Granted Patent B2

US 12,584,946 · App. 18/395,276 · Granted Mar 24, 2026

Inventors: Jyun-Yi Su (Taoyuan, TW); Sheng-Shiuan Jian (Taoyuan, TW); Ting-Ting Chang (Taoyuan, TW); Wen-Yue Chuang (Taoyuan, TW)

Assignee: CHROMA ATE INC.

G01R19/16566

Abstract

Claims (24)

1 . A source measure device, comprising:

a current sampling circuit coupled to a first terminal of a device under test and configured to sample a current provided to the first terminal of the device under test;

a voltage sampling circuit coupled to the device under test through a first sensing terminal and a second sensing terminal and configured to sample a voltage across the first sensing terminal and the second sensing terminal;

an overvoltage detecting circuit coupled to the current sampling circuit and the voltage sampling circuit, and receiving a first operation voltage and a second operation voltage to generate a detection voltage, wherein the first operation voltage is generated by the current sampled by the current sampling circuit following a first resistor, and the second operation voltage is generated based on the voltage sampled by the voltage sampling circuit 1 ; and

a comparing circuit coupled to the overvoltage detecting circuit, and determining whether the detection voltage is within a voltage range, if the detection voltage is not within the voltage range, the comparing circuit generates an abnormal signal.

2 . The source measure device of claim 1 , wherein the current sampling circuit comprises:

a first input terminal coupled to the first terminal of the device under test.

3 . The source measure device of claim 2 , wherein the voltage sampling circuit comprises:

a second input terminal coupled to the device under test through the first sensing terminal; and

a third input terminal coupled to the device under test through the second sensing terminal;

wherein the overvoltage detecting circuit is coupled to the first input terminal of the current sampling circuit and the third input terminal of the voltage sampling circuit.

4 . The source measure device of claim 3 , wherein when the second input terminal of the voltage sampling circuit is disconnected from the device under test, the overvoltage detecting circuit receives the first operation voltage of the first input terminal of the current sampling circuit and the second operation voltage of the third input terminal of the voltage sampling circuit so as to generate the detection voltage.

5 . The source measure device of claim 4 , wherein the current sampling circuit further comprises:

a fourth input terminal coupled to the first input terminal through the first resistor; and

a first subtractor coupled to the first input terminal and the fourth input terminal.

6 . The source measure device of claim 5 , wherein the voltage sampling circuit further comprises:

a second subtractor coupled to the second input terminal and the third input terminal.

7 . The source measure device of claim 1 , wherein the overvoltage detecting circuit comprises:

a subtractor configured to compare the first operation voltage of the current sampling circuit and the second operation voltage of the voltage sampling circuit so as to generate the detection voltage.

8 . The source measure device of claim 1 , further comprising:

an output circuit coupled to the device under test; and

a control circuit coupled to the output circuit and configured to control the output circuit to stop outputting current to the device under test according to the abnormal signal.

9 . The source measure device of claim 8 , wherein the control circuit is further configured to control the output circuit to output a minimum current according to the abnormal signal.

10 . The source measure device of claim 9 , wherein the control circuit records the device under test corresponding to the abnormal signal in a database.

Assignments (1)

Priority Claims (1)

Continuity (1)

References Cited (24)