IP Library › Granted Patent US 12,678,111
Granted Patent B2
US 12,678,111 · App. 18/655,160 · Granted Jul 14, 2026

Methods, systems, and computer-readable storage media for enhanced phase-contrast x-ray imaging

Inventors: Erin A. Miller (Richland, WA); Dustin M. Kasparek (Richland, WA); Luke W. Campbell (Richland, WA)
Assignee: Battelle Memorial Institute
A61B6/4291A61B6/4035A61B6/405A61B6/466A61B6/484
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Quick Facts
Patent No.
US 12,678,111
App. No.
18/655,160
Filed
May 3, 2024
Granted
Jul 14, 2026
Kind
B2
Examiner
YUN, JURIE
Art Unit
2884
USPC
378/62
Abstract

A system includes an x-ray source configured to emit an x-ray beam along a beam path and through an object arranged for inspection in a field of view of the x-ray source; and an object grating, an analyzer grating, a detector grating, and a detector arranged with respect to each other in the field of view, wherein the object grating includes object grating elements arranged in a first pattern, the detector grating includes detector grating elements arranged in a second pattern that is separable from the first pattern, and the analyzer grating includes analyzer grating elements that are arranged to correspond to a combination of the first pattern and second pattern, wherein the analyzer grating, and/or the object grating and detector grating, are configured to move relative to each other to different phase positions, and wherein the detector is configured to collect indirect moiré image data of the object at the different phase positions.

Claims (40)

1 . A system, comprising:

an x-ray source configured to emit an x-ray beam along a beam path and through an object arranged for inspection in a field of view of the x-ray source; and

an object grating, an analyzer grating, a detector grating, and a detector arranged with respect to each other in the field of view;

wherein the object grating includes object grating elements arranged in a first pattern, the detector grating includes detector grating elements arranged in a second pattern that is separable from the first pattern, and the analyzer grating includes analyzer grating elements that are arranged to correspond to a combination of the first pattern and second pattern;

wherein the analyzer grating, and/or the object grating and detector grating, are configured to move relative to each other to different phase positions, and wherein the detector is configured to collect indirect moiré image data of the object at the different phase positions.

2 . The system of claim 1 , wherein the analyzer grating, and/or the object grating and detector grating, are configured to move relative to each other to the different phase positions by translating the analyzer grating transverse to the beam path to the different phase positions while the detector grating and object grating are fixed.

3 . The system of claim 1 , wherein the object grating and detector grating are configured to move relative to the analyzer grating to the different phase positions by translating the object grating and detector grating transverse to the beam path to the different phase positions while the analyzer grating is fixed.

4 . The system of claim 1 , wherein the object grating elements include a set of parallel linear object grating elements, the detector grating elements include a set of parallel linear detector grating elements arranged perpendicularly with respect to the parallel linear object grating elements, and the analyzer grating elements include a set of crossed grating elements.

5 . The system of claim 1 , further comprising one or more movement stages coupled to the analyzer grating and/or the object grating and detector grating to provide the relative movement to the different phase positions.

6 . The system of claim 1 , wherein the relative movement to different phase positions includes a first set of positions along a first axis aligned with a direction of the first pattern and a second set of positions along a second axis aligned with a direction of the second pattern.

7 . The system of claim 6 , wherein the relative movement to different phase positions further includes a set of one or more additional off-axis positions configured to average spectral information associated with the object grating and detector grating and thereby reduce moiré artifacts associated with the moiré image data.

8 . The system of claim 6 , wherein the relative movement to different phase positions further includes a set of positions to define a latticed array of positions.

9 . The system of claim 6 , wherein the relative movement to the different phase positions includes a third set of positions aligned with the direction of the first pattern and spaced apart from the first set of positions, and a fourth set of positions aligned with the direction of the second pattern and spaced apart from the second set of positions.

10 . The system of claim 9 , wherein the third set of positions is spaced apart from the first set of positions by a pi-shift and the fourth set of positions is spaced apart from the second set of positions by a pi-shift.

11 . The system of claim 1 , further comprising a processor and memory configured with processor executable instructions which cause the processor to apply a beam hardening correction to the indirect moiré image data.

12 . The system of claim 1 , further comprising a source grating situated adjacent to the x-ray source and configured to receive the x-rays from the x-ray source to produce a plurality of source grating x-ray sources.

13 . The system of claim 1 , wherein the object grating, analyzer grating, and detector gratings are arranged in the field of view along the beam path such that the analyzer grating precedes the detector, the detector grating precedes the analyzer grating, and the position of the object to be inspected precedes the analyzer grating.

14 . The system of claim 13 , wherein the object grating precedes the position of the object to be inspected.

15 . A method, comprising:

emitting an x-ray beam from an x-ray source along a beam path and through a position for an object arranged to be inspected in a field of view of the x-ray source, wherein an object grating, an analyzer grating, a detector grating, and a detector are arranged with respect to each other in the field of view, wherein the object grating includes object grating elements arranged in a first pattern, the detector grating includes detector grating elements arranged in a second pattern that is separable from the first pattern, and the analyzer grating includes analyzer grating elements that are arranged to correspond to a combination of the first pattern and second pattern;

moving the analyzer grating, and/or the object grating and detector grating, relative to each other to different phase positions; and

detecting indirect moiré image data with the detector at the different phase positions.

