Memory circuit with differential sensing architecture

1 . A memory circuit, comprising a cell array and a sense amplifier array;

the cell array comprising N rows of cells, N being a positive integer;

each row of cells comprising M+1 bit cells, first to Mth bit cells normally storing M-bit data, an (M+1)th bit cell storing opposite data of an ith bit cell, M being a positive integer and i being a positive integer less than or equal to M;

the sense amplifier array comprising N rows of sense amplifiers;

each row of sense amplifiers comprising M sense amplifiers, each sense amplifier being provided with a differential input port for reading stored data; and

for the M sense amplifiers in the same row, one positive input end of an ith sense amplifier being connected with an output end of the ith bit cell, one negative input end of the ith sense amplifier being connected with an output end of the (M+1)th bit cell, two positive input ends of a jth sense amplifier being connected with an output end of a jth bit cell, two negative input ends of the jth sense amplifier being respectively connected with an output end of the (M+1)th bit cell and an output end of the ith bit cell, j being a positive integer less than or equal to M and unequal to i;

the potential samples of two differential positive input ends of the sense amplifier are superimposed, and the potential samples of two differential negative input ends of the sense amplifier are superimposed.

2 . The memory circuit according to claim 1 , wherein

for the M sense amplifiers in the same row, two positive input ends of the ith sense amplifier are both connected with the output end of the ith bit cell, and two negative input ends of the ith sense amplifier are respectively connected with the output end of the (M+1)th bit cell and the output end of the ith bit cell.

3 . The memory circuit according to claim 1 , wherein

the cells are non-volatile cells that store charges in floating gates or charge trapping layers.

4 . The memory circuit according to claim 1 , wherein

the cells are Flash, EEPROM or EPROM.

5 . The memory circuit according to claim 1 , wherein

the memory circuit further comprises an auxiliary circuit; and

the auxiliary circuit is configured to gate the cells, connect the cells with the sense amplifiers, and connect the sense amplifiers with a readout circuit.

6 . The memory circuit according to claim 1 , wherein

the auxiliary circuit comprises a plurality of transmission gate circuits, digital logic circuits, and driving circuits.

7 . The memory circuit according to claim 1 , wherein M is 2, 3, 4, 8, 16, 32, or 64.

8 . The memory circuit according to claim 1 , wherein

a sense amplifier circuit comprises a first PMOS transistor (P 1 ), a second PMOS transistor (P 2 ), a first NMOS transistor (N 1 ), a second NMOS transistor (N 2 ), a third NMOS transistor (N 3 ), a fourth NMOS transistor (N 4 ), a fifth NMOS transistor (N 5 ), and a sixth NMOS transistor (N 6 );

source ends of the first PMOS transistor (P 1 ) and the second PMOS transistor (P 2 ) are connected with working voltage (VDD);

a drain end of the first PMOS transistor (P 1 ) is connected with a drain end of the first NMOS transistor (N 1 ), a gate end of the second PMOS transistor (P 2 ), and a gate end of the second NMOS transistor (N 2 );

a drain end of the second PMOS transistor (P 2 ) is connected with a drain end of the second NMOS transistor (N 2 ), a gate end of the first PMOS transistor (P 1 ), and a gate end of the first NMOS transistor (N 1 ), and serves as a read data output end of the sense amplifier circuit;

a source end of the first NMOS transistor (N 1 ) is connected with a drain end of the third NMOS transistor (N 3 ) and a drain end of the fifth NMOS transistor (N 5 );

a source end of the second NMOS transistor (N 2 ) is connected with a drain end of the fourth NMOS transistor (N 4 ) and a drain end of the sixth NMOS transistor (N 6 );

a gate end of the third NMOS transistor (N 3 ) and a gate end of the fifth NMOS transistor (N 5 ) serve as two positive input ends of the sense amplifier;

a gate end of the fourth NMOS transistor (N 4 ) and a gate end of the sixth NMOS transistor (N 6 ) serve as two negative input ends of the sense amplifier; and

a source end of the third NMOS transistor (N 3 ), a source end of the fifth NMOS transistor (N 5 ), a source end of the fourth NMOS transistor (N 4 ), and a source end of the sixth NMOS transistor (N 6 ) are connected with a common ground end (VSS).

9 . The memory circuit according to claim 8 , wherein

the first PMOS transistor (P 1 ), the second PMOS transistor (P 2 ), the first NMOS transistor (N 1 ), the second NMOS transistor (N 2 ), the third NMOS transistor (N 3 ), the fourth NMOS transistor (N 4 ), the fifth NMOS transistor (N 5 ), and the sixth NMOS transistor (N 6 ) are field effect transistors.

10 . The memory circuit according to claim 9 , wherein

the third NMOS transistor (N 3 ), the fourth NMOS transistor (N 4 ), the fifth NMOS transistor (N 5 ), and the sixth NMOS transistor (N 6 ) have the same dimension.