IP Library › Granted Patent US 12,724,068
Granted Patent B2
US 12,724,068 · App. 18/158,181 · Granted Sep 1, 2026

Training method and test apparatus using the same

Inventors: Kwang Kyu Kim (Suwon-si, KR); Jae-Il Choi (Suwon-si, KR)
Assignee: Samsung Electronics Co., Ltd.
G01R31/31726G01R31/31937
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,724,068
App. No.
18/158,181
Granted
Sep 1, 2026
Kind
B2
Abstract

Provided is a training method capable of reducing or minimizing a training time. The training method includes, for each of devices to be tested, calculating a first eye width at which a first signal and a second signal synchronize with each other at a first operation speed, and calculating a second eye width at which the first signal and the second signal synchronize with each other at a second operation speed different from the first operation speed; performing machine learning on the first eye width and the second eye width to derive a model showing a relation between operation speeds and eye widths; and calculating a third eye width corresponding to a third operation speed different from the first operation speed and the second operation speed, using the model.

Claims (75)

1 . A training method comprising:

for each of first devices to be tested, calculating a first eye width at which a first signal and a second signal synchronize with each other at a first operation speed, and calculating a second eye width at which the first signal and the second signal synchronize with each other at a second operation speed different from the first operation speed;

deriving a model showing a relation between operation speeds and eye widths by performing machine learning on the first eye width and the second eye width; and

using the model to calculate a third eye width corresponding to a third operation speed different from the first operation speed and the second operation speed.

2 . The training method of claim 1 , wherein performing the machine learning comprises learning of a linear regression model.

3 . The training method of claim 2 , wherein a gradient descent method is used to calculate parameters of the linear regression model.

4 . The training method of claim 1 , wherein the calculating of the first eye width comprises:

while adjusting a delay of the first signal at the first operation speed, finding a first fail-to-pass point and a first pass-to-fail point, and

determining the first eye width based on an interval between the first fail-to-pass point and the first pass-to-fail point.

5 . The training method of claim 4 , wherein finding of the first fail-to-pass point comprises:

determining the first signal having a first delay, as a fail,

determining the first signal having a second delay greater than the first delay by a first value, as a pass,

determining the first signal having a third delay less than the second delay by a second value, as a fail, the second value being less than the first value, and

determining the first signal having a fourth delay greater than the third delay by a third value, as a pass, the third value being smaller than the second value.

6 . The training method of claim 4 , wherein finding of the first pass-to-fail point comprises:

determining the first signal having a first delay, as a fail,

determining the first signal having a second delay less than the first delay by a first value, as a pass,

determining the first signal having a third delay greater than the second delay by a second value, as a fail, the second value being less than the first value, and

determining the first signal having a fourth delay smaller than the third delay by a third value, as a pass, the third value being less than the second value.

7 . The training method of claim 1 , further comprising:

determining a position of a valid window margin at the third operation speed,

wherein determining of the position of the valid window margin at the third operation speed includes:

finding a third fail-to-pass point, while adjusting a delay of the first signal at the third operation speed, and

determining from the third fail-to-pass point to a point obtained by adding the third eye width to the third fail-to-pass point, as the position of the valid window margin.

8 . The training method of claim 1 , further comprising:

determining a position of a valid window margin at the third operation speed,

wherein determining of the position of the valid window margin at the third operation speed includes:

finding a third pass-to-fail point while adjusting a delay of the first signal at the third operation speed, and

determining from a point, which is obtained by subtracting the third eye width from the third pass-to-fail point, to the third pass-to-fail point, as the position of the valid window margin.

9 . The training method of claim 1 , wherein the first signal corresponds to a DQ signal, and the second signal corresponds to a DQS signal.

10 . The training method of claim 1 , wherein when second devices to be tested belong to a same lot as the first devices to be tested,

no model showing the relation between operation speeds and eye widths is separately derived for the second devices to be tested, and

the model derived for the first devices to be tested is used, when calculating eye widths associated with the second devices to be tested.

11 . The training method of claim 1 , wherein when third devices to be tested belong to a different lot from the first devices to be tested,

the model derived for the first devices to be tested is updated, and

the updated model is used, when calculating eye widths associated with the third devices to be tested.

12 . The training method of claim 1 , wherein

the calculating of the first eye width and the second eye width is performed by a first processor, and

the deriving of the model showing the relation between operation speeds and eye widths is performed by a second processor.

13 . The training method of claim 12 , wherein the first processor performs a DC test on each of the first devices to be tested, after calculating the first eye width and the second eye width.

