IP Library Granted Patent US 12,602,313
Granted Patent B2
US 12,602,313 · App. 18/367,515 · Granted Apr 14, 2026

Smart mechanism to evaluate performance of test engineers

Inventors: Huijuan Fan (Chengdu, CN); Steven Wenguo Shen (Chengdu, CN)
Assignee: Dell Products L.P.
G06F11/3698G06F11/3688
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Quick Facts
Patent No.
US 12,602,313
App. No.
18/367,515
Granted
Apr 14, 2026
Kind
B2
Abstract

Methods, system, and non-transitory processor-readable storage medium for a resource evaluation system are provided herein. An example method includes obtaining defect data obtained in response to executing software on a plurality of tester systems. The resource evaluation system determines a performance weighted metric associated with a defect detection resource and the defect data. Using the performance weighted metric, the resource evaluation system determines a defect scope delta percentage associated with the defect detection resource and the defect data. The resource evaluation system then determines a defect detection resource score based on the defect scope delta percentage.

Claims (44)

1 . A method, comprising:

obtaining, by a resource evaluation system configured to evaluate performance of test engineers, defect data obtained in response to executing software on a plurality of tester systems, wherein the defect data comprises defect priorities associated with defects detected by individual engineers;

determining, by the resource evaluation system, a performance weighted metric associated with a defect detection resource and the defect data;

using the performance weighted metric, determining a defect scope delta percentage associated with the defect detection resource and the defect data; and

determining a defect detection resource score based on the defect scope delta percentage, wherein the defect detection resource score evaluates individual test engineer performance, wherein the performance comprises productivity of the test engineer and the test engineer's skill breadth and depth of knowledge, wherein the method is implemented by at least one processing device comprising a processor coupled to a memory.

2 . The method of claim 1 wherein obtaining, by the resource evaluation system, defect data comprises:

executing the software on a plurality of tester systems;

obtaining defect data resulting from the software execution;

associating the defect data with the defect detection resource; and

storing the defect data in a defect database.

3 . The method of claim 1 wherein the performance weighted metric comprises a defect priority associated with the defect data.

4 . The method of claim 3 wherein the defect priority is associated with the defect detection resource, wherein the defect detection resource generated the defect data.

5 . The method of claim 1 wherein the performance weighted metric comprises a priority weight associated with a defect priority associated with the defect data.

6 . The method of claim 1 wherein the performance weighted metric comprises a plurality of priority weights each associated with a respective defect priority in a plurality of defect priorities associated with the defect data, wherein the plurality of priority weights, when aggregated, equal one.

7 . The method of claim 1 wherein the performance weighted metric comprises a plurality of defects detected associated with a defect priority associated with the defect data, wherein the plurality of defects detected is weighted with a priority weight associated with a defect priority associated with the defect data.

8 . The method of claim 7 wherein the performance weighted metric comprises aggregating a plurality of weighted plurality of defects detected, wherein each of the plurality of weighted plurality of defects detected is associated with a respective defect priority and weighted with a respective priority weight.

9 . The method of claim 1 wherein determining a defect scope delta percentage comprises:

calculating a percentage difference between the performance weighted metric and a historical performance weighted metric associated with a plurality of defect detection resources.

10 . The method of claim 9 wherein the historical performance weighted metric comprises a plurality of defects detected associated with the defect detection resource.

11 . The method of claim 9 wherein the historical performance weighted metric comprises a plurality of defects detected associated with a second defect detection resource, wherein the second defect detection resource is associated with a defect priority associated with the defect data.

12 . The method of claim 9 wherein the historical performance weighted metric comprises a plurality of defects detected associated with a second defect detection resource, wherein the second defect detection resource is associated with a second defect priority associated with the defect data.

13 . The method of claim 12 wherein, when determining the defect scope delta percentage, an impact factor is applied to the second defect priority associated with the defect data.

14 . The method of claim 1 wherein determining a defect detection resource score comprises:

determining a test case percentage associated with the defect detection resource, wherein the test case percentage indicates a percentage of test cases the defect detection resource executed with respect to a plurality of defect detection resources.

15 . The method of claim 1 wherein determining a defect detection resource score comprises:

normalizing the defect scope delta percentage and the test case percentage.

16 . The method of claim 15 further comprising:

weighting the defect scope delta percentage with a defect weight; and

weighting the test case percentage with a test case weight.

17 . The method of claim 16 wherein the defect weight and test case weight, when added together equal one.

18 . The method of claim 16 further comprising:

tuning at least one of the defect weight and the test case weight.

19 . A system comprising:

at least one processing device comprising a processor coupled to a memory;

the at least one processing device being configured:

to obtain, by a resource evaluation system configured to evaluate performance of test engineers, defect data obtained in response to executing software on a plurality of tester systems, wherein the defect data comprises defect priorities associated with defects detected by individual engineers;

to determine, by the resource evaluation system, a performance weighted metric associated with a defect detection resource and the defect data;

to use the performance weighted metric, determining a defect scope delta percentage associated with the defect detection resource and the defect data; and

to determine a defect detection resource score based on the defect scope delta percentage, wherein the defect detection resource score evaluates individual test engineer performance, wherein the performance comprises productivity of the test engineer and the test engineer's skill breadth and depth of knowledge.

20 . A computer program product comprising a non-transitory processor-readable storage medium having stored therein program code of one or more software programs, wherein the program code when executed by at least one processing device causes said at least one processing device:

to obtain, by a resource evaluation system configured to evaluate performance of test engineers, defect data obtained in response to executing software on a plurality of tester systems, wherein the defect data comprises defect priorities associated with defects detected by individual engineers;

to determine, by the resource evaluation system, a performance weighted metric associated with a defect detection resource and the defect data;

to use the performance weighted metric, determining a defect scope delta percentage associated with the defect detection resource and the defect data; and

to determine a defect detection resource score based on the defect scope delta percentage, wherein the defect detection resource score evaluates individual test engineer performance, wherein the performance comprises productivity of the test engineer and the test engineer's skill breadth and depth of knowledge.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2023
From: FAN, HUIJUAN; SHEN, STEVEN WENGUO
To: DELL PRODUCTS L.P.
Reel/Frame 064885/0591 →
Priority Claims (1)
CN 202310946969.7 · Jul 28, 2023 · national
Continuity (1)
Related Publication 20250036561A1 · Jan 30, 2025
References Cited (3)
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