IP Library › Granted Patent US 12,728,482
Granted Patent B2
US 12,728,482 · App. 17/591,884 · Granted Sep 8, 2026

Laser marking system and method

Inventors: Gregory Jacob (Santa Clara, CA); Stephen Hamann (Mountain View, CA); Alexander Payne (Ben Lommond, CA); Lars Eng (Los Altos, CA); James Hunter (Campbell, CA)
Assignee: SILICON LIGHT MACHINES CORPORATION
B23K26/064B81B3/0083B81B2201/047
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Quick Facts
Patent No.
US 12,728,482
App. No.
17/591,884
Granted
Sep 8, 2026
Kind
B2
Abstract

A laser marking system including a spatial light modulator (SLM) with a multi-pixel, linear array of is microelectromechanical systems (MEMS) based diffractors, and methods of operating the same are disclosed. Generally, the system includes, in addition to the SLM, a laser operable to illuminate the SLM; imaging optics operable to focus a substantially linear swath of modulated light onto a surface of a workpiece, the linear swath including light from multiple pixels of the SLM, and a controller operable to control the SLM, laser and imaging optics to mark the surface of the workpiece to record a two-dimensional image thereon. In one embodiment, the diffractors include a number of electrostatically deflectable ribbons suspended over a substrate. In another, each diffractor is two-dimensional including an electrostatically deflectable first reflective operable to brought into optical interference with light reflected from a second reflective surface on a faceplate, or an adjacent diffractor.

Claims (51)

1 . A laser marking system comprising:

a spatial light modulator (SLM) comprising a multi-pixel, linear array of microelectromechanical systems (MEMS) based diffractors;

a laser operable to illuminate the SLM;

imaging optics operable to focus a linear swath of modulated light onto a surface of a workpiece, the linear swath comprising light from multiple pixels of the SLM; and

a controller operable to control the SLM, laser and imaging optics to mark the surface of the workpiece to record an image thereon,

wherein the controller is operable to provide gray-scale control of the MEMS based diffractors to provide a precise dosage of light from each pixel onto the surface of the workpiece to compensate for non-uniformities in light illuminating the SLM or in modulated transmitted from the SLM through the imaging optics.

2 . The laser marking system of claim 1 wherein each of the MEMS based diffractors comprises a number of electrostatically deflectable ribbons suspended over a substrate, each ribbon having a light reflective surface, wherein electrostatic deflection of the number of electrostatically deflectable ribbons brings light reflected from the light reflective surface of a first electrostatically deflectable ribbon into interference with light reflected from the light reflective surface of a second electrostatically deflectable ribbon.

3 . The laser marking system of claim 1 wherein each of the MEMS based diffractors comprises:

a piston layer suspended over a surface of a substrate by posts at corners thereof, the piston layer including an electrostatically deflectable piston and a number of flexures through which the piston is coupled to the posts;

a first reflective surface over a top surface of the piston; and

a faceplate suspended over the piston layer, the faceplate including a second reflective surface on a top surface of the faceplate, and an aperture through which the piston exposed,

wherein electrostatic deflection of the piston brings light reflected from the first reflective surface into interference with light reflected from the second reflective surface.

4 . The laser marking system of claim 1 wherein the imaging optics comprise a number of galvanometric mirrors, and wherein the controller is operable to control the number of galvanometric mirrors to scan the linear swath of modulated light across the surface of the workpiece to record a two-dimensional (2D) image thereon.

5 . The laser marking system of claim 1 further including a fixture to which the workpiece is positioned, and wherein the controller is operable to control the fixture to provide relative motion between the fixture and linear swath of modulated light to scan the linear swath of modulated light across the surface of the workpiece to record a two-dimensional (2D) image thereon.

6 . The laser marking system of claim 5 wherein fixture comprises a movable stage on which a multiple workpieces are positioned, and the controller is operable to move the multiple workpieces on the movable stage through an area of a focus of the imaging optics to sequentially record images thereon, and wherein the images recorded on each of the multiple workpieces can be different.

7 . The laser marking system of claim 1 wherein the SLM is operable to send a signal to the laser when image data loaded to the SLM from the controller is ready to be recorded on to the workpiece so that the laser can be pulsed.

8 . The laser marking system of claim 5 wherein the fixture is operable to send a signal to one or more of the controller, the SLM or the laser when the workpiece is in proper position to record an image thereon.

9 . A laser marking system comprising:

a spatial light modulator (SLM) comprising a multi-pixel, linear array of microelectromechanical systems (MEMS) based diffractors;

a laser operable to illuminate the SLM;

imaging optics operable to focus a linear swath of modulated light onto a surface of a workpiece, the linear swath comprising light from multiple pixels of the SLM; and a controller operable to control the SLM, laser and imaging optics to mark the surface of the workpiece to record an image thereon,

wherein the imaging optics comprise a number of galvanometric mirrors, and wherein the controller is operable to control the number of galvanometric mirrors to scan the linear swath of modulated light across the surface of the workpiece to record a two-dimensional (2D) image thereon, and

wherein the imaging optics comprise a number of cylindrical lenses to focus modulated light from the SLM onto the number of galvanometric mirrors, and a focus lens to focus the linear swath of modulated light from the number of galvanometric mirrors onto the surface of the workpiece.

