Apparatus for detecting surface defects in objects
An apparatus for detecting surface defects in objects comprises one or more illuminating devices configured to emit at least a light radiation and illuminate an object to be inspected. The detection apparatus is further configured to measure the light radiation received by the object, and also comprises one or more image acquisition devices configured to acquire one or more images of the object, when illuminated by the illuminating device, and a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.
1 . An apparatus for detecting surface defects in objects, the apparatus comprising:
one or more illumination devices configured to emit at least a light radiation along at least an optical axis and illuminate an object to be inspected;
a measuring device configured to measure the light radiation received by the object, and comprising at least a platelike body arranged to intersect the optical axis and receive the light radiation with which the one or more illuminating devices illuminate the object,
wherein the platelike body comprises a plate of optically active material capable of deflecting, along an extension plane of the plate, a predetermined portion of the light radiation received from the one or more illumination devices, and
wherein the plate of optically active material comprises particulate scatterers dispersed therein, the particulate scatterers being configured to deflect the predetermined portion of the light radiation along the extension plane of the plate,
the measuring device further comprising at least a light sensor optically coupled to the at least a platelike body and configured to receive the portion of light radiation deflected by the plate and provide detection signals indicative of a light intensity of the light radiation so received.
2 . The apparatus of claim 1 , wherein the plate of optically active material is made of polymethyl methacrylate (PMMA) and the particulate scatterers comprise colorless diffusive impurities.
3 . The apparatus of claim 1 , wherein the at least a platelike body is arranged so that an extension plane of the plate of optically active material is orthogonal to the optical axis.
4 . The apparatus of claim 1 , wherein the at least a light sensor is configured to receive a monochromatic light radiation.
5 . The apparatus of claim 1 , wherein the at least a light sensor is configured to receive a polychromatic light radiation.
6 . The apparatus of claim 1 , wherein the measuring device comprises a single light sensor optically coupled to each platelike body.
7 . The apparatus of claim 1 , wherein the measuring device comprises a plurality of light sensors optically coupled to each platelike body.
8 . The apparatus of claim 1 , wherein the measuring device comprises a platelike body arranged at an intermediate position between a first illumination device of the one or more illumination devices and a first surface of a support, at which the object is placed.
9 . The apparatus of claim 8 , wherein the one or more illumination devices comprises a second illumination device, and the platelike body is arranged at the intermediate position further between the second illumination device and a second surface of the support, wherein the object is placed at the first surface of the support opposite the second surface, and the support is made of optically transparent material.
10 . The apparatus of claim 1 , wherein the measuring device comprises an electronic signal processing unit operatively coupled to the at least a light sensor, and configured to receive and process the detection signals and provide measurement signals indicative of the light radiation received by the object.
11 . The apparatus of claim 1 , comprising an image acquisition device configured to acquire one or more images of the object, when illuminated by the one or more illumination devices.
12 . The apparatus of claim 11 , comprising a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.
13 . An object inspection station comprising:
a detection apparatus for detecting surface defects in objects, the apparatus comprising: one or more illumination devices configured to emit at least a light radiation along at least an optical axis and illuminate an object to be inspected;
a measuring device configured to measure the light radiation received by the object, and comprising at least a platelike body arranged to intersect the optical axis and receive the light radiation with which the one or more illuminating devices illuminate the object,
wherein the platelike body comprises a plate of optically active material capable of deflecting, along an extension plane of the plate, a predetermined portion of the light radiation received from the one or more illumination devices, and
wherein the plate of optically active material comprises particulate scatterers dispersed therein, the particulate scatterers being configured to deflect the predetermined portion of the light radiation along the extension plane of the plate,
the measuring device further comprising at least a light sensor optically coupled to the at least a platelike body and configured to receive the portion of light radiation deflected by the plate and provide detection signals indicative of a light intensity of the light radiation so received.
14 . The object inspection station of claim 13 , wherein the plate of optically active material is made of polymethyl methacrylate (PMMA) and the particulate scatterers comprise colorless diffusive impurities.
15 . The object inspection station of claim 13 , wherein the at least a platelike body is arranged so that an extension plane of the plate of optically active material is orthogonal to the optical axis.
16 . The object inspection station of claim 13 , wherein the measuring device comprises a platelike body arranged at an intermediate position between a first illumination device of the one or more illumination devices and a first surface of a support, at which the object is placed.
17 . The object inspection station of claim 16 , wherein the platelike body is arranged at the intermediate position further between a second illumination device of the one or more illumination devices and a second surface of the support, wherein the object is placed at the first surface of the support opposite the second surface, and the support is made of optically transparent material.
18 . The object inspection station of claim 13 , wherein the measuring device comprises an electronic signal processing unit operatively coupled to the at least a light sensor, and configured to receive and process the detection signals and provide measurement signals indicative of the light radiation received by the object.
19 . The object inspection station of claim 13 , comprising an image acquisition device configured to acquire one or more images of the object, when illuminated by the one or more illumination devices.
20 . The object inspection station of claim 19 , comprising a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.