Granted Patent B2

US 12,553,822 · App. 18/591,411 · Granted Feb 17, 2026

Inventors: Mark E. Lucente (Austin, TX); John Bruno (Kyle, TX); Andrew Foley (Austin, TX)

Assignee: Nanohmics, Inc.

G01N21/23G01N21/21G01N2021/0181G01N2021/216

Abstract

Claims (31)

1 . A method of determining the presence or absence of a selected analyte in a test sample, the method comprising:

exposing an all-dielectric, metasurface sensor to the test sample, wherein the all-dielectric metasurface sensor comprises a local dielectric metasurface substrate and at least one dot positioned on the metasurface substrate, the at least one dot comprising anisotropic, subwavelength nanopillars and being functionalized with binders configured to bind selectively with the analyte, wherein the anisotropic, subwavelength nanopillars are dielectric;

optically probing the all-dielectric metasurface sensor with light having a polarization state pi;

receiving at a polarization sensor, light reflected or transmitted by the at least one dot;

measuring the polarization state of light received at the polarization sensor based on a polarization analysis;

comparing the polarization state of the light received at the polarization sensor with a baseline polarization state of light; and,

based on the comparison, determining the presence or absence of the selected analyte in the test sample.

2 . The method of claim 1 , wherein the baseline polarization state of light is determined by a method comprising:

exposing the all-dielectric metasurface sensor to a control sample lacking the selected analyte; optically probing the all-dielectric metasurface sensor with light having the polarization state pi; receiving at the polarization sensor, light reflected or transmitted by the at least one dot; and,

measuring the polarization state of light received at the polarization sensor.

3 . The method of claim 1 , further comprise quantifying the amount of the selected analyte in the test sample.

4 . The method of claim 1 , wherein the polarization sensor comprises an output analyzer and a focal plane array;

and wherein, the light received at the polarization sensor is received by the output analyzer and the polarization state of the light received by the output analyzer is measured and converted to an amount of light, and the amount of light is passed to the focal plane array; and,

comparing the light received by the focal plane array with the baseline polarization state of light.

5 . The method of claim 1 , wherein the polarization state Pi is circularly, linearly, or elliptically polarized.

6 . A method for identifying an all-dielectric, metasurface sensor useful for detecting the presence or absence of a selected analyte in a test sample according to the method of claim 1 , the method comprising:

selecting parameters of the all-dielectric metasurface sensor, the parameters including at least a Dx and a Dy of the anisotropic, subwavelength nanopillars and the wavelength λ of the light having the polarization state pi, wherein the anisotropic, subwavelength nanopillars are positioned on a local metasurface substrate;

computationally performing electromagnetic simulations using the selected parameters to identify a plurality of metasurface sensor models;

based on the electromagnetic simulations, determining a figure of merit for each metasurface sensor model in the plurality of models; and,

identifying a modeled, all-dielectric metasurface sensor having a figure of merit greater than or equal to about 0.01 as being useful for detecting the presence or absence of the selected analyte in the test sample.

7 . The method of claim 6 wherein, the selected parameters further include one or both of the periodicity P and height H of the anisotropic, subwavelength nanopillars.

8 . The method of claim 6 , wherein the selected parameters further include one or more of the periodicity of the anisotropic subwavelength nanopillars, the height of the anisotropic subwavelength nanopillars, metasurface sensor composition, test sample composition, the identity of the pi; analyte dimensions, binder dimensions, and mode of metasurface sensor operation.

9 . The method of claim 1 , wherein the anisotropic subwavelength nanopillars have an elliptical or rectangular cross-section.

10 . The method of claim 1 , wherein the light is incident on the metasurface substrate.

11 . A method of determining the presence or absence of a selected analyte in a test sample, the method comprising:

exposing an all-dielectric, metasurface sensor to the test sample, wherein the all-dielectric sensor comprises a local metasurface substrate and at least one dot positioned on the local metasurface substrate, the at least one dot comprising anisotropic, subwavelength nanopillars and being functionalized with binders configured to bind selectively with the analyte;

optically probing the all-dielectric metasurface sensor with light having a polarization state pi;

receiving at an output analyzer, light reflected or transmitted by the at least one dot, wherein the output analyzer is configured to block light having a baseline polarization state, wherein the polarization axis of the output analyzer is oriented by at least ±5° relative to the baseline polarization state;

passing light having a polarization state different from the baseline polarization state to a focal plane array;

detecting light received at the focal plane array; and,

determining the presence or absence of the selected analyte in the test sample based on detection of light by the focal plane array.

Assignments (1)

Continuity (2)

References Cited (74)