Apparatus and methods for verifying alignment between a shadow ring and a substrate
Methods and apparatus for verifying alignment between an opaque shadow ring and a substrate are provided. In some embodiments, the apparatus includes a tool comprising: a transparent ring having an inner edge defining a central opening and an outer edge and having a top side and a bottom side; a gauge mark on or in the transparent ring spaced between the inner edge and the outer edge, the gauge mark extending around the inner edge; and a pin extending from the bottom side of the transparent ring and located between the gauge mark and the outer edge.
1 . A tool for verifying alignment between an opaque shadow ring and a substrate, the tool comprising:
a transparent ring having an inner edge defining a central opening and an outer edge and having a top side and a bottom side;
a gauge mark on or in the transparent ring spaced between the inner edge and the outer edge, the gauge mark extending around the inner edge; and
a pin extending from the bottom side of the transparent ring and located between the gauge mark and the outer edge.
2 . The tool of claim 1 , wherein the transparent ring is fabricated from at least one of plastic, glass, or quartz.
3 . The tool of claim 1 , wherein the transparent ring is fabricated from polycarbonate.
4 . The tool of claim 1 , wherein the transparent ring has a thickness, measured between the top side and the bottom side, of at least 3 mm.
5 . The tool of claim 1 , wherein the gauge mark includes a groove formed in at least one of the top side or the bottom side.
6 . The tool of claim 1 , wherein the inner edge is concentric with the gauge mark.
7 . The tool of claim 6 , wherein the gauge mark and the inner edge are spaced from one another by 0.4 mm to 0.6 mm.
8 . The tool of claim 7 , wherein the inner edge has a diameter of 300 mm.
9 . The tool of claim 1 , further comprising a second gauge mark spaced between the gauge mark and the outer edge.
10 . The tool of claim 9 , wherein the second gauge mark is concentric with the gauge mark and wherein the gauge mark and the second gauge mark are spaced from one another by 0.4 mm to 0.6 mm.
11 . A method of calibration in a substrate processing system that uses an opaque shadow ring during substrate processing, the method comprising:
placing a tool over a substrate that is supported by a substrate support of the substrate processing system, and wherein the tool comprises a transparent ring having an inner edge defining a central opening;
inspecting an outer edge of the substrate through the transparent ring; and
calibrating a substrate transfer robot in response to the inspection.
12 . The method of claim 11 , wherein the transparent ring includes a gauge mark on or in the transparent ring, the gauge mark spaced between the inner edge and an outer edge of the transparent ring.
13 . The method of claim 12 , wherein the tool has a top side and a bottom side and the tool comprises a pin extending from the bottom side located between the gauge mark and the outer edge of the transparent ring, wherein placing the tool includes inserting the pin into a corresponding hole in the substrate support.
14 . The method of claim 12 , further comprising:
if a portion of the outer edge of the substrate extends between the gauge mark and an outer edge of the transparent ring, determining that the substrate is not concentric with the opaque shadow ring; or
if no portion of outer edge of the substrate extends between the gauge mark and the outer edge of the transparent ring, determining that the substrate is concentric with the opaque shadow ring.
15 . The method of claim 14 , further comprising calibrating the substrate transfer robot if it is determined that the substrate is not concentric with the opaque shadow ring.
16 . The method of claim 15 , further comprising using the calibrated substrate transfer robot to place another substrate on the substrate support and to place the opaque shadow ring over the substrate.
17 . The method of claim 12 , wherein the gauge mark includes a groove formed in at least one of a top side or a bottom side of the transparent ring.
18 . The method of claim 12 , wherein the inner edge is concentric with the gauge mark.
19 . The method of claim 18 , wherein the gauge mark and the inner edge are spaced from one another by 0.4 mm to 0.6 mm.
20 . The method of claim 12 , further comprising a second gauge mark spaced between the gauge mark and the outer edge, wherein the second gauge mark is concentric with the gauge mark, and wherein the gauge mark and the second gauge mark are spaced from one another by 0.4 mm to 0.6 mm.