IP Library › Granted Patent US 12,581,967
Granted Patent B2
US 12,581,967 · App. 18/022,915 · Granted Mar 17, 2026

Circuit board and semiconductor package board comprising same

Inventor: Il Sik Nam (Seoul, KR)
Assignee: LG INNOTEK CO., LTD.
H01L23/49827H01L21/481H01L24/16H01L24/26H01L24/29H01L24/32H01L24/73H01L24/83H01L2224/16227H01L2224/26175H01L2224/2919H01L2224/32225H01L2224/73204H01L2224/83007H01L2224/83102H01L2224/83104H01L2924/0665
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Quick Facts
Patent No.
US 12,581,967
App. No.
18/022,915
Granted
Mar 17, 2026
Kind
B2
Abstract

A circuit board according to an embodiment includes an insulating layer; a circuit pattern disposed on the insulating layer, and a first protective layer disposed on the insulating layer, wherein the first protective layer includes a first opening vertically overlapping at least a part of an upper surface of the circuit pattern; wherein an inner wall of the first protective layer constituting the first opening includes: a first portion having a first inclination, and a second portion disposed on the first portion and having a second inclination different from the first inclination, and wherein the first portion overlaps the circuit pattern in a horizontal direction.

Claims (47)

1 . A circuit board comprising:

an insulating layer;

a circuit pattern disposed on the insulating layer; and

a first protective layer disposed on the insulating layer having a first opening overlapping the circuit pattern in a vertical direction,

wherein an inner wall of the first opening of the first protective layer includes:

a first portion connected to a lower surface of the first protective layer and overlapping the circuit pattern in a horizontal direction; and

a second portion provided between an upper surface of the first protective layer and the first portion and not overlapping with the circuit pattern in the horizontal direction;

wherein the first portion has a first inclination, and the second portion has a second inclination different from the first inclination, and

wherein the second portion has a curved surface having a first curvature.

2 . The circuit board of claim 1 , wherein the first portion is perpendicular to the lower surface of the first protective layer.

3 . The circuit board of claim 1 , wherein a surface roughness of the first portion of the first protective layer is different from a surface roughness of the second portion of the first protective layer.

4 . The circuit board of claim 1 , wherein a height of a boundary between the first portion and the second portion is higher than or equal to a height of the circuit pattern.

5 . The circuit board of claim 1 , further comprising:

a second protective layer disposed on the first protective layer,

wherein the second protective layer includes a second opening vertically overlapping the first opening.

6 . The circuit board of claim 5 , wherein a width of the second opening is greater than a width of the first opening.

7 . The circuit board of claim 5 , wherein an inner wall of the second opening of the second protective layer includes a third portion having a third inclination different from the first inclination and the second inclination of the first portion and the second portion of the first protective layer.

8 . The circuit board of claim 7 , wherein the third portion is a curved surface having a second curvature different from the first curvature of the second portion.

9 . The circuit board of claim 8 , wherein the second curvature is greater than the first curvature.

10 . The circuit board of claim 7 , wherein the third portion does not overlap with the first portion in a vertical direction.

11 . The circuit board of claim 10 , wherein the third portion does not overlap with the second portion in a vertical direction.

12 . The circuit board of claim 1 , wherein the circuit pattern includes a plurality of pads, and

wherein the plurality of pads are overlapped with the first opening in the vertical direction and spaced apart from each other in the horizontal direction.

13 . A semiconductor package comprising:

an insulating layer;

a plurality of pads disposed on the insulating layer and spaced apart from each other in a horizontal direction;

a first protective layer disposed on the insulating layer and having a first opening overlapping the plurality of pads in a vertical direction;

a contacting portion disposed on the plurality of pads;

a semiconductor device disposed on the contacting portion; and

a molding layer for molding the semiconductor device;

wherein an inner wall of the first opening of the first protective layer includes:

a first portion connected to a lower surface of the first protective layer and overlapping a circuit pattern in a horizontal direction; and

a second portion provided between an upper surface of the first protective layer and the first portion and not overlapping with the circuit pattern in the horizontal direction;

wherein the first portion has a first inclination, and the second portion has a second inclination different from the first inclination,

wherein the second portion has a curved surface having a first curvature; and

wherein the molding layer is provided covering the first and second portions.

14 . The semiconductor package of claim 13 , wherein a surface roughness of the first portion of the first protective layer is different from a surface roughness of the second portion of the first protective layer.

15 . The semiconductor package of claim 13 , wherein a height of a boundary between the first portion and the second portion is higher than or equal to a height of each of the plurality of pads.

16 . The semiconductor package of claim 13 , further comprising:

a second protective layer disposed on the first protective layer,

wherein the second protective layer includes a second opening vertically overlapping the first opening, and

wherein the molding layer is provided covering an inner wall of the second opening.

17 . The semiconductor package of claim 16 , wherein a width of the second opening is greater than a width of the first opening, and

wherein the inner wall of the second opening of the second protective layer includes a third portion having a third inclination different from the first inclination and the second inclination of the first portion and the second portion of the first protective layer.

18 . The semiconductor package of claim 17 , wherein the third portion is a curved surface having a second curvature different from the first curvature of the second portion.

19 . The semiconductor package of claim 18 , wherein the second curvature is greater than the first curvature.

20 . The semiconductor package of claim 17 , wherein the third portion does not overlap with the first portion in a vertical direction.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2023
From: NAM, IL SIK
To: LG INNOTEK CO., LTD.
Reel/Frame 062787/0619 →
Priority Claims (1)
KR 10-2020-0108242 · Aug 27, 2020 · national
Continuity (1)
Related Publication 20230307342A1 · Sep 28, 2023
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