10 . The laser marking system of claim 9 wherein the controller is operable to after scanning the linear swath of modulated light a predetermined distance across the surface of the workpiece in a first direction, to reposition the linear swath in a second direction perpendicular to the first direction, and repeat the scanning of the linear swath of modulated light across the surface of the workpiece by the predetermined distance in a third direction parallel and opposite to the first direction.

11 . A laser marking system comprising:

a laser;

a spatial light modulator (SLM) comprising a multi-pixel, linear array of microelectromechanical systems (MEMS) based diffractors;

illumination optics operable to illuminate the SLM with light from the laser, the illumination optics including a beam forming optical system to direct a rectangular beam onto the SLM;

imaging optics operable to focus a linear swath of modulated light onto a surface of a workpiece, the imaging optics comprising:

a first cylindrical lens to focus modulated light from the SLM in an X focal plane at the surface of the workpiece;

a second cylindrical lens to focus modulated light from the SLM in an Y focal plane, wherein an Y-focus determines a swath height of the linear swath of modulated light on the surface of the workpiece; and

a number of galvanometric mirrors disposed in a light path between the first and second cylindrical lenses and the surface of the workpiece; and

a controller operable to control the laser, SLM, and the number of galvanometric mirrors to scan the linear swath of modulated light across the surface of the workpiece to record a two-dimensional (2D) image thereon.

12 . The laser marking system of claim 11 wherein each of the MEMS based diffractors comprises a number of electrostatically deflectable ribbons suspended over a substrate, each ribbon having a light reflective surface, wherein electrostatic deflection of the number of electrostatically deflectable ribbons brings light reflected from the light reflective surface of a first electrostatically deflectable ribbon into interference with light reflected from the light reflective surface of a second electrostatically deflectable ribbon.

13 . The laser marking system of claim 11 wherein each of the MEMS based diffractors comprises:

a piston layer suspended over a surface of a substrate by posts at corners thereof, the piston layer including an electrostatically deflectable piston and a number of flexures through which the piston is coupled to the posts;

a first reflective surface over a top surface of the piston; and

a faceplate suspended over the piston layer, the faceplate including a second reflective surface on a top surface of the faceplate, and an aperture through which the piston exposed,

wherein electrostatic deflection of the piston brings light reflected from the first reflective surface into interference with light reflected from the second reflective surface.

14 . The laser marking system of claim 11 wherein the imaging optics further comprises a window disposed in a light path between the number of galvanometric mirrors and the surface of the workpiece.

15 . The laser marking system of claim 11 further comprising a movable stage on which a multiple workpieces are positioned, and the controller is operable to move the multiple workpieces on the movable stage past a focus of the imaging optics to sequentially record 2D images thereon, and wherein the images recorded on each of the multiple workpieces can be different.

16 . The laser marking system of claim 11 wherein the controller is operable to after scanning the linear swath of modulated light a predetermined distance across the surface of the workpiece in a first direction, to reposition the linear swath in a second direction perpendicular to the first direction, and repeat the scanning of the linear swath of modulated light across the surface of the workpiece by the predetermined distance in a third direction parallel and opposite to the first direction.

17 . A laser marking system comprising:

a fixture on which a workpiece having a surface to be marked is positioned;

a spatial light modulator (SLM) comprising a multi-pixel, linear array of microelectromechanical systems (MEMS) based diffractors;

a laser operable to illuminate the SLM;

imaging optics operable to focus a linear swath of modulated light onto the surface of the workpiece, the linear swath comprising light from multiple pixels of the SLM;

a controller operable to load image data to the SLM, position the fixture, and to control the SLM, laser and imaging optics to mark the surface of the workpiece to record an image thereon,

wherein the SLM is operable to signal the laser when image data loaded to the SLM is ready to be recorded on to the workpiece so that the laser can be pulsed, and

wherein the fixture includes a number of sensors to signal one or more of the controller, the SLM or the laser when the workpiece is in proper position to record an image thereon.

18 . The laser marking system of claim 17 wherein the controller is operable to provide gray-scale control of the MEMS based diffractors to provide a precise dosage of light from each pixel onto the surface of the workpiece to compensate for non-uniformities in light illuminating the SLM or in modulated transmitted therefrom through the imaging optics.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2022
From: JACOB, GREGORY; HAMANN, STEPHEN; PAYNE, ALEXANDER; ENG, LARS; HUNTER, JAMES
To: SILICON LIGHT MACHINES CORPORATION
Reel/Frame 059165/0509 →
Continuity (3)
Provisional Application 63183789 · May 4, 2021
Provisional Application 63146488 · Feb 5, 2021
Related Publication 20220250188A1 · Aug 11, 2022
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