IP Library › Granted Patent US 12,607,743
Granted Patent B2
US 12,607,743 · App. 17/632,747 · Granted Apr 21, 2026

Device, measuring device, distance measuring system, and method

Inventor: Kyoji Yokoyama (Kanagawa, JP)
Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
G01S17/08G01S17/86G06N3/082G06V20/35G06V10/82
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,607,743
App. No.
17/632,747
Granted
Apr 21, 2026
Kind
B2
Abstract

A device according to the present disclosure is provided. The device includes a model switching unit. The model switching unit switches a machine learning model used for recognizing information about a distance to a measurement object based on an output signal output from a light receiving element when the light receiving element receives light emitted from a light source and reflected by the measurement object.

Claims (72)

1 . A device, comprising:

a light source configured to emit light toward a measurement object;

a light receiving element configured to:

receive the light reflected from the measurement object; and

output an output signal based on the reception of the reflected light; and

a central processing unit (CPU) configured to:

convert the output signal into time information, wherein the time information indicates a time range corresponding to a time from the emission of the light by the light source to a time of the reception of the light by the light receiving element;

acquire first distribution of the time information;

change, based on the acquired first distribution of the time information, values of a plurality of parameters of the light source, wherein

the plurality of parameters includes at least one of a direction of irradiation by the light source, power of the irradiation by the light source, or a pulse shape of the irradiation by the light source;

acquire second distribution of the time information based on the changed values of the plurality of parameters of the light source;

select, based on the acquired second distribution of the time information, a first machine learning model from a plurality of machine learning models, wherein

the selected first machine learning model recognizes specific information corresponding to a distance to the measurement object, and

the specific information is recognized based on the time information;

acquire a sensing result of a subject space in which the measurement object exists; and

switch, based on the sensing result, from the first machine learning model to a second machine learning model of the plurality of machine learning models.

2 . The device according to claim 1 , wherein

the CPU is further configured to change, based on the acquired first distribution of the time information, a value of a parameter associated with the light receiving element, and

the parameter comprises sensitivity of the light receiving element.

3 . The device according to claim 1 , wherein

the sensing result includes first information corresponding to a type of the measurement object.

4 . The device according to claim 3 , wherein

the sensing result further includes second information corresponding to a scene in the subject space.

5 . The device according to claim 4 , wherein

the second information includes at least one of information of a weather in the subject space, information of a time associated with the subject space, or information of a place of the subject space, and

the CPU is further configured to switch from the first machine learning model to the second machine learning model based on the second information.

6 . The device according to claim 5 , wherein the CPU is further configured to determine a distance measuring point in the subject space based on the sensing result.

7 . A measuring device, comprising:

a light source configured to emit light toward a measurement object;

a light receiving element configured to:

receive the light reflected from the measurement object; and

output an output signal based on the reception of the reflected light; and

a central processing unit (CPU) configured to:

convert the output signal into time information, wherein the time information indicates a time range corresponding to a time from the emission of the light by the light source to a time of the reception of the light by the light receiving element;

acquire first distribution of the time information;

change, based on the acquired first distribution of the time information, values of a plurality of parameters associated with the light source, wherein

the plurality of parameters includes at least one of a direction of irradiation by the light source, power of the irradiation by the light source, or a pulse shape of the irradiation by the light source;

acquire second distribution of the time information based on the changed values of the plurality of parameters of the light source;

select, based on the acquired second distribution of the time information, a first machine learning model from a plurality of machine learning models;

recognize, based on the selected first machine learning model, specific information corresponding to a distance to the measurement object, wherein the recognition of the specific information corresponding to the distance to the measurement object is based on the time information;

acquire a sensing result of a subject space in which the measurement object exists; and

switch, based on the sensing result, from the selected first machine learning model to a second machine learning model of the plurality of machine learning models.

