Single photon detector, electronic device, and LiDAR device
Disclosed is a single photon detector comprising a semiconductor substrate and a 2D material layer provided adjacent to the semiconductor substrate, the semiconductor substrate includes a first well having a first conductivity type, a heavily doped region having a second conductivity type different from the first conductivity type, and a depletion region provided between the first well and the heavily doped region.
1 . A single photon detector comprising:
a first well having a first conductivity type;
a heavily doped region provided on the first well and having a second conductivity type different from the first conductivity type; and
a 2D material layer configured to absorb incident light and generate charges, the incident light having lower energy than a bandgap of the first well,
wherein the charges are transferred to the first well so that the incident light is detected.
2 . The single photon detector of claim 1 , further comprising:
a guard ring provided on a side surface of the heavily doped region and having a lower doping concentration than the heavily doped region; and
a contact provided spaced apart from the heavily doped region.
3 . The single photon detector of claim 2 , wherein the guard ring contacts the side surface and bottom surface of the heavily doped region.
4 . The single photon detector of claim 2 ,
wherein the first well extends between the guard ring and the heavily doped region and contacts the heavily doped region, and
wherein a depletion region is formed between the first well and the heavily doped region.
5 . The single photon detector of claim 2 , further comprising:
a relief region covering side and bottom surfaces of the contact,
wherein the guard ring and the relief region are provided spaced apart from each other, and
wherein the first well extends between the guard ring and the relief region.
6 . The single photon detector of claim 2 , further comprising:
a relief region covering side and bottom surfaces of the contact,
wherein the guard ring contacts the relief region.
7 . The single photon detector of claim 1 , further comprising:
a fixing layer provided between the first well and the 2D material layer.
8 . The single photon detector of claim 1 , further comprising:
a transition layer provided between the first well and the 2D material layer.
9 . The single photon detector of claim 1 , further comprising:
a transparent conductive pattern configured to apply a voltage to the 2D material layer so that the charges are transferred to the first well.
10 . The single photon detector of claim 9 , wherein the transparent conductive pattern contacts the 2D material layer.
11 . The single photon detector of claim 9 , wherein the transparent conductive pattern is configured as a single pattern with ring shapes.
12 . The single photon detector of claim 9 , wherein the transparent conductive pattern is configured as a plurality of patterns spaced apart from each other, with the same voltage applied.
13 . The single photon detector of claim 1 , further comprising:
a control layer provided on a side of the heavily doped region opposite to the 2D material layer and configured to transmit and receive a signal current for detecting the incident light.
14 . The single photon detector of claim 13 , wherein the control layer is configured as a chip with a circuit formed thereon.
15 . An electronic device comprising a single photon detector and a light-emitting device, wherein:
the single photon detector, configured to detect incident light reflected by a subject after the light-emitting device emits light, comprises:
a 2D material layer,
a heavily doped region provided on the 2D material layer,
a guard ring provided on a side surface of the heavily doped region and having a lower doping concentration than the heavily doped region, and
a contact spaced apart from the heavily doped region,
wherein the contact has a first conductivity type, and the heavily doped region and the guard ring have a second conductivity type different from the first conductivity type.
16 . The electronic device of claim 15 , wherein the single photon detector further comprises:
a first well provided between the 2D material layer and the heavily doped region and having the first conductivity type.
17 . The electronic device of claim 16 , wherein the single photon detector further comprises a second well provided between the first well and the heavily doped region and having the first conductivity type,
wherein a depletion region is formed between the second well and the heavily doped region.
18 . A LiDAR device comprising a light-emitting device and a single photon detector, configured to detect incident light reflected by a subject after the light-emitting device emits light and to measure a distance to the subject using time difference information between a transmission signal of the light-emitting device and a detection signal of the single photon detector, wherein:
the single photon detector comprises:
a 2D material layer,
a heavily doped region provided on the 2D material layer,
a guard ring provided on a side surface of the heavily doped region and having a lower doping concentration than the heavily doped region, and
a contact spaced apart from the heavily doped region,
wherein the contact has a first conductivity type, and
wherein the heavily doped region and the guard ring have a second conductivity type different from the first conductivity type.
19 . The LiDAR device of claim 18 , wherein the single photon detector further comprises:
a first well provided between the 2D material layer and the heavily doped region and having the first conductivity type.
20 . The LiDAR device of claim 19 , wherein the single photon detector further comprises a second well provided between the first well and the heavily doped region and having the first conductivity type,
wherein a depletion region is formed between the second well and the heavily doped region.