IP Library › Granted Patent US 12,542,546
Granted Patent B2
US 12,542,546 · App. 18/419,096 · Granted Feb 3, 2026

Timing margin sensor

Inventors: Marcus Van Ierssel (Toronto, CA); Jeffrey Alan Fredenburg (Chicago, IL)
Assignee: Movellus Circuits Inc.
H03K5/14G01R31/31727G06F1/08H03L7/0812H03K2005/00058
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Quick Facts
Patent No.
US 12,542,546
App. No.
18/419,096
Granted
Feb 3, 2026
Kind
B2
Abstract

A timing margin sensor includes a delay circuit to generate a calibrated delay that corresponds to a known delay value of a logic circuit. Circuitry locks a first delay produced by the delay circuit to a clock period of a clock signal that is associated with the known delay value. A programmable selector adjusts the first delay to generate the calibrated delay, the calibrated delay including a timing margin component. Circuitry detects a change in supply voltage provided to the logic circuit based on a detected change in the calibrated delay. Clock adjustment circuitry selectively changes the clock period based on the detected change in the calibrated delay.

Claims (59)

1 . A method of operation in a digital system, comprising:

calibrating a delay circuit to generate a first delay that corresponds to a known delay value of a logic circuit, the calibrating including

locking the first delay produced by the delay circuit to a clock period of a clock signal that is associated with the known delay value, and

adjusting the first delay with a programmable selector to generate a calibrated delay, the calibrated delay including a timing margin component; and

detecting a change in supply voltage provided to the logic circuit by monitoring the delay circuit for a change in the calibrated delay; and

compensating for the detected change in the calibrated delay by adjusting the clock period.

2 . The method of claim 1 , wherein the monitoring of the delay circuit for a change in the calibrated delay includes:

detecting the change in the calibrated delay to a second delay that differs from the calibrated delay by at least a threshold delay value.

3 . The method of claim 2 , wherein:

the threshold delay value is a programmable value that corresponds to a threshold timing margin.

4 . The method of claim 1 , wherein:

the locking of the first delay produced by the delay circuit to the clock period is performed by a locked-loop circuit.

5 . The method of claim 1 , wherein the adjusting of the first delay with the programmable selector to generate the calibrated delay includes:

selecting a first delayed version of the clock signal;

comparing the first delayed version of the clock signal to a next clock edge of the clock signal; and

adjusting the first delay based on a phase difference between the first delayed version of the clock signal and the next clock edge of the clock signal.

6 . The method of claim 5 , wherein the adjusting of the clock period includes:

changing the clock period to a first adjusted value;

determining whether a desired timing margin criteria is satisfied; and

selectively adjusting the clock period to a second adjusted value based on whether the desired timing margin criteria is satisfied.

7 . The method of claim 6 , wherein:

the changing of the clock period to the first adjusted value is responsive to receipt of the next clock edge of the clock signal; and

the selectively adjusting the clock period to the second adjusted value is responsive to receipt of a subsequent clock edge that immediately follows the next clock edge of the clock signal.

8 . A timing margin sensor, comprising:

a delay circuit to generate a first delay that corresponds to a known delay value of a logic circuit;

locked-loop circuitry to lock a first delay produced by the delay circuit to a clock period of a clock signal that is associated with the known delay value;

a programmable selector to adjust the first delay to generate a calibrated delay, the calibrated delay including a timing margin component;

monitoring circuitry to detect a change in supply voltage provided to the logic circuit the corresponds to a detected change in the calibrated delay; and

clock adjustment circuitry to selectively change the clock period based on the detected change in the calibrated delay.

9 . The timing margin sensor of claim 8 , wherein:

the delay circuit comprises a digitally-controlled delay line of multiple delay elements.

10 . The timing margin sensor of claim 8 , wherein:

the programmable selector provides a coarse adjustment component to the first delay as a first component of the calibrated delay.

11 . The timing margin sensor of claim 10 , further comprising:

interpolator circuitry to provide a fine adjustment component to the first delay that is combined with the coarse adjustment component.

12 . The timing margin sensor of claim 8 , wherein the programmable selector is to select a first delayed version of the clock signal, and wherein the timing margin sensor further includes:

control circuitry to compare the first delayed version of the clock signal to a next clock edge of the clock signal, the control circuitry to adjust the first delay based on a phase difference between the first delayed version of the clock signal and the next clock edge of the clock signal.

13 . The timing margin sensor of claim 12 , wherein:

the clock adjustment circuitry is to change the clock period to a first adjusted value;

the control circuitry is to determine whether a desired timing margin criteria is satisfied in response to the first adjusted value of the clock period; and

wherein the clock adjustment circuitry is to selectively adjust the clock period to a second adjusted value based on whether the desired timing margin criteria is satisfied.

14 . The timing margin sensor of claim 13 , wherein:

the clock adjustment circuitry changes the clock period to the first adjusted value in response to receipt of the next clock edge of the clock signal; and

the clock adjustment circuitry selectively adjusts the clock period to the second adjusted value in response to receipt of a subsequent clock edge that immediately follows the next clock edge of the clock signal.

15 . A digital system, comprising:

a programmable clock generator to produce a system clock signal from a reference clock signal;

system circuitry synchronized to the system clock signal; and

a timing margin sensor including

a delay circuit to generate a first delay that corresponds to a known delay value of a system circuitry;

locked-loop circuitry to lock the first delay produced by the delay circuit to a clock period of a clock signal that is associated with the known delay value;

a programmable selector to adjust the first delay to generate a calibrated delay, the calibrated delay including a timing margin component; and

monitoring circuitry to detect a change in supply voltage provided to the system circuit that corresponds to a detected change in the calibrated delay; and

clock adjustment circuitry to selectively change the clock period based on the detected change in the calibrated delay.

16 . The digital system of claim 15 , wherein:

the programmable selector provides a coarse adjustment component to the first delay as a first component of the calibrated delay.

17 . The digital system of claim 16 , further comprising:

interpolator circuitry to provide a fine adjustment component to the first delay that is combined with the coarse adjustment component.

18 . The digital system of claim 15 , wherein the programmable selector is to select a first delayed version of the clock signal, and wherein the timing margin sensor further includes:

control circuitry to compare the first delayed version of the clock signal to a next clock edge of the clock signal, the control circuitry to adjust the first delay based on a phase difference between the first delayed version of the clock signal and the next clock edge of the clock signal.

Continuity (2)
Provisional Application 63440624 · Jan 23, 2023
Related Publication 20240250673A1 · Jul 25, 2024
References Cited (2)
US 6282210B1 · Rapport · 2001 [cited by examiner]
US 10587253B1 · Huang · 2020 [cited by examiner]