8 . A distance measuring system, comprising:

a light source configured to emit light toward a measurement object, wherein the measurement object exists in a subject space;

a light receiving element configured to:

receive the light reflected from the measurement object; and

output an output signal based on the reception of the reflected light;

a plurality of sensors configured to sense the subject space; and

a central processing unit (CPU) configured to:

convert the output signal into time information, wherein the time information indicates a time range corresponding to a time from the emission of the light by the light source to a time of the reception of the light by the light receiving element;

acquire first distribution of the time information;

change, based on the acquired first distribution of the time information, values of a plurality of parameters of the light source, wherein

the plurality of parameters includes at least one of a direction of irradiation by the light source, power of the irradiation by the light source, or a pulse shape of the irradiation by the light source;

acquire second distribution of the time information based on the changed values of the plurality of parameters of the light source;

select, based on the acquired second distribution of the time information, a first machine learning model from a plurality of machine learning models; and

recognize, based on the selected first machine learning model, information corresponding to a distance to the measurement object, wherein the recognition of information corresponding to the distance to the measurement object is based on the time information;

acquire, from at least one sensor of the plurality of sensors, a sensing result of the subject space in which the measurement object exists; and

switch, based on the sensing result, from the first machine learning model to a second machine learning model of the plurality of machine learning models.

9 . A method, comprising:

emitting, by a light source, light toward a measurement object;

receiving, by a light receiving element, the light reflected from the measurement object;

outputting, by the light receiving element, an output signal based on the reception of the reflected light;

converting the output signal into time information, wherein the time information indicates a time range corresponding to a time from the emission of the light by the light source to a time of the reception of the light by the light receiving element;

acquiring first distribution of the time information;

changing, based on the acquired first distribution of the time information, values of a plurality of parameters associated with the light source, wherein

the plurality of parameters includes at least one of a direction of irradiation by the light source, power of the irradiation by the light source, or a pulse shape of the irradiation by the light source;

acquiring second distribution of the time information based on the changed values of the plurality of parameters of the light source;

selecting, based on the acquired second distribution of the time information, a first machine learning model from a plurality of machine learning models, wherein

the selected first machine learning model recognizes specific information corresponding to a distance to the measurement object, and

the specific information is recognized based on the time information;

acquiring a sensing result of a subject space in which the measurement object exists; and

switching, based on the sensing result, from the first machine learning model to a second machine learning model of the plurality of machine learning models.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2022
From: YOKOYAMA, KYOJI
To: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Reel/Frame 058882/0200 →
Priority Claims (1)
JP 2019-148614 · Aug 13, 2019 · national
Continuity (1)
Related Publication 20220276379A1 · Sep 1, 2022
References Cited (22)
US 11150664B2 · Elluswamy · 2021 [cited by examiner]
US 20150243017A1 · Fujimoto et al. · 2015 [cited by applicant]
US 20180136332A1 · Barfield et al. · 2018 [cited by applicant]
US 20190197667A1 · Paluri · 2019 [cited by examiner]
US 20190230303A1 · Wang · 2019 [cited by examiner]
US 20190340775A1 · Lee · 2019 [cited by examiner]
US 20200158876A1 · Karadeniz · 2020 [cited by examiner]
CN 108270970A · 2018 [cited by applicant]
CN 108885701A · 2018 [cited by applicant]
CN 110060297A · 2019 [cited by applicant]
CN 110494868A · 2019 [cited by applicant]
DE 112018001596T5 · 2020 [cited by applicant]
EP 2910971A1 · 2015 [cited by applicant]
EP 3340130A1 · 2018 [cited by applicant]
JP 2014167702A · 2014 [cited by applicant]
JP 2015172934A · 2015 [cited by applicant]
JP 2016176750A · 2016 [cited by applicant]
JP 2018091760A · 2018 [cited by applicant]
JP 2018190045A · 2018 [cited by applicant]
JP 2019125116A · 2019 [cited by applicant]
WO 2018198823A1 · 2018 [cited by applicant]
International Search Report and Written Opinion of PCT Application No. PCT/JP2020/029740, issued on Oct. 6, 2020, 09 pages of ISRWO. [cited by applicant]