IP Library › Granted Patent US 12,625,536
Granted Patent B2
US 12,625,536 · App. 18/342,341 · Granted May 12, 2026

Circuit to protect against multi-rail voltage glitching attacks

Inventors: Jiale Liang (San Jose, CA); Prashant Singh (Apison, TN); Nishit Harshad Shah (Sunnyvale, CA); Daniel Nguyen (San Jose, CA); Kaushik Krishna Raghuraman (Campbell, CA); Suhas Satheesh (Sunnyvale, CA); Ting Lu (Austin, TX); Roman Surgutchik (Gilbert, AZ); Tezaswi Raja (San Jose, CA)
Assignee: NVIDIA Corp.
G06F1/28G05F1/468G06F1/24
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Quick Facts
Patent No.
US 12,625,536
App. No.
18/342,341
Granted
May 12, 2026
Kind
B2
Abstract

A circuit includes a bandgap circuit configured to generate multiple reference voltages. A first voltage glitching detection circuit utilizes a first one of the reference voltages and a first power rail to generate a first reset signal in response to a voltage glitching attack on the first power rail, and a second voltage glitching detection circuit operates independently of the reference voltages to generate a second reset signal in response to the voltage glitching attack on the first power rail.

Claims (44)

1 . A circuit comprising:

a bandgap circuit configured to generate a plurality of reference voltages;

a first voltage glitching detection circuit;

the first voltage glitching detection circuit configured to utilize a first one of the reference voltages and a first power rail voltage to generate a first reset signal in response to a voltage glitching attack on the first power rail;

a second voltage glitching detection circuit configured to operate independently of the reference voltages to generate a second reset signal in response to the voltage glitching attack on the first power rail;

a third voltage glitching detection circuit comprising:

a digital-to-analog converter configured to generate a plurality of digital-to-analog converter-generated reference voltages; and

a plurality of comparators configured to each receive at a first input a second power rail voltage, the comparators further configured to each receive at a second input one of the digital-to-analog converter-generated reference voltages.

2 . The circuit of claim 1 , wherein the second voltage glitching detection circuit comprises a self-referencing power-on detector for the first power rail.

3 . The circuit of claim 1 , wherein the power-on detector and bandgap circuit are configured to receive power from the first power rail.

4 . The circuit of claim 1 , wherein the first reset signal generated by the first voltage glitching detection circuit is a fine level reset signal.

5 . The circuit of claim 1 , wherein the second reset signal generated by the second voltage glitching detection circuit is a coarse level reset signal.

6 . The circuit of claim 1 , the first voltage glitching detection circuit comprising:

a comparator configured to receive at a first input the first one of the reference voltages from the bandgap circuit; and

the comparators configured to receive at a second input a scaled voltage from the first power rail.

7 . The circuit of claim 6 , wherein the power-on detector, bandgap circuit, and comparator are configured to receive power from the first power rail.

8 . The circuit of claim 1 , the third voltage glitching detection circuit utilizing a second one of the reference voltages and the second power rail voltage to generate a third reset signal in response to a voltage glitching attack on the second power rail.

9 . The circuit of claim 1 , wherein the digital-to-analog converter is programmable to generate the digital-to-analog converter-generated reference voltages in a window of a reference voltage received from the bandgap circuit.

10 . The circuit of claim 1 , wherein the power-on detector, bandgap circuit, and the third voltage glitching detection circuit are configured to receive power from the first power rail.

11 . A device comprising:

a system-on-a-chip configured to receive power from a first power rail;

a plurality of input-output devices configured to receive power from a second power rail;

a bandgap circuit configured to generate a plurality of reference voltages;

a first voltage glitching detection circuit configured to utilize a plurality of the reference voltages to generate a first reset signal in response to a voltage glitching attack on the first power rail;

a second voltage glitching detection circuit configured to utilize one of the plurality of reference voltages to generate a second reset signal in response to a voltage glitching attack on the second power rail;

a third voltage glitching detection circuit configured to operate independently of the reference voltages to generate a third reset signal in response to the voltage glitching attack on the second power rail; and

fourth voltage glitching detection circuit configured to utilize one of the plurality of reference voltages to generate a fourth reset signal in in response to a voltage glitching attack on a third power rail, the fourth voltage glitching detection circuit comprising:

a digital-to-analog converter configured to generate a plurality of digital-to-analog converter-generated reference voltages; and

a plurality of comparators configured to each receive at a first input a voltage from the third power rail, the comparators further configured to each receive at a second input one of the digital-to-analog converter-generated reference voltages.

12 . The device of claim 11 , wherein the third voltage glitching detection circuit comprises a self-referencing power-on detector for the second power rail.

13 . The device of claim 11 , wherein the second reset signal is a fine level reset signal.

14 . The device of claim 11 , wherein the third reset signal is a coarse level reset signal.

15 . The device of claim 11 , further comprising:

logic to form a combined reset signal from the second reset signal and the third reset signal.

16 . The circuit of claim 11 , the first voltage glitching detection circuit comprising:

logic configured to monitor a window of the first power rail voltage.

17 . A method comprising:

operating a bandgap circuit to generate a plurality of reference voltages;

applying a first one of the reference voltages and a first power rail voltage to a first voltage glitching detection circuit to generate a first reset signal in response to a voltage glitching attack on the first power rail;

operating a second voltage glitching detection circuit independently of the reference voltages to generate a second reset signal in response to the voltage glitching attack on the first power rail;

operating a third voltage glitching detection circuit by:

generating a plurality of additional reference voltages with a digital-to-analog converter;

applying a different one of the additional reference voltages at a first input to each of a plurality of comparators; and

applying a second power rail voltage to a second input to each of the comparators.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2023
From: LIANG, JIALE; SINGH, PRASHANT; SHAH, NISHIT HARSHAD; NGUYEN, DANIEL; RAGHURAMAN, KAUSHIK KRISHNA; SATHEESH, SUHAS; LU, TING; SURGUTCHIK, ROMAN; RAJA, TEZASWI
To: NVIDIA CORP.
Reel/Frame 065408/0800 →
Continuity (1)
Related Publication 20250004522A1 · Jan 2, 2025
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