16 . The method of claim 15 , wherein the moving comprises translating the analyzer grating transverse to the beam path to the different phase positions while the detector grating and object grating are fixed.

17 . The method of claim 15 , wherein the moving comprises translating the object grating and detector grating transverse to the beam path to the different phase positions while the analyzer grating is fixed.

18 . The method of claim 15 , wherein the object grating elements include a set of parallel linear object grating elements, the detector grating elements include a set of parallel linear detector grating elements arranged perpendicularly with respect to the parallel linear object grating elements, and the analyzer grating elements include a set of crossed grating elements.

19 . The method of claim 15 , wherein the moving comprises moving the analyzer grating, and/or the object grating and detector grating, relative to each other to the different phase positions with one or more movement stages.

20 . The method of claim 19 , wherein the moving to the different phase positions further includes moving to a set of one or more additional off-axis positions configured to average spectral information associated with the object grating and detector grating and thereby reduce moiré artifacts associated with the moiré image data.

21 . The method of claim 20 , wherein the moving to the one or more additional off-axis positions includes moving to a set of positions such that the different phase positions comprise a crossed or L-shaped set of positions and a diagonal set of positions.

22 . The method of claim 20 , wherein the moving to the one or more additional off-axis positions includes moving to a set of positions such that the different phase positions comprise a latticed array of positions.

23 . The method of claim 15 , wherein the moving to the different phase positions comprises moving to a first set of positions along a first axis aligned with a direction of the first pattern and moving to a second set of positions along a second axis aligned with a direction of the second pattern.

24 . The method of claim 23 , wherein the moving to the different phase positions further comprises moving to a third set of positions aligned with the direction of the first pattern and spaced apart from the first set of positions, and to a fourth set of positions aligned with the direction of the second pattern and spaced apart from the second set of positions.

25 . The method of claim 24 , wherein the third set of positions is spaced apart from the first set of positions by a pi-shift and the fourth set of positions is spaced apart from the second set of positions by a pi-shift.

26 . The method of claim 15 , further comprising, with a processor and memory configured with processor executable instructions, applying a beam hardening correction to the indirect moiré image data.

27 . The method of claim 15 , wherein the object grating, analyzer grating, and detector gratings are arranged in the field of view along the beam path such that the analyzer grating precedes the detector, the detector grating precedes the analyzer grating, and the position of the object to be inspected precedes the analyzer grating.

28 . The method of claim 27 , wherein the object grating precedes the position of the object to be inspected.

29 . A non-transitory computer readable storage medium storing one or more programs, the one or more programs comprising instructions, which when executed by one or more processors operably connected to an x-ray imaging system that comprises:

an x-ray source configured to emit an x-ray beam along a beam path and through an object arranged for inspection in a field of view of the x-ray source; and

an object grating, an analyzer grating, a detector grating, and a detector arranged with respect to each other in the field of view;

wherein the object grating includes object grating elements arranged in a first pattern, the detector grating includes detector grating elements arranged in a second pattern that is separable from the first pattern, and the analyzer grating includes analyzer grating elements that are arranged to correspond to a combination of the first pattern and second pattern; wherein the analyzer grating, and/or the object grating and detector grating, are configured to move relative to each other to different phase positions, and wherein the detector is configured to collect indirect moiré image data of the object at the different phase positions;

