring device comprising:

a pair of probes configured to approach and separate, the measuring device configured to measure an electrical characteristic of the component by the pair of probes gripping the component; and

a loading stand on which the component is loaded, the loading stand including a groove section that extends in an approaching and separating direction which is a direction that the pair of probes approach and separate, wherein

a recessed portion is formed in at least one of the pair of probes that grips the component, the recessed portion is opened to face the groove section, and a length of the opening in a width direction is a length corresponding to a width of a bottom portion of the groove section.

2 . The measuring device according to claim 1 , further comprising:

the pair of probes grips the component loaded on the loading stand while approaching substantially in a horizontal direction.

3 . The measuring device according to claim 1 , wherein

the groove section includes an upper groove section having a pair of inclined side surfaces and a lower groove section provided at a lower portion of the upper groove section and having a substantially rectangular cross-section.

4 . The measuring device according to claim 1 , wherein

a depth of the recessed portion is less than ½ of a length of the component.

5 . The measuring device according to claim 1 , wherein

the at least one of the pair of probes each includes a main body portion and a recessed portion forming portion having at least a portion in which the recessed portion is formed, and

the recessed portion forming portion is detachably provided with respect to the main body portion.

6 . The measuring device according to claim 1 , wherein

the pair of probes includes a fixed element and a movable element configured to approach and separate from the fixed element, and

the recessed portion is formed in a portion of the fixed element facing the movable element.

7 . A measuring device to be installed on a mounter for mounting a component supplied by a component supply device on a circuit board, the measuring device comprising:

a pair of probes configured to approach and separate, the measuring device configured to measure an electrical characteristic of the component by the pair of probes gripping the component;

a recessed portion is formed in at least one of the pair of probes that grips the component; and

a loading stand including a groove section on which the component is loaded, wherein

the groove section extends in an approaching and separating direction which is a direction of that the pair of probes approach and separate,

the pair of probes includes a fixed element and a movable element configured to approach and separate from the fixed element, and

the measuring device further comprises an adjustment mechanism configured to adjust a relative positional relationship between the movable element and the loading stand.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2023
From: SAWADA, TOSHIYUKI
To: FUJI CORPORATION
Reel/Frame 065782/0934 →
Continuity (1)
Related Publication 20250116686A1 · Apr 10, 2025
References Cited (8)
US 4212075A · Cleversey · 1980 [cited by examiner]
US 20180203041A1 · Sawada et al. · 2018 [cited by applicant]
US 20190380236A1 · Sawada · 2019 [cited by applicant]
JP 851048A · 1966 [cited by applicant]
JP 5588388A · 1980 [cited by applicant]
JP 55112263U · 1980 [cited by applicant]
WO WO2017009987A1 · 2017 [cited by applicant]
International Search Report mailed on Aug. 31, 2021 in PCT/JP2021/022528 filed on Jun. 14, 2021 (citing references 1, 15 & 16 therein, 2 pages). [cited by applicant]