Granted Patent B2

US 12,575,767 · App. 17/610,644 · Granted Mar 17, 2026

Inventors: Ayaka Hori (Kyoto, JP); Shin Nakamura (Kyoto, JP); Satoshi Yomota (Kyoto, JP); Nobuyuki Akinaga (Kyoto, JP)

Assignee: SHIMADZU CORPORATION

A61B5/14553A61B5/0042A61B5/0059A61B5/6814

Abstract

Claims (44)

1 . An optical measurement device comprising:

a device main body configured to irradiate a head surface of a head of a subject with measurement light via a light-transmitting probe and detect the measurement light emitted from the head surface by way of an inside of the head via a light-receiving probe;

a holder configured to be attached to the head of the subject; and

a probe unit held by the holder,

wherein the probe unit includes:

a base member rotatably held by the holder about a central axis;

the light-transmitting probe protruding from the base member in a first direction toward the head surface;

the light-receiving probe protruding from the base member in the first direction; and

a plurality of linear pin members, each protruding linearly from the base member in the first direction for parting hairs of the head surface,

wherein a central axis line of each linear pin member of the plurality of linear pin members is inclined obliquely at least either in a direction toward a central axis of the base member or in a circumferential direction about the central axis.

2 . The optical measurement device as recited in claim 1 ,

wherein the plurality of linear pin members is arranged side by side in the circumferential direction about the central axis of the base member so as to surround the central axis and is configured to lift the hairs in a center side region surrounded by the plurality of linear pin members in accordance with rotation of the probe unit.

3 . The optical measurement device as recited in claim 2 ,

wherein tips of the plurality of linear pin members are arranged side by side on a circumference about the central axis of the base member, and

wherein each of a tip of the light-transmitting probe and a tip of the light-receiving probe is arranged at a position on the circumference or at an outer position close to the circumference.

4 . The optical measurement device as recited in claim 1 ,

wherein each of the light-transmitting probe and the light-receiving probe is provided to the base member so as to be movable between a first position away from the head surface than the plurality of linear pin members and a second position closer to the head surface than the plurality of linear pin members.

5 . The optical measurement device as recited in claim 4 ,

wherein the probe unit further includes:

a lock mechanism configured to releasably hold each of the light-transmitting probe and the light-receiving probe at the first position; and

a biasing member configured to bias each of the light-transmitting probe and the light-receiving probe toward the second position.

6 . The optical measurement device as recited in claim 1 ,

wherein the probe unit further includes a grip portion protruding from the base member in a second direction opposite to the first direction, and

wherein the light-transmitting probe, the light-receiving probe, the plurality of linear pin members, and the grip portion are provided to the base member so as to be rotated integrally with the base member.

7 . The optical measurement device as recited in claim 1 ,

wherein in the circumferential direction about the central axis of the base member, at least one of the plurality of linear pin members is arranged between the light-transmitting probe and the light-receiving probe arranged adjacently.

8 . The optical measurement device as recited in claim 1 ,

wherein the light-transmitting probe and the light-receiving probe are each detachably attached to the base member.

9 . A probe holder set for an optical measurement device comprising:

a holder configured to be attached to a head of a subject; and

a probe unit held by the holder,

wherein the probe unit includes:

a base member rotatably held by the holder about a central axis;

a light-transmitting probe protruding from the base member in a first direction toward a head surface of the head of the subject;

a light-receiving probe protruding from the base member in the first direction; and

a plurality of linear pin members each protruding linearly from the base member in the first direction for parting hairs of the head surface, and

wherein a central axis line of each linear pin member of the plurality of linear pin members is inclined obliquely at least either in a direction toward a central axis of the base member or in a circumferential direction about the central axis, and

wherein the probe holder set is configured to irradiate the head surface of the subject with a measurement light via the light-transmitting probe and detect the measurement light emitted from the head surface by way of an inside of the head via the light-receiving probe.

10 . The optical measurement device as recited in claim 1 ,

wherein the central axis line of each linear pin member of the plurality of linear pin members is inclined obliquely at an inclination angle θ between 1 degree and 10 degrees with respect to the central axis.

11 . The optical measurement device as recited in claim 1 , wherein each linear pin member of the plurality of linear pin members has a tapered tip.

12 . The probe holder set for an optical measurement device as recited in claim 9 ,

wherein the central axis line of each linear pin member of the plurality of linear pin members is inclined obliquely at an inclination angle θ between 1 degree and 10 degrees with respect to the central axis.

13 . The probe holder set for an optical measurement device as recited in claim 9 , wherein each linear pin member of the plurality of linear pin members has a tapered tip.

Assignments (1)

Priority Claims (1)

Continuity (1)

References Cited (14)