IP Library › Granted Patent US 12,687,778
Granted Patent B2
US 12,687,778 · App. 18/205,694 · Granted Jul 21, 2026

Gas-based development of organometallic resist in an oxidizing halogen-donating environment

Inventors: Peter De Schepper (Winegem, BE); Brian J. Cardineau (Corvallis, OR)
Assignee: Inpria Corporation
G03F7/0042G03F7/36G03F7/38
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,687,778
App. No.
18/205,694
Filed
Jun 5, 2023
Granted
Jul 21, 2026
Kind
B2
Art Unit
1737
USPC
430/271.1
Abstract

A method provides for performing a dry development of an organotin composition patterned with radiation and having a latent image. The method comprises developing a structure with a gas comprising a halogen based developer and an oxygen source compound, wherein the structure comprises a substrate with layer of composition with a latent image with regions with at least partially condensed tin oxide-hydroxide and separate regions with an organotin composition having carbon-tin bonds, and wherein the developing results in at least partial removal of the organotin composition having carbon-tin bonds. Contact with an oxidizing environment can be performed as a separate step followed by the halogen based thermal development. Suitable apparatuses provide for the desired processing.

Claims (27)

1 . A method for performing a dry development of an organotin composition patterned with radiation and having a latent image, the method comprising:

developing a structure with a gas comprising a halogen based developer and an oxygen source compound, wherein the structure comprises a substrate with layer of composition with a latent image with regions with at least partially condensed tin oxide-hydroxide and separate regions with an organotin composition having carbon-tin bonds, and wherein the developing results in at least partial removal of the organotin composition having carbon-tin bonds.

2 . The method of claim 1 wherein the halogen based developer comprises HF, HCl, HBr, HI, an acyl halide (COX 2 ), a carbonyl halide (RCOX), or a mixture thereof, wherein X is F, Cl, Br or I and R is an alkyl group with 1 to 5 carbon atoms.

3 . The method of claim 1 wherein the halogen based developer comprises HF, HCl, HBr, HI, or a mixture thereof.

4 . The method of claim 1 wherein the oxygen source compound comprises O 2 , O 3 , H 2 O, H 2 O 2 , NO 2 , NO or mixtures thereof.

5 . The method of claim 1 wherein the organotin composition having carbon-tin bonds comprises a composition represented by the formula RSnO 1.5-x/2 (OH) x wherein 0<x<3, and R forms a carbon-tin bond and is a hydrocarbyl group having from 1 to 31 carbon atoms with 3 to 31 carbon atoms for the group with a secondary-bonded carbon atom and 4 to 31 carbon atoms for the group with a tertiary-bonded carbon atom, optionally with unsaturated or aromatic carbon bonds.

6 . The method of claim 5 wherein the at least partially condensed tin oxide-hydroxide composition is formed from the composition represented by the formula RSnO 1.5-x/2 (OH) x wherein carbon-tin bonds are cleaved by radiation.

7 . The method of claim 1 wherein the development is a thermal process with the developing step performed at a temperature from about −25° C. to about 250° C.

8 . The method of claim 1 wherein the development is a thermal process with the developing step performed at a temperature from about 0° C. to about 150° C.

9 . The method of claim 8 wherein the processing is performed in a chamber at a pressure of at least 5 Torr.

10 . The method of claim 1 wherein the halogen based developer is provided at a flow rate from about to about 50 sccm to about 5000 sccm.

11 . The method of claim 1 wherein the gas comprises at least 50 mole % oxygen source compound excluding inert gases.

12 . The method of claim 1 wherein the gas comprises air.

13 . The method of claim 12 wherein the water content of the air is adjusted to achieve a desired water partial pressure.

14 . The method of claim 1 wherein the gas comprises from about 1 mol % to about 10 mol % dihalides excluding inert gas contributions.

15 . The method of claim 1 wherein the regions with at least partially condensed tin oxide-hydroxide correspond to irradiated regions and have a lower concentration of carbon-tin bonds than the separate regions.

16 . The method of claim 1 further comprising performing a post-exposure bake (PEB) step prior to the developing step, comprising heating the structure to a temperature from about 60° C. to about 250° C. for from about 0.1 minutes to about 5 minutes under a pressure of at least 200 Torr.

17 . The method of claim 16 wherein the atmosphere during PEB comprises O 2 , O 3 , H 2 O, H 2 O 2 , CO 2 , or combinations thereof.

18 . The method of claim 16 wherein the atmosphere during PEB comprises air.

19 . The method of claim 16 wherein the developing step is performed without purging the PEB atmosphere.

20 . The method of claim 1 further comprising performing a plasma descumming after completing the developing to at least partial removal of the organotin composition having carbon-tin bonds.

21 . A development chamber comprising:

an enclosure configured for achieving a controlled pressure through operation of a pump and suitable pressure sensors;

a substrate support within the enclosure;

a development energy source comprising a heater, a cooler, and/or a plasma source configured to deliver energy to a substrate mounted on the substrate support;

a halide developer source configured to deliver a gas of halide developer into the enclosure from a reservoir through a flow regulator; and

an oxygen compound source configured to deliver a vapor of an oxygen comprising compound into the enclosure from a reservoir through a flow regulator.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 9, 2023
From: DE SCHEPPER, PETER; CARDINEAU, BRIAN J.
To: INPRIA CORPORATION
Reel/Frame 065160/0865 →
Continuity (2)
Provisional Application 63349187 · Jun 6, 2022
Related Publication 20230408916A1 · Dec 21, 2023
References Cited (22)
US 9176377B2 · Stowers et al. · 2015 [cited by applicant]
US 9281207B2 · Stowers et al. · 2016 [cited by applicant]
US 9310684B2 · Meyers et al. · 2016 [cited by applicant]
US 10228618B2 · Meyers et al. · 2019 [cited by applicant]
US 10642153B2 · Meyers et al. · 2020 [cited by applicant]
US 11480874B2 · Kocsis et al. · 2022 [cited by applicant]
US 20140352736A1 · Yamamoto et al. · 2014 [cited by applicant]
US 20170102612A1 · Meyers et al. · 2017 [cited by applicant]
US 20200326627A1 · Jiang et al. · 2020 [cited by applicant]
US 20210271170A1 · Telecky et al. · 2021 [cited by applicant]
US 20220020584A1 · Volosskiy · 2022 [cited by examiner]
US 20220035247A1 · Tan et al. · 2022 [cited by applicant]
US 20220064192A1 · Edson et al. · 2022 [cited by applicant]
WO 2019217749A1 · 2019 [cited by applicant]
WO 2020039615A1 · 2020 [cited by applicant]
WO 2020132281A1 · 2020 [cited by applicant]
WO 2020264158A1 · 2020 [cited by applicant]
WO 2022016124A1 · 2022 [cited by applicant]
WO 2022125388A1 · 2022 [cited by applicant]
WO 2023245047A1 · 2023 [cited by applicant]
Hänssgen et al., “Synthese Der Ersten Mono-t-Butylzinn-Elementverbidungen”, Journal of Organometallic Chemistry, vol. 293 No. 191, (1985). [cited by applicant]
International Search Report from corresponding Patent Application No. PCT/US2023/024395 dated Sep. 20, 2023. [cited by applicant]