IP Library › Granted Patent US 12,676,203
Granted Patent B2
US 12,676,203 · App. 18/469,562 · Granted Jul 7, 2026

Appratus and method for changing a read voltage applied for reading data from a non-volatile memory cell

Inventors: Jae Yong Son (Gyeonggi-do, KR); Nam Kyeong Kim (Gyeonggi-do, KR)
Assignee: SK hynix Inc.
G11C29/1201G11C29/18G11C29/42G11C2029/1202
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Quick Facts
Patent No.
US 12,676,203
App. No.
18/469,562
Filed
Sep 19, 2023
Granted
Jul 7, 2026
Kind
B2
Art Unit
2825
USPC
365/185.09
Abstract

A read retry table (RRT) apparatus is coupled to a plurality of memory dies via a data path. The apparatus is configured to collect data from a plurality of memory cells coupled to a plurality of word lines in the plurality of memory dies via the data path; perform a first clustering on the plurality of word lines based on an error correction capability of error correction circuitry for collected data; perform a second clustering on an outlier of the first clustering; and generate or update an RRT based on values obtained from the first clustering and the second clustering.

Claims (66)

1 . A read retry table (RRT) apparatus coupled to a plurality of memory dies via a data path, wherein the RRT apparatus is configured to:

collect data from a plurality of memory cells coupled to a plurality of word lines in the plurality of memory dies via the data path;

perform a first clustering on the plurality of word lines based on an error correction capability of error correction circuitry for collected data;

perform a second clustering on an outlier of the first clustering; and

generate or update a read retry table based on values obtained from the first clustering and the second clustering,

wherein the first clustering comprises:

searching K cluster centroids based on a number of clusters corresponding to a size of the RRT, where K is a positive integer;

adding at least one of the plurality of word lines to at least one of K clusters established based on the K cluster centroids; and

recalculating and updating the K cluster centroids based on the added word line.

2 . The RRT apparatus of claim 1 , wherein the plurality of memory dies is arranged in a same row or a same column of a same wafer.

3 . The RRT apparatus of claim 2 , wherein the plurality of word lines corresponds to at least one same row address sampled from a memory block or a word line group included in each of the plurality of memory dies.

4 . The RRT apparatus of claim 3 , wherein the RRT apparatus is coupled to the plurality of memory dies via a same channel of the data path.

5 . The RRT apparatus of claim 1 , wherein the RRT apparatus selects the K cluster centroids by:

selecting, as a first centroid among the K cluster centroids, a random word line among the plurality of word lines;

searching, as a second centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the first centroid among the plurality of word lines;

searching, as a third centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the first and second centroids among the plurality of word lines; and

sequentially searching, as a K-th centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the previously selected centroids among the plurality of word lines.

6 . The RRT apparatus of claim 5 ,

wherein the RRT apparatus is configured to:

establish a Voronoi distance range from the K cluster centroids for each of the K clusters, the Voronoi distance range corresponding to the error correction capability of the error correction circuitry; and

classifying a word line which does not belong to the K clusters as the outlier of the first clustering.

7 . The RRT apparatus of claim 1 , wherein the RRT apparatus is configured to calculate a fail bit count (FBC) for each of the plurality of word lines based on preset levels of a read voltage, the preset levels corresponding to selected values among multi-bit data stored in the plurality of memory cells.

8 . The RRT apparatus of claim 7 ,

wherein the RRT apparatus is configured to:

establish a Voronoi distance range from the K cluster centroids for each of the K clusters, the Voronoi distance range determined based on the fail bit count and the error correction capability of the error correction circuitry; and

classify a word line which does not belong to the K clusters as the outlier of the first clustering.

9 . The RRT apparatus of claim 1 , wherein the second clustering comprises:

adding the outlier of the first clustering to an additional cluster having a Voronoi distance range calculated based on the error correction capability of the error correction circuitry and a fail bit count which is obtained by applying values stored or predetermined in the read retry table before the RRT apparatus generates or updates the read retry table; and

calculating the values for the read retry table to add all of the outlier of the first clustering to the additional cluster.

10 . A method for operating a data processing apparatus, the method comprising:

collecting data from a plurality of memory cells coupled to a plurality of word lines in a plurality of memory dies via a data path;

performing a first clustering on the plurality of word lines based on an error correction capability of error correction circuitry for collected data;

performing a second clustering on an outlier of the first clustering; and

generating or updating a read retry table (RRT) based on values obtained from the first clustering and the second clustering,

wherein the method further comprises transferring the collected data to a server, which is configured to perform the first clustering and the second clustering, via a network.

11 . The method of claim 10 , wherein the generating or updating the RRT comprises:

receiving the values obtained from the first clustering and the second clustering via the network;

generating or updating the RRT based on the values; and

storing the generated or updated RRT in a non-volatile memory storage.

12 . The method of claim 10 , wherein the plurality of word lines corresponds to at least one same row address sampled from a memory block or a word line group included in each of the plurality of memory dies.

13 . A method for operating a data processing apparatus, the method comprising:

collecting data from a plurality of memory cells coupled to a plurality of word lines in a plurality of memory dies via a data path;

performing a first clustering on the plurality of word lines based on an error correction capability of error correction circuitry for collected data;

performing a second clustering on an outlier of the first clustering; and

generating or updating a read retry table (RRT) based on values obtained from the first clustering and the second clustering,

wherein the first clustering comprises:

searching K cluster centroids based on a number of clusters corresponding to a size of the RRT, where K is a positive integer;

adding at least one of the plurality of word lines to at least one of K clusters established based on the K cluster centroids; and

recalculating and updating the K cluster centroids based on the added word line.

14 . The method of claim 13 , wherein the selecting comprises:

selecting, as a first centroid among the K cluster centroids, a random word line among the plurality of word lines;

searching, as a second centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the first centroid among the plurality of word lines;

searching, as a third centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the first and second centroids among the plurality of word lines; and

sequentially searching, as a K-th centroid among the K cluster centroid, a word line having a greatest Voronoi distance from the previously selected centroids among the plurality of word lines.

15 . The method of claim 13 ,

wherein the first clustering comprises:

establishing a Voronoi distance range from the K cluster centroids for each of the K clusters, the Voronoi distance range corresponding to the error correction capability of the error correction circuitry; and

classifying a word line which does not belong to the K clusters as the outlier of the first clustering.

16 . The method of claim 13 , wherein the first clustering comprises calculating a fail bit count (FBC) for each of the plurality of word lines based on preset levels of a read voltage, the preset levels corresponding to selected values among multi-bit data stored in the plurality of memory cells.

17 . The method of claim 13 ,

wherein the first clustering comprises:

establishing a Voronoi distance range from the K cluster centroids for each of the K clusters, the Voronoi distance range determined based on the fail bit count and the error correction capability of the error correction circuitry; and

classifying a word line which does not belong to the K clusters as the outlier of the first clustering.

18 . The method of claim 15 , wherein the second clustering comprises:

adding the outlier of the first clustering to an additional cluster having a Voronoi distance range calculated based on the error correction capability of the error correction circuitry and a fail bit count which is obtained by applying values stored or predetermined in the RRT before the generating or updating the RRT; and

calculating the values for the RRT to add all of the outlier of the first clustering to the additional cluster.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2023
From: SON, JAE YONG; KIM, NAM KYEONG
To: SK HYNIX INC.
Reel/Frame 064943/0689 →
Priority Claims (1)
KR 10-2023-0050690 · Apr 18, 2023 · national
Continuity (1)
Related Publication 20240355405A1 · Oct 24, 2024
References Cited (5)
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