causes the x-ray imaging system to collect the indirect moiré image data at the different phase positions.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2024
From: MILLER, ERIN A.; KASPAREK, DUSTIN M.; CAMPBELL, LUKE W.
To: BATTELLE MEMORIAL INSTITUTE
Reel/Frame 068652/0083 →
CONFIRMATORY LICENSE Recorded Jun 12, 2024
From: BATTELLE MEMORIAL INSTITUTE
To: U. S. DEPARTMENT OF ENERGY
Reel/Frame 067702/0892 →
Continuity (4)
Continuation In Part 18519861 · Nov 27, 2023
Continuation 17442340 · Mar 20, 2020
Continuation 16363989 · Mar 25, 2019
Related Publication 20240298984A1 · Sep 12, 2024
References Cited (57)
US 5812629A · Clauser · 1998 [cited by applicant]
US 9357975B2 · Baturin et al. · 2016 [cited by applicant]
US 9761021B2 · Koehler et al. · 2017 [cited by applicant]
US 10478142B2 · Ning · 2019 [cited by examiner]
US 11006912B2 · Miller et al. · 2021 [cited by applicant]
US 11639903B2 · Miller et al. · 2023 [cited by applicant]
US 20100091947A1 · Niu et al. · 2010 [cited by applicant]
US 20120163554A1 · Tada · 2012 [cited by applicant]
US 20120201349A1 · Kaneko et al. · 2012 [cited by applicant]
US 20130108015A1 · Kottler et al. · 2013 [cited by applicant]
US 20140226782A1 · Stutman et al. · 2014 [cited by applicant]
US 20200305812A1 · Miller et al. · 2020 [cited by applicant]
US 20210349040A1 · Miller et al. · 2021 [cited by applicant]
US 20220160315A1 · Miller et al. · 2022 [cited by applicant]
WO WO2011011014 · 2011 [cited by applicant]
WO WO2012029039 · 2012 [cited by applicant]
Pfeiffer et al., “Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources,” [cited by applicant]
Pfeiffer et al., “Hard-X-ray dark-field imaging using a grating interferometer,” [cited by applicant]
Fitzgerald, “Phase-sensitive x-ray imaging,” [cited by applicant]
Momose et al., “Demonstration of X-ray Talbot interferometry,” [cited by applicant]
Olivo et al., “A coded-aperture technique allowing x-ray phase contrast imaging with conventional sources,” [cited by applicant]
Wen et al, “Spatial harmonic imaging of x-ray scattering—initial results,” [cited by applicant]
Wells et al., “A review of X-ray explosives detection techniques for checked baggage,” [cited by applicant]
Singh et al., “Explosives detection systems (EDS) for aviation security,” [cited by applicant]
Alvarez et al., “Energy-selective reconstructions in x-ray computerized tomography,” [cited by applicant]
Roder, “Explosives detection by dual-energy computed tomography (CT),” [cited by applicant]
Azevedo et al., “System-independent characterization of materials using dual-energy computed tomography,” [cited by applicant]
Wang et al., “Quantitative grating-based x-ray dark-field computed tomography,” [cited by applicant]
Bech et al., “Quantitative x-ray dark-field computed tomography,” [cited by applicant]
Pfeiffer et al., “Tomographic reconstruction of three-dimensional objects from hard X-ray differential phase contrast projection images,” [cited by applicant]
Pfeiffer et al., “Hard x-ray phase tomography with low-brilliance sources,” [cited by applicant]
Lynch et al., “Interpretation of dark-field contrast and particle-size selectivity in grating interferometers,” [cited by applicant]
Pfeiffer et al., “High-resolution brain tumor visualization using three-dimensional x-ray phase contrast tomography,” [cited by applicant]
Arboleda et al., “Sensitivity-based optimization for the design of a grating interferometer for clinical X-ray phase contrast mammography,” [cited by applicant]
Huang et al., “Alternative method for differential phase-contrast imaging with weakly coherent hard x rays,” [cited by applicant]
Wen et al., “Fourier X-ray scattering radiography yields bone structural information,” [cited by applicant]
Stein et al., “Selective imaging of nano-particle contrast agents by a single-shot x-ray diffraction technique,” [cited by applicant]
Van der Walt et al., “scikit-image: image processing in Python,” [cited by applicant]
Feldkamp et al., “Practical cone-beam algorithm,” [cited by applicant]
Van Aarle et al., “The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography,” [cited by applicant]
Van Aarle et al., “Fast and flexible X-ray tomography using the ASTRA toolbox,” [cited by applicant]
Jensen et al., “Directional x-ray dark-field imaging,” [cited by applicant]
Sharma et al., “Design of acquisition schemes and setup geometry for anisotropic X-ray dark-field tomography (AXDT),” [cited by applicant]
Sharma et al., “Trochoidal X-ray Vector Radiography: Directional dark-field without grating stepping,” [cited by applicant]
Felsner et al., “A 3-D projection model for x-ray dark-field imaging,” [cited by applicant]
Graetz et al., “Review and experimental verification of x-ray dark-field signal interpretations with respect to quantitative isotropic and anisotropic dark-field computed tomography,” [cited by applicant]
Berger et al., “XCOM: Photon Cross Sections Database,” [cited by applicant]
Poludniowski et al., “SpekCalc: a program to calculate photon spectra from tungsten anode x-ray tubes,” [cited by applicant]
Willner et al., “Quantitative X-ray phase-contrast computed tomography at 82 keV,” [cited by applicant]
Birnbacher et al., “Accurate effective atomic No. determination with polychromatic grating-based phase-contrast computed tomography,” [cited by applicant]
Sarapata et al., “Quantitative imaging using high-energy X-ray phase-contrast CT with a 70 kVp polychromatic X-ray spectrum,” [cited by applicant]
Donath et al., “Inverse geometry for grating-based x-ray phase-contrast imaging,” [cited by applicant]
Kasparek et al., “Gratings-based phase contrast imaging above 160 kVp,” [cited by applicant]
Extended EP Search Report for related EP Application No. 20778845.6, 6 pages, mailed Nov. 25, 2022. [cited by applicant]
International Search Report and Written Opinion for related International Application No. PCT/US2020/23884, 10 pages, mailed Jun. 16, 2020. [cited by applicant]
Office action for related Canadian Application No. 3133306, 4 pages, dated Jan. 17, 2024. [cited by applicant]
Yashiro et al., “Effect of beam hardening on a visibility-contrast image obtained by X-ray grating interferometry,” [cited by applicant]