Probe for three-dimensional scanner and three-dimensional scanner
Favorable measurement workability is obtained by further enhancing a degree of freedom in handling a probe while enhancing measurement accuracy. A probe for a three-dimensional scanner includes a first marker block and a second marker block that are arrayed side by side in a first direction with a scanner unit positioned at a center, and a third marker block and a fourth marker block that are arrayed side by side in a second direction with the scanner unit positioned at the center. The marker blocks have self-luminous markers facing a plurality of directions, respectively. The fourth marker block is arranged to be separated from a plane defined by the first marker block, the second marker block, and the third marker block.
1 . A probe for a three-dimensional scanner having a plurality of markers of which images are captured by an imaging unit, the probe comprising:
a scanner unit including a scanner light source that emits pattern light in a measurement direction and a scanner imaging part that captures an image of the pattern light emitted by the scanner light source in the measurement direction to generate a bright line image;
a pair of marker blocks including a first marker block and a second marker block arrayed side by side in a first direction in a state where the scanner unit is positioned at a central portion between the first marker block and the second marker block; and
a pair of marker blocks including a third marker block and a fourth marker block arrayed side by side in a second direction in a state where the scanner unit is positioned at a central portion between the third marker block and the fourth marker block,
wherein each of the marker blocks has self-luminous markers facing a plurality of directions, respectively,
the fourth marker block is arranged to be separated from a plane defined by the first marker block, the second marker block, and the third marker block, and
the pair of marker blocks including the third marker block and the fourth marker block is provided at positions offset from the scanner unit in the measurement direction.
2 . The probe for a three-dimensional scanner according to claim 1 , wherein the pair of marker blocks including the first marker block and the second marker block is provided at both ends of a probe body in a longitudinal direction.
3 . The probe for a three-dimensional scanner according to claim 1 , wherein an array direction of the pair of marker blocks including the first marker block and the second marker block and an array direction of the pair of marker blocks including the third marker block and the fourth marker block are orthogonal to each other as the probe is viewed from the measurement direction.
4 . The probe for a three-dimensional scanner according to claim 1 , wherein a first surface and a second surface farthest from the first surface among surfaces of each of the pair of marker blocks are parallel to each other, and the self-luminous marker is arranged on each of the first surface and the second surface.
5 . The probe for a three-dimensional scanner according to claim 4 , wherein a plurality of side surfaces intersecting the first surface and the second surface are formed in each of the pair of marker blocks, and the self-luminous marker is arranged on each of the side surfaces.
6 . The probe for a three-dimensional scanner according to claim 5 , wherein
the plurality of side surfaces are formed in each of the first marker block and the second marker block, and
the plurality of side surfaces formed in the second marker block are arranged at positions about an axis extending in the first direction, the positions being shifted from the plurality of side surfaces formed in the first marker block.
7 . The probe for a three-dimensional scanner according to claim 1 , further comprising:
an optical base to which the scanner light source and the scanner imaging part are attached; and
a grip part,
wherein the grip part is arranged to be distant from the optical base toward a side opposite to the measurement direction.
8 . The probe for a three-dimensional scanner according to claim 7 , wherein the grip part is provided with a display unit configured to display a measurement result obtained by the scanner unit.
9 . The probe for a three-dimensional scanner according to claim 7 , wherein the grip part is provided with an operation unit configured to operate the scanner unit.
10 . The probe for a three-dimensional scanner according to claim 1 , wherein
the scanner unit includes a first scanner light source that emits multi-line light and a second scanner light source that emits single-line light as the scanner light source, and
a light amount of the single-line light emitted from the second scanner light source is larger than a light amount of each beam of the multi-line light emitted from the first scanner light source.
11 . A probe for a three-dimensional scanner having a plurality of markers of which images are captured by an imaging unit, the probe comprising:
a scanner unit including a scanner light source that emits pattern light in a measurement direction and a scanner imaging part that captures an image of the pattern light emitted by the scanner light source in the measurement direction to generate a bright line image;
a pair of marker blocks including a first marker block and a second marker block arrayed side by side in a first direction in a state where the scanner unit is positioned at a central portion between the first marker block and the second marker block; and
a pair of marker blocks including a third marker block and a fourth marker block arrayed side by side in a second direction in a state where the scanner unit is positioned at a central portion between the third marker block and the fourth marker block,
wherein a first axis extending between the first marker block and the second marker block in the first direction and a second axis extending between the third marker block and the fourth marker block in the second direction are arranged to be orthogonal to each other as viewed from the measurement direction, and the first axis and the second axis are in a skewed positional relationship, and
each of the marker blocks has self-luminous markers facing a plurality of directions, respectively.
12 . The probe for a three-dimensional scanner according to claim 11 , wherein
the probe includes a support part that supports each of the marker blocks with respect to the scanner unit,
a marker holder has a polygonal column shape in which one surface forms an attachment surface to be attached to the support part, and
at least one of the self-luminous markers is provided on each surface other than the attachment surface.
13 . The probe for a three-dimensional scanner according to claim 12 , wherein
one end surface of the marker holder in an axial direction is the attachment surface, and at least one of the self-luminous markers is provided on another end surface of the polygonal column shape in the axial direction.
14 . The probe for a three-dimensional scanner according to claim 11 , wherein an outer shape of each of the plurality of the self-luminous markers is defined by a plate and a light-shielding mask formed on the plate.
15 . A probe for a three-dimensional scanner having a plurality of markers of which images are captured by an imaging unit, the probe comprising:
a scanner unit including a scanner light source that emits pattern light in a measurement direction and a scanner imaging part that captures an image of the pattern light emitted by the scanner light source in the measurement direction to generate a bright line image;
a pair of marker blocks including a first marker block and a second marker block arrayed side by side in a first direction in a state where the scanner unit is positioned at a central portion between the first marker block and the second marker block, and each of the first and second marker blocks comprises a plurality of self-luminous markers, and includes an end surface oriented to intersect a first axis, extending between the first marker block and the second marker block in the first direction, and at least one side surface different from the end surface and arranged around the first axis; and
a pair of marker blocks including a third marker block and a fourth marker block arrayed side by side in a second direction in a state where the scanner unit is positioned at a central portion between the third marker block and the fourth marker block, and each of the third and fourth marker blocks comprises a plurality of self-luminous markers, and includes an end surface oriented to intersect a second axis, extending between the third marker block and the fourth marker block in the second direction, and at least one side surface different from the end surface and arranged around the second axis,
wherein the first axis and the second axis are in a skewed positional relationship,
each of the first marker block and the second marker block has at least one of the self-luminous markers on the end surface oriented to intersect the first axis and at least another of the self-luminous markers on the side surface around the first axis, and
each of the third marker block and the fourth marker block has at least one of the self-luminous markers on the end surface oriented to intersect the second axis and at least another of the self-luminous markers on the side surface around the second axis.
16 . The probe for a three-dimensional scanner according to claim 15 ,
wherein the probe includes a support part that supports each of the marker blocks with respect to the scanner unit,
a marker holder has a polygonal column shape in which one surface forms an attachment surface to be attached to the support part, and
at least one of the self-luminous markers is provided on each surface other than the attachment surface.
17 . The probe for a three-dimensional scanner according to claim 16 , wherein
one end surface of the marker holder in an axial direction is the attachment surface, and
at least one of the self-luminous markers is provided on another end surface of the polygonal column shape in the axial direction.
18 . The probe for a three-dimensional scanner according to claim 15 , wherein an outer shape of each of the plurality of self-luminous markers is defined by a plate and a light-shielding mask formed on the plate.