14 . A training method comprising:

for each of first devices to be tested, calculating a first eye width at which a first signal and a second signal synchronize with each other at a first operation speed, and calculating a second eye width at which the first signal and the second signal synchronize with each other at a second operation speed different from the first operation speed;

performing machine learning on the first eye width and the second eye width to derive a linear regression model showing a relation between operation speeds and eye widths by using a gradient descent method to calculate parameters of the linear regression model;

calculating a third eye width corresponding to a third operation speed, using the linear regression model;

finding a third fail-to-pass point, while adjusting a delay of the first signal at the third operation speed; and

determining from the third fail-to-pass point to a point obtained by adding the third eye width to the third fail-to-pass point, as a position of a valid window margin.

15 . The training method of claim 14 , wherein when second devices to be tested belong to a same lot as the first devices to be tested,

no model showing the relation between operation speeds and eye widths is separately derived for the second devices to be tested,

the model derived for the first devices to be tested is used, when calculating eye widths associated with the second devices to be tested, and

wherein when third devices to be tested belong to a different lot from the first devices to be tested,

the model derived for the first devices to be tested is updated, and

the updated model is used, when calculating eye widths associated with the third devices to be tested.

16 . A test apparatus comprising:

output nodes configured to electrically connect to first devices to be tested;

a timing generator configured to provide a first signal and a second signal to the first devices to be tested through the output nodes; and

a controller configured to control the timing generator,

wherein the controller is configured to calculate a first eye width at which the first signal and the second signal synchronize with each other at a first operation speed, and calculate a second eye width at which the first signal and the second signal synchronize with each other at a second operation speed different from the first operation speed, for each of first devices to be tested,

wherein the controller is configured to perform machine learning on the first eye width and the second eye width to derive a model showing a relation between operation speeds and eye widths, and

wherein the controller is configured to calculate a third eye width corresponding to a third operation speed different from the first operation speed and the second operation speed by using the model.

17 . The test apparatus of claim 16 , wherein

the controller is configured to perform the machine learning by learning of a linear regression model, and

the controller is configured to calculate parameters of the linear regression model using a gradient descent method.

18 . The test apparatus of claim 16 , wherein the controller is configured to calculate the first eye width by,

finding a first fail-to-pass point and a first pass-to-fail point, while adjusting a delay of the first signal at the first operation speed, and

determining an interval between the first fail-to-pass point and the first pass-to-fail point as the first eye width.

19 . The test apparatus of claim 18 , wherein the controller is configured to find of the first fail-to-pass point by,

determining the first signal having a first delay, as a fail,

determining the first signal having a second delay greater than the first delay by a first value, as a pass,

determining the first signal having a third delay less than the second delay by a second value, as a fail, the second value being smaller than the first value, and

determining the first signal having a fourth delay greater than the third delay by a third value, as a pass, the third value being less than the second value.

20 . The test apparatus of claim 16 , wherein the controller is further configured to:

determine a position of a valid window margin at the third operation speed,

wherein the determining of the position of the valid window margin at the third operation speed includes:

finding a third fail-to-pass point, while adjusting a delay of the first signal at the third operation speed, and

determining from the third fail-to-pass point to a point obtained by adding the third eye width to the third fail-to-pass point, as the position of the valid window margin.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2023
From: KIM, KWANG KYU; CHOI, JAE-IL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 062471/0368 →
Priority Claims (1)
KR 10-2022-0078698 · Jun 28, 2022 · national
Continuity (1)
Related Publication 20230417832A1 · Dec 28, 2023
References Cited (22)
US 8605539B2 · Haldar et al. · 2013 [cited by applicant]
US 9257200B2 · Bhakta et al. · 2016 [cited by applicant]
US 9639495B2 · Dearth et al. · 2017 [cited by applicant]
US 10943183B2 · Cha · 2021 [cited by applicant]
US 11017839B2 · Hsieh et al. · 2021 [cited by applicant]
US 11061577B2 · Kim · 2021 [cited by applicant]
US 20110199133A1 · Yamada · 2011 [cited by examiner]
US 20120216086A1 · Fujisaki · 2012 [cited by examiner]
US 20200293415A1 · Mukherjee et al. · 2020 [cited by applicant]
US 20220215893A1 · Tang · 2022 [cited by examiner]
KR 1020120037184A · 2012 [cited by applicant]
KR 1020130032505A · 2013 [cited by applicant]
KR 1020170008062A · 2017 [cited by applicant]
KR 1020170038977A · 2017 [cited by applicant]
KR 1020180060669A · 2018 [cited by applicant]
KR 1020180079995A · 2018 [cited by applicant]
KR 1020190096753A · 2019 [cited by applicant]
KR 1020200049985A · 2020 [cited by applicant]
KR 1020200078991A · 2020 [cited by applicant]
KR 1020200092652A · 2020 [cited by applicant]
KR 20210133832A · 2021 [cited by applicant]
Notice of Allowance in Korean Appln. No. 10-2022-0078698, mailed on May 7, 2026, 5 pages (with English translation). [cited by applicant]