IP Library › Granted Patent US 12,569,937
Granted Patent B2
US 12,569,937 · App. 17/731,224 · Granted Mar 10, 2026

Through-glass via-hole formation method

Inventors: Sung Soo Park (Yongin-si, KR); Hong Jin Park (Anyang-si, KR); Ju Ho Jang (Sejong-si, KR)
Assignee: JOONGWOO M-TECH CO., LTD.
B23K26/362B23K26/40C03C15/00C03C23/0025B23K2103/54C03C2203/50
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Quick Facts
Patent No.
US 12,569,937
App. No.
17/731,224
Granted
Mar 10, 2026
Kind
B2
Abstract

A through-glass via-hole formation method includes: forming a hole-shaped deformed region extending in a thickness direction of a glass substrate by irradiating the glass substrate with a laser beam at an energy intensity not exceeding an ablation threshold of the glass substrate; and forming a via-hole through the glass substrate along the deformed region by immersing the glass substrate in an etching solution such that the deformed region is etched and removed, wherein an etching solution having a first concentration is used as the etching solution to allow the via-hole to have a first aspect ratio, and an etching solution having a second concentration greater than the first concentration is used as the etching solution to allow the via-hole to have a second aspect ratio smaller than the first aspect ratio.

Claims (8)

1 . A through-glass via-hole formation method, comprising:

forming a hole-shaped deformed region extending from an upper surface to a lower surface of a glass substrate by irradiating the glass substrate with a laser beam at an energy intensity not exceeding an ablation threshold of the glass substrate, thereby causing a permanent physicochemical structural deformation in the irradiated region such that the irradiated region is etched faster than a non-irradiated region;

immersing the glass substrate in a first etching solution having a first concentration to preferentially etch and remove the deformed region and open a via-hole through the glass substrate with a first aspect ratio; and

subsequently immersing the glass substrate in a second etching solution having a second concentration greater than the first concentration to increase a diameter of the via-hole relative to its length and reduce the aspect ratio to a second aspect ratio smaller than the first aspect ratio,

wherein a difference in etching velocity between the deformed region and the non-irradiated region when using the first etching solution is greater than a difference in etching velocity between the deformed region and the non-irradiated region when using the second etching solution,

wherein the aspect ratio is defined as a ratio of a via-hole length to a via-hole diameter.

2 . The through-glass via-hole formation method according to claim 1 , wherein the deformed region has a cross-sectional area smaller than a cross-sectional area of the via-hole formed after the subsequently immersing step.

3 . The through-glass via-hole formation method according to claim 1 , wherein lowering a temperature of the first etching solution enables the via-hole to have a greater aspect ratio than the first aspect ratio.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2025
From: JOONGWOO M-TECH CO.,LTD.
To: JWMT INC.
Reel/Frame 070837/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2025
From: JOONGWOO NARA CO.,LTD.; BSP CO., LTD.
To: JOONGWOO M-TECH CO., LTD.
Reel/Frame 069830/0830 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2022
From: PARK, SUNG SOO; PARK, HONG JIN; JANG, JU HO
To: JOONGWOO NARA CO.,LTD.; BSP CO., LTD.
Reel/Frame 059741/0176 →
Priority Claims (1)
KR 10-2021-0091757 · Jul 13, 2021 · national
Continuity (1)
Related Publication 20230017356A1 · Jan 19, 2023
References Cited (7)
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US 20200254567A1 · Genier · 2020 [cited by examiner]
KR 1020130135873A · 2013 [cited by applicant]
KR 102205333B1 · 2021 [cited by applicant]
CAO (Year: 2019). [cited by examiner]
Office Action of Korean Patent Application No. 10-2021-0091757 mailed Apr. 25, 2023. [cited by applicant]