In-situ micro-nano impact indentation testing instrument

1 . An in-situ micro-nano impact indentation testing instrument, wherein a high-temperature loading unit and a low-temperature loading unit of a high/low-temperature loading module are mounted in parallel on a right side wall of an environmental chamber, an optical imaging unit and an infrared imaging unit of the optical-infrared in-situ monitoring module are respectively arranged on a left side wall and a rear side wall of the environmental chamber, and both an electromagnetic-piezoelectric coupling impact module and a microscopic imaging module are mounted at a bottom of the environmental chamber;

wherein the electromagnetic-piezoelectric coupling impact module is provided with an indenter that horizontally impacts a high-temperature specimen clamped on the high-temperature loading unit on a right side under the driving of an electromagnetic linear motor and a piezoelectric stack; the high-temperature and low-temperature loading units are fixed on the same horizontal sliding rail, and a motor on the horizontal sliding rail drives the low-temperature loading unit to move to a front side of the electromagnetic-piezoelectric coupling impact module, so that the switching from a high-temperature impact indentation test to a low-temperature impact indentation test is completed; in-situ monitoring is performed on the testing process by the optical-infrared in-situ monitoring module combined with a second acoustic emission sensor and a first acoustic emission sensor in the high-temperature and low-temperature loading units; and the microscopic imaging module is configured to select a test area before impact indentation and observe residual morphology after impact indentation.

2 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein the high/low temperature loading module comprises the high-temperature loading unit and the low-temperature loading unit; a first vertical sliding table of the low-temperature loading unit is mounted on a horizontal sliding rail, a first bearing plate of the first vertical sliding table is connected to a cooling platform, and a refrigerating fluid stored in the cooling platform flows into a micro-channel pipeline inside a micro-channel cold platform through an inlet pipeline and then flows out through an outlet pipeline to return to the cooling platform;

wherein a low-temperature specimen is fixed on a top of the micro-channel cold platform through a first clamp, the low-temperature specimen is loaded with low temperature by driving the refrigerating fluid to circularly flow through the micro-channel pipeline, and the temperature of the low-temperature specimen is fed back and adjusted through a low-temperature thermocouple; and the micro-channel cold platform and a first heat insulation retainer are fixed through threads,

the first acoustic emission sensor is embedded and mounted below the first heat insulation retainer, and the first heat insulation retainer and a first acoustic emission embedded platform are connected to the cooling platform through first long bolts and first nuts.

3 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein the high-temperature loading unit is mounted beside the low-temperature loading unit in parallel and shares the same horizontal sliding rail, so that high-temperature loading on the high-temperature specimen is achieved;

wherein a heating platform is mounted on a second bearing plate of a second vertical sliding table, a first eddy current induction coil of the heating platform heats a heat conduction platform in a second heat insulation retainer and the high-temperature specimen clamped at a top of the heat conduction platform, and the temperature is fed back and adjusted through a high-temperature thermocouple; and the heat conduction platform is connected to the second heat insulation retainer by threads,

wherein the second acoustic emission sensor is embedded and mounted below the second heat insulation retainer, and the second heat insulation retainer and a second acoustic emission embedded platform are connected to the heating platform through second long bolts and second nuts.

4 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein the optical-infrared in-situ monitoring module comprises an optical imaging unit and an infrared imaging unit;

wherein the optical imaging unit is configured to perform real-time in-situ monitoring on the dynamic propagation behavior of micro-area cracks in the impact indentation process;

the optical imaging unit mainly comprises a high-speed camera and a supporting arm, a zoom magnifying lens and a macro lens are mounted on the high-speed camera,

wherein a camera base is connected to a bearing pin through a rotating pin,

the bearing pin and a through hole on the supporting arm form a rotating pair, and the supporting arm is further fixed on a rear inner wall of the environmental chamber through a bolt;

the infrared imaging unit is configured to perform in-situ monitoring on the temperature distribution and the dynamic temperature gradient of the test micro-area, and comprises an infrared thermal imager and a bracket,

wherein a thermal imager lens on the infrared thermal imager is internally provided with an optical filter; and a base of the thermal infrared imager is connected to the bracket through a pin and is further fixed on a left inner wall of the environmental chamber.

5 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein the electromagnetic-piezoelectric coupling impact module is formed by two-stage driving of the electromagnetic linear motor and the piezoelectric stack, and the piezoelectric stack completes indentation after the electromagnetic linear motor achieves long-range approach;

wherein a head part of the piezoelectric stack is fixed in a preload support, a tail output end of the piezoelectric stack is connected to a flexible hinge for amplifying displacement, an output end of the flexible hinge is connected to a load sensor, and the other end of the load sensor is connected to a heat insulation pressing rod and supported by a bearing;

wherein the heat insulation pressing rod is connected to a heat conduction pressing rod by using a heat insulation ring and a heat insulation baffle for achieving heat insulation, and a tip of the heat conduction pressing rod is embedded and mounted with an indenter and a copper wire.

6 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein a two-dimensional piezoelectric driving platform is fixed on the electromagnetic linear motor and drives a bearing platform to move, so that dot-matrix impact indentation is achieved.

7 . The in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein the microscopic imaging module is composed of a microscopic lens and a base, the base is connected to a lens arm through a rotating pin, a lens tube moves in a sliding groove through an adjusting knob to achieve focusing, and meanwhile, a lens converter can achieve switching of optical lenses with different magnifications.

8 . A testing method implemented by using the in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein when a high-temperature test is performed, a second eddy current induction coil on the heating base is turned on to heat the heat conduction pressing rod and the indenter, the copper wire adjacent to the indenter is connected to the high-temperature specimen to conduct heat for achieving isothermal contact,

wherein when the indenter and the high-temperature specimen are synchronously heated to a preset temperature, the piezoelectric stack drives the indenter to indent the high-temperature specimen according to a preset strain rate, a displacement measuring platform is arranged between a flexible hinge base and the heating base through a positioning guide rail, and a laser displacement sensor carried by the displacement measuring platform collects impact displacement.

9 . A testing method implemented by using the in-situ micro-nano impact indentation testing instrument according to claim 1 , wherein when a low-temperature test is performed, the low-temperature loading unit is moved to a front side of the electromagnetic-piezoelectric coupling impact module by the horizontal sliding rail, the heating base is removed, the heat conduction pressing rod is replaced by a refrigeration pressing rod, the refrigerating fluid is introduced into the refrigeration pressing rod to cool the indenter, the indenter is driven to perform an impact indentation test after the indenter and the low-temperature specimen are cooled to a preset temperature, and the same laser displacement sensor is used to obtain impact displacement and load data.