Probe pin and probe card
A probe pin includes a low resistance member consisting of a first metal with a first conductivity, and a high resistance member consisting of a second metal with a second conductivity, the second metal having a resistivity higher than that of the low resistance member. The probe pin has a multi layered part between a contact part and a terminal part, where the multi layered part is configured in the order of the high resistance member, a slit of air gap, and the low resistance member, in a first direction different from a buckling direction of the probe pin at the time of inspection of a test object. The low resistance member and the high resistance member are arranged so as not to overlap with each other, when the multi layered part is viewed from the buckling direction.
1 . A probe pin having a contact part at one end of a longitudinal direction, for contacting an electrode of a test object, and has a terminal part at the other end of the longitudinal direction, for contacting a circuit board, the probe pin comprising:
a low resistance member consisting of a first metal with a first conductivity, and
a high resistance member consisting of a second metal with a second conductivity, the second metal having a resistivity higher than that of the low resistance member,
wherein the probe pin has a multi layered part between the contact part and the terminal part, where the multi layered part is configured in an order of the high resistance member, a slit of air gap, and the low resistance member, in a first direction different from a buckling direction of the probe pin at the time of inspection of the test object, and
the low resistance member and the high resistance member are arranged so as not to overlap with each other, when the multi layered part is viewed from the buckling direction.
2 . The probe pin as claimed in claim 1 ,
wherein the multi layered part is a five layered part consisting of five layers, which is configured in the order of the high resistance member, the slit, the low resistance member, the slit, and the high resistance member.
3 . The probe pin as claimed in claim 2 ,
wherein the probe pin has a first three layered part at one side of the five layered part in the longitudinal direction and a second three layered part at the other side of the five layered part in the longitudinal direction, each of the three layered parts formed of a low resistance member and two high resistance members, layered in the first direction, where the low resistance member is between the two high resistance members,
wherein the low resistance member of the five layered part and the low resistance member of the three layered part are connected continuously in the longitudinal direction,
the high resistance members of the five layered part and the high resistance members of the three layered part are each connected continuously in the longitudinal direction, and
the contact part and the terminal part are constituted only of the high resistance member.
4 . The probe pin as claimed in claim 3 , comprising a first guide-inside storage part located between the terminal part and the five layered part, and a second guide-inside storage part located between the five layered part and the contact part, each of the guide-inside storage parts formed of a low resistance member and a high resistance member,
wherein the circumference of an outer periphery of the low resistance member is entirely covered with the high resistance member.
5 . The probe pin as claimed in claim 1 ,
wherein the low resistance member of the multi layered part has two end faces in the buckling direction, and at least one of the end faces is equipped with a high resistance member.
6 . The probe pin as claimed in claim 2 , comprising a bridge part located between an upper end of the five layered part in the longitudinal direction and a lower end of the five layered part in the longitudinal direction, the bridge part having a low resistance member and a high resistance member,
wherein the circumference of an outer periphery of the low resistance member is entirely covered with the high resistance member, and the low resistance member is adhered with the high resistance member.
7 . The probe pin as claimed in claim 1 ,
wherein the first direction is a direction which is perpendicular to the buckling direction.
8 . The probe pin as claimed in claim 1 ,
wherein the multi layered part is a second three layered part consisting of three layers, which is configured in the order of the high resistance member, the slit, and the low resistance member.
9 . The probe pin as claimed in claim 1 ,
wherein the multi layered part is a five layered part consisting of five layers, which is configured in the order of the low resistance member, the slit, the high resistance member, the slit, and the low resistance member.
10 . A probe card comprising a plurality of probe pins as claimed in claim 1 .
11 . A probe card, comprising:
a plurality of probe pins as claimed in claim 4 , and
a first guide and a second guide, both having a plurality of guide holes, each for accepting the insertion of a probe pin and guiding the probe pin,
wherein the first guide-inside storage part is inserted into the first guide hole, and the second guide-inside storage part is inserted into the second first guide hole.
12 . The probe card as claimed in claim 11 ,
wherein a first length of the first three layered part from the first guide-inside storage part to the five layered part, and a second length of the second three layered part from the second guide-inside storage part to the five layered part are 500 μm to 1000 μm.