Memory system with redundant operation
A memory system includes a memory that provides digital data and a built-in self-test (BIST) circuit for testing the memory for determining defective storage units of the memory. The memory system has a data output for providing data from the memory to an external system. The data output of the memory system has a first bit width. The memory has a data output that has a second bit width that is greater than the first bit width. The BIST circuit has a data input that is of the second bit width.
1 . A memory system comprising:
a memory including an array of memory storage units, read circuitry for providing digital outputs of data stored in the array, and a memory data output for providing digital data read by the read circuitry from the array at an addressable memory location, the memory data output being of a first bit width;
a system data output for providing data from an addressable memory location of the array indicated by an address received at a system address input, the system data output being of a second bit width less than the first bit width;
a built-in self-test circuit including a data input to receive data having the first bit width from the memory data output, the data input of the built-in self-test circuit having the first bit width, wherein the built-in self-test circuit is operably coupled to the memory to perform test operations on the memory to determine defective storage units of the memory.
2 . The memory of claim 1 further comprising:
data line redirection circuitry for selectively redirecting at least one data line to the system data output from a corresponding data terminal of the memory data output based upon a determination by the built-in self-test circuit that a storage unit of the memory is a defective.
3 . The memory system of claim 2 wherein the data line redirection circuitry reduces a bit width of the data read from the memory data output from the first bit width to the second bit width in providing the data to the system output.
4 . The memory system of claim 2 wherein the data line redirection circuitry includes a plurality of multiplexers.
5 . The memory system of claim 4 wherein each of the plurality of multiplexers includes two inputs coupled to two different data terminals of the memory data output.
6 . The memory system of claim 2 further comprising a control register for storing an indication that a storage unit of the memory is defective as determined by the built-in self-test circuit where the indication is provided to the data line redirection circuitry for selectively redirecting at least one data line of the system data output from a corresponding memory data output terminal for a memory operation.
7 . The memory system of claim 1 wherein the memory is characterized as a non repairable memory.
8 . The memory system of claim 1 further comprising:
a system data input to receive data to be written to the array at an addressable memory location indicated by an address received at the system address input, the system data input being of the second bit width;
wherein the memory includes a memory data input for receiving data to be written to the array at an addressable memory location, the memory data input being of the first bit width.
9 . The memory system of claim 8 wherein the built-in self-test circuit includes a data output for providing data to be written to the array during a test operation, the data output of the built-in self-test circuit being of the first bit width.
10 . The memory system of claim 9 further comprising data input selection circuitry for selecting data to provide to the memory data input between data from the system data input or data from the data output of the built-in self-test circuit.
11 . The memory system of claim 10 wherein the data input selection circuitry includes a plurality of multiplexers where each multiplexer of the plurality is coupled to receive a data line of system data input and coupled to a data terminal of the data output of the built-in self-test circuit.
12 . The memory of claim 8 wherein the built-in self-test circuit determines whether the memory includes a defective storage unit by performing operations that include writing data of the first bit width to the memory and reading data of the first bit width from the memory.
13 . The memory of claim 1 wherein the built-in self-test circuit determines whether the memory includes a defective storage unit by performing operations under stress conditions.
14 . A memory system comprising:
a memory including an array of memory storage units, read circuitry for providing digital outputs of data stored in the array, and a memory data output for providing digital data read by the read circuitry from the array at an addressable memory location, the memory data output being of a first bit width;
a system data output for providing data from an addressable memory location of the array indicated by an address received at a system address input, the system data output being of a second bit width less than the first bit width;
a built-in self-test circuit including a data input to receive data from the memory data output, the data input of the built-in self-test circuit having the first bit width, wherein the built-in self-test circuit is operably coupled to the memory to perform test operations on the memory to determine defective storage units of the memory;
a system data input to receive data to be written to the array at an addressable memory location indicated by an address received at the system address input, the system data input being of the second bit width;
wherein the memory includes a memory data input for receiving data to be written to the array at an addressable memory location, the memory data input being of the first bit width;
data line redirection circuitry for selectively redirecting at least one data line of the system data input from a corresponding data terminal of the memory data input based upon an indication of a determination by the built-in self-test circuit that a storage unit of the memory is defective.
15 . A method of operating a memory system comprising:
performing memory test operations comprising:
writing by a built-in self-test circuit, data having a first bit width to a memory of a memory system, the memory receiving the data at a memory data input of the memory having the first bit width;
reading by the built-in self-test circuit, data having the first bit width from a memory data output of the memory, the memory data output being of the first bit width, the memory data output providing digital data;
wherein the memory system has a system data input and a system data output having a second bit width that is less than the first bit width.
16 . The method of claim 15 further comprising:
configuring data line redirection circuitry based on an indication of a determination of at least one defective memory storage unit of the memory as a result of the performing the memory test operations, wherein the configuring includes configuring the data line redirection circuitry to provide data received from the system data input to terminals of the memory data input wherein a terminal of the memory data input associated with a defective storage unit is not provided data received from the system data input, and the configuring includes configuring the data line redirection circuitry to provide data provided to the system data output from terminals of the memory data output wherein data from a terminal of the memory data output associated with a defective storage unit is not provided to the system data output.
17 . The method of claim 16 wherein after the configuring, the method comprising:
performing memory test operations comprising:
writing by the built-in self-test circuit, data to the memory data input, wherein the terminal of the memory data input associated with the defective storage unit does not receive the data;
reading by the built-in self-test circuit, data from the memory data output, wherein the built-in self-test circuit does not receive data from the terminal of the memory data output associated with the defective storage unit.
18 . The method of claim 16 wherein the data line redirection circuitry includes a plurality of multiplexers, wherein the configuring includes controlling select lines of the plurality of multiplexers by writing data to a register by the built-in self-test circuit.
19 . The method of claim 15 wherein the memory is characterized as a non repairable memory.
20 . A memory system comprising:
a memory including an array of memory storage units, read circuitry for providing digital outputs of data stored in the array, and a memory data output for providing digital data read by the read circuitry from the array at an addressable memory location, the memory data output being of a first bit width;
a system data output for providing data from an addressable memory location of the array indicated by an address received at a system address input, the system data output being of a second bit width less than the first bit width;
a system data input to receive data to be written to the array at an addressable memory location indicated by an address received at the system address input, the system data input being of the second bit width, wherein the memory including a memory data input for receiving data to be written to the array at an addressable memory location including data received from the system data input, the memory data input being of the first bit width;
a built-in self-test circuit including a data input to receive data having the first bit width from the memory data output, the data input of the built-in self-test circuit having the first bit width, the built-in self-test circuit including a data output to provide data to the memory data input to write to the array, wherein the built-in self-test circuit is operably coupled to the memory to perform test operations on the memory to determine defective storage units of the array;
data line redirection circuitry configurable to provide data received from the system data input to terminals of the memory data input wherein terminals of the memory data input associated with defective storage units of the array as determined by the built-in self-test circuit are not provided data received from the system data input, and configurable to provide data provided to the system data output from terminals of the memory data output wherein data from terminals of the memory data output associated with defective storage units of the array determined by the built-in self-test circuit are not provided to the system data output.