RRAM device as physical unclonable function device and manufacturing method
A resistive random access memory array includes a plurality of memory cells. Each memory cell includes a gate all around transistor and a resistor device. The resistor device includes a first electrode including a plurality of conductive nanosheets. The resistor device includes a high-K resistive element surrounds the conductive nanosheets. The resistor device includes a second electrode separated from the conductive nanosheets by the resistive element. The resistive random access memory array is used to generate physical unclonable function data.
1 . A method, comprising:
receiving, with an electronic device including an integrated circuit, an authentication request;
interrogating a resistive random access memory array of the integrated circuit responsive to the authentication request;
providing, from the resistive random access memory array, a plurality of signals responsive to the interrogating;
generating, based on the signals, physical unclonable function data; and
outputting, responsive to the authentication request, the physical unclonable function data, wherein the resistive random access memory array includes a plurality of resistive random access memory cells, each resistive random access memory cell including:
a gate all around transistor including a plurality of stacked semiconductor nanosheets corresponding to channels of the gate all around transistor and a gate metal wrapped around the semiconductor nanosheets; and
a resistor device coupled to the gate all around transistor and configured to store a data value of the resistive random access memory cell and including:
a first electrode including a plurality of stacked metal nanosheets;
a resistive element wrapped around each of the metal nanosheets; and
a second electrode including the gate metal wrapped around the metal nanosheets and separated from the metal nanosheets by the resistive element, wherein generating the physical unclonable function data includes generating the physical unclonable function data based on currents flowing through the metal nanosheets and resistive elements of the random access memory cells.
2 . The method of claim 1 , wherein the physical unclonable function data includes read times of resistive random access memory cells of the resistive random access memory array.
3 . The method of claim 1 , wherein the physical unclonable function data includes data values stored in resistive random access memory cells of the resistive random access memory array upon starting up the resistive random access memory array.
4 . The method of claim 1 , wherein interrogating the resistive random access memory array includes performing a partial write operation on resistive random access memory cells of the resistive random access memory array.
5 . The method of claim 1 , wherein the second electrode includes a void.
6 . The method of claim 1 , wherein interrogating the resistive random access memory array includes interrogating the resistive random access memory array with a memory controller of the integrated circuit.
7 . The method of claim 1 , further comprising, prior to receiving the authentication request, generating initial physical unclonable function data from the resistive random access memory array.
8 . The method of claim 7 , further comprising authenticating the electronic device by comparing the physical unclonable function data to the initial physical unclonable function data.
9 . An electronic device, comprising:
a resistive random access memory array including a plurality of resistive random access memory cells each having:
a gate all around transistor including a plurality of stacked semiconductor nanosheets corresponding to channels of the gate all around transistor and a gate metal wrapped around the semiconductor nanosheets; and
a resistor device coupled to the gate all around transistor and configured to store a data value and including:
a first electrode including a plurality of stacked metal nanosheets;
a resistive element wrapped around the metal nanosheets; and
a second electrode separated from the metal nanosheets by the resistive element; and
a memory controller configured to interrogate the resistive random access memory array responsive to an authentication request, to receive signals from the resistive random access memory array responsive to the interrogation, and generate physical unclonable function data from the signals based on currents flowing through the metal nanosheets and resistive elements of the random access memory cells.
10 . The electronic device of claim 9 , wherein for each memory cell a number of the semiconductor nanosheets is equal to a number of the metal nanosheets.
11 . The electronic device of claim 9 , wherein the memory controller is configured to output the physical unclonable function data responsive to receiving the authentication request.
12 . The electronic device of claim 9 , wherein one or more of the resistive random access memory cells includes, in the second electrode, a void.
13 . The electronic device of claim 12 , wherein the physical unclonable function data is based, in part, on the void.
14 . The electronic device of claim 9 , wherein the resistive element is a high-K dielectric material.
15 . The electronic device of claim 14 , wherein the high-K dielectric material includes hafnium oxide.
16 . A non-transitory computer readable medium storing instructions that, when executed, by one or more processors cause the processors to perform a method, comprising:
receiving, with an electronic device including an integrated circuit, an authentication request;
interrogating a resistive random access memory array of the integrated circuit responsive to the authentication request;
providing, from the resistive random access memory array, a plurality of signals responsive to the interrogating;
generating, based on the signals, physical unclonable function data; and
outputting, responsive to the authentication request, the physical unclonable function data, wherein the resistive random access memory array includes a plurality of resistive random access memory cells, each resistive random access memory cell including:
a gate all around transistor including a plurality of stacked semiconductor nanosheets corresponding to channels of the gate all around transistor and a gate metal wrapped around the semiconductor nanosheets; and
a resistor device coupled to the gate all around transistor and configured to store a data value of the resistive random access memory cell and including:
a first electrode including a plurality of stacked metal nanosheets;
a resistive element wrapped around each of the metal nanosheets; and
a second electrode including the gate metal wrapped around the metal nanosheets and separated from the metal nanosheets by the resistive element, wherein generating the physical unclonable function data includes generating the physical unclonable function data based on currents flowing through the metal nanosheets and resistive elements of the random access memory cells.
17 . The non-transitory computer readable medium of claim 16 , wherein the second electrode includes a void.
18 . The non-transitory computer readable medium of claim 16 , wherein interrogating the resistive random access memory array includes interrogating the resistive random access memory array with a memory controller of the integrated circuit.
19 . The non-transitory computer readable medium of claim 16 , further comprising, prior to receiving the authentication request, generating initial physical unclonable function data from the resistive random access memory array.
20 . The non-transitory computer readable medium of claim 19 , further comprising authenticating the electronic device by comparing the physical unclonable function data to the initial physical unclonable function data.