IP Library › Granted Patent US 12,628,399
Granted Patent B2
US 12,628,399 · App. 18/202,336 · Granted May 12, 2026

Methods and systems for forming a layer comprising a group 13 element on a substrate

Inventors: Charles Dezelah (Helsinki, FI); Petro Deminskyi (Helsinki, FI); Qi Xie (Shanghai, CN)
Assignee: ASM IP Holding B.V.
H10D64/01318
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Quick Facts
Patent No.
US 12,628,399
App. No.
18/202,336
Granted
May 12, 2026
Kind
B2
Abstract

Disclosed are methods and systems for depositing layers comprising a Group 13 element on a surface of a substrate via contacting the substrate with at least a vapor-phase first precursor and a vapor-phase second precursor comprising an alkyl halide. Exemplary structures in which the layers may be incorporated include field effect transistors, VNAND cells, and metal-insulator-metal (MIM).

Claims (35)

1 . A method of forming a layer comprising a Group 13 element on a substrate, the method comprising:

providing the substrate in a reaction chamber;

executing at least one deposition cycle; wherein the at least one deposition cycle comprises:

contacting the substrate with a vapor-phase first precursor to chemisorb the first precursor to the substrate, wherein the vapor-phase first precursor comprises a compound comprising a Group 13 element and three alkyl ligands bonded to the Group 13 element; and

contacting the substrate with a vapor-phase second precursor comprising an alkyl halide to react the alkyl halide with the chemisorbed first precursor to form the layer on the substrate, wherein a halogen of the alkyl halide is bonded to a secondary or tertiary carbon atom.

2 . The method according to claim 1 , wherein each of the alkyl ligands bonded to the Group 13 element comprises a C1-C6 alkyl ligand.

3 . The method according to claim 1 , wherein the Group 13 element is selected from the group consisting of aluminum, gallium, indium, boron, and combinations thereof.

4 . The method according to claim 1 , wherein the vapor-phase first precursor comprises trimethylaluminum, trimethylindium, or trimethylgallium.

5 . The method according to claim 1 , wherein the vapor-phase first precursor comprises a monomer, dimer, or mixture of a monomer and a dimer of the compound comprising a Group 13 element and three alkyl ligands bonded to the Group 13 element.

6 . The method according to claim 1 , wherein the halogen of the alkyl halide comprises a member selected from the group consisting of I, Br, and Cl.

7 . The method according to claim 1 , wherein the alkyl halide comprises the formula C a H b X c , wherein a=3-8 and b+c=2a+2.

8 . The method according to claim 1 wherein the alkyl halide comprises tert-butyl iodide.

9 . The method according to claim 1 , wherein the alkyl halide comprises a branched C4 to C8 alkyl bonded to a halogen atom through a tertiary carbon atom.

10 . The method according to claim 1 , wherein the alkyl halide comprises two or more halogen atoms.

11 . The method according to claim 1 , wherein an alkyl of the alkyl halide comprises a β-carbon relative to an α-carbon bonded to a halogen, and wherein the β-carbon comprises at least one C—H bond.

12 . The method according to claim 1 , wherein the layer comprises at least two different Group 13 elements.

13 . The method according to claim 1 , wherein the at least one deposition cycle further comprises contacting the substrate with a vapor-phase third precursor to provide a second metal to the layer.

14 . The method according to claim 13 , wherein the vapor-phase third precursor comprises a compound comprising a Group 13 element different from that of the vapor-phase first precursor or comprises a transition metal.

15 . The method according to claim 1 , wherein the layer on the substrate comprises TiAlC.

16 . The method according to claim 1 , wherein the method comprises a cyclic deposition process, and wherein the method comprises repeating said at least one deposition cycle a plurality of times to form the layer on the substrate.

17 . A method of forming a layer comprising a Group 13 element on a substrate, the method comprising:

providing the substrate in a reaction chamber;

executing at least one deposition cycle; wherein the at least one deposition cycle comprises:

contacting the substrate with a vapor-phase first precursor to chemisorb the first precursor to the substrate, wherein the vapor-phase first precursor comprises a compound comprising a Group 13 element and three alkyl ligands bonded to the Group 13 element; and

contacting the substrate with a vapor-phase second precursor comprising an alkyl halide to react the alkyl halide with the chemisorbed first precursor to form the layer on the substrate,

wherein the vapor-phase first precursor comprises a monomer, dimer, or mixture of a monomer and a dimer of the compound comprising a Group 13 element and three alkyl ligands bonded to the Group 13 element.

18 . The method according to claim 17 , wherein an alkyl of the alkyl halide comprises a β-carbon relative to an α-carbon bonded to a halogen, and wherein the β-carbon comprises at least one C—H bond.

19 . A method of forming a layer comprising a Group 13 element on a substrate, the method comprising:

providing the substrate in a reaction chamber;

executing at least one deposition cycle; wherein the at least one deposition cycle comprises:

contacting the substrate with a vapor-phase first precursor to chemisorb the first precursor to the substrate, wherein the vapor-phase first precursor comprises a compound comprising a Group 13 element and three alkyl ligands bonded to the Group 13 element; and

contacting the substrate with a vapor-phase second precursor comprising an alkyl halide to react the alkyl halide with the chemisorbed first precursor to form the layer on the substrate, wherein the alkyl halide comprises a member selected from the group consisting of tert-butyl iodide, diiodoethane, iodoethane, triiodoethane, tetraiodoethane, and 1,3-diiodopropane.

20 . The method according to claim 19 , wherein each of the alkyl ligands bonded to the Group 13 element comprises a C1-C6 alkyl ligand.

21 . The method according to claim 19 , wherein the Group 13 element is selected from the group consisting of aluminum, gallium, indium, boron, and combinations thereof.

22 . The method according to claim 19 , wherein the vapor-phase first precursor comprises trimethylaluminum, trimethylindium, or trimethylgallium.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2023
From: DEZELAH, CHARLES; DEMINSKYI, PETRO; XIE, QI
To: ASM IP HOLDING B.V.
Reel/Frame 063919/0722 →
Continuity (2)
Provisional Application 63346924 · May 30, 2022
Related Publication 20230386846A1 · Nov 30, 2023
References Cited (4)
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US 20180286675A1 · Blomberg · 2018 [cited by applicant]
US 20200328285A1 · Haukka · 2020 [cited by examiner]