IP Library › Granted Patent US 12,683,626
Granted Patent B2
US 12,683,626 · App. 18/106,470 · Granted Jul 14, 2026

Sample and hold circuit and related driver circuit

Inventors: Jin-Yi Lin (Kaohsiung City, TW); Jhih-Siou Cheng (New Taipei City, TW); Yung-Te Chang (Hsinchu County, TW); Chih-Cheng Chen (Yunlin County, TW)
Assignee: NOVATEK Microelectronics Corp.
H03M1/468H03M1/1245H03M1/145H03M1/462
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,683,626
App. No.
18/106,470
Filed
Feb 6, 2023
Granted
Jul 14, 2026
Kind
B2
Art Unit
2845
USPC
341/163
Abstract

A sample and hold (S/H) circuit includes an analog-to-digital converter (ADC), a register and a digital-to-analog converter (DAC). The ADC receives an input signal and converts the input signal into a digital code. The register, coupled to the ADC, stores the digital code. The DAC, coupled to the register, converts the digital code into an output signal.

Claims (20)

1 . A sample and hold (S/H) circuit, comprising:

an analog-to-digital converter (ADC), to receive an input signal and convert the input signal into a digital code;

a register, coupled to the ADC, to store the digital code;

a digital-to-analog converter (DAC), coupled to the register, to convert the digital code into an output signal; and

a current-to-voltage converter, coupled between the ADC and an input terminal of the S/H circuit, to convert an input current of the S/H circuit into a voltage to serve as the input signal;

wherein the current-to-voltage converter comprises a transistor, of which a gate terminal and a drain terminal are coupled to each other and further coupled to an input terminal of the ADC.

2 . The S/H circuit of claim 1 , wherein the ADC converts the input signal into the digital code in a sampling period, and the DAC converts the digital code into the output signal in a holding period following the sampling period.

3 . The S/H circuit of claim 1 , wherein the register comprises a latch circuit.

4 . The S/H circuit of claim 1 , wherein the output signal is an output current.

5 . The S/H circuit of claim 1 , further comprising:

a sampling switch, coupled to the ADC, to be turned on in a sampling period; and

an output enable switch, coupled to the DAC, to be turned on in a holding period following the sampling period.

6 . The S/H circuit of claim 1 , wherein the DAC comprises:

a plurality of control switches, each controlled according to the digital code; and

a plurality of current sources, each coupled to one of the plurality of control switches.

7 . The S/H circuit of claim 1 , wherein the DAC comprises:

a plurality of control switches, each coupled to a first node or a second node according to the digital code;

a plurality of resistors, each coupled to one of the plurality of control switches, to generate an output voltage; and

an operational amplifier, coupled to the plurality of resistors, to generate an output current according to the output voltage.

8 . The S/H circuit of claim 1 , wherein the S/H circuit outputs the output signal as an output current to one of a plurality of channels of a light-emitting diode (LED) panel.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 7, 2023
From: LIN, JIN-YI; CHENG, JHIH-SIOU; CHANG, YUNG-TE; CHEN, CHIH-CHENG
To: NOVATEK MICROELECTRONICS CORP.
Reel/Frame 062607/0670 →
Continuity (2)
Provisional Application 63343546 · May 19, 2022
Related Publication 20230378972A1 · Nov 23, 2023
References Cited (23)
US 6313780B1 · Hughes · 2001 [cited by examiner]
US 7126515B1 · Kris · 2006 [cited by examiner]
US 8350740B2 · Akita · 2013 [cited by examiner]
US 10340938B1 · Eitan · 2019 [cited by examiner]
US 10630310B1 · Litjes · 2020 [cited by examiner]
US 11108402B1 · Strijker · 2021 [cited by examiner]
US 11418207B1 · Wang · 2022 [cited by examiner]
US 20030160714A1 · Yoshinaga · 2003 [cited by examiner]
US 20030174083A1 · Mayfield · 2003 [cited by examiner]
US 20060145984A1 · Sun · 2006 [cited by examiner]
US 20070279274A1 · Hsieh · 2007 [cited by examiner]
US 20080001935A1 · Nurmi · 2008 [cited by examiner]
US 20090040173A1 · Ezaki · 2009 [cited by examiner]
US 20100039303A1 · Tsukamoto · 2010 [cited by examiner]
US 20110001492A1 · Nys · 2011 [cited by examiner]
US 20110102217A1 · Hsu · 2011 [cited by examiner]
US 20110148681A1 · Mao · 2011 [cited by examiner]
US 20130033392A1 · Nani · 2013 [cited by examiner]
US 20140191889A1 · Haneda · 2014 [cited by examiner]
US 20140340150A1 · Dempsey · 2014 [cited by examiner]
US 20150180496A1 · Drago · 2015 [cited by examiner]
US 20160056830A1 · Malik · 2016 [cited by examiner]
TW 202127807A · 2021 [cited by applicant]