Low-k dielectric layer stack including an etch indicator layer for use in the dual damascene technique
A low-k dielectric layer stack is provided including a silicon based dielectric material with a low permittivity, wherein an intermediate silicon oxide based etch indicator layer is arranged at a depth that represents the depth of a trench to be formed in the dielectric layer stack. A thickness of the etch indicator layer is sufficiently small to not unduly compromise the overall permittivity of the dielectric layer stack. On the other hand, the etch indicator layer provides a prominent optical emission spectrum to reliably determine the time point when the etch process has reached the etch indicator layer. Thus, the depth of trenches in highly sophisticated low-k dielectric layer stacks may reliably be adjusted to minimize resistance variations of the metal lines.
1. A method of forming a metallization structure of a semiconductor device, the method comprising:
providing a substrate having formed thereabove a low-k dielectric layer stack including a barrier layer, a first and a second dielectric layer and a deposited silicon oxide based etch indicator layer disposed between said first and second dielectric layers;
forming a via in said dielectric layer stack;
etching a trench around said via while observing an optical emission spectrum of at least one of a cyanide (CN) and a carbon monoxide (GO) compound emitted as a result of at least partially etching said deposited silicon oxide based etch indicator layer; and
discontinuing said etching on the basis of information extracted from said optical emission spectrum.
2. The method of claim 1 , wherein said at least one of said first and second dielectric layers comprise at least one of hydrogen-containing silicon-oxy-carbide (SiCOH), porous hydrogen-containing silicon-oxy-carbide (SiCOH), SiLK, porous SiLK, MSQ and HSQ.
3. The method of claim 1 , wherein a thickness of said etch indicator layer is in the range of approximately 5-40 nm.
4. The method of claim 1 , wherein said first dielectric layer, said deposited silicon oxide based etch indicator layer and said second dielectric layer are formed in situ in a single deposition chamber.
5. A method, comprising:
providing a substrate having formed thereabove a barrier layer;
forming a first dielectric layer with a first thickness;
depositing a silicon oxide based etch indicator layer on said first dielectric layer;
forming a second dielectric layer on said deposited silicon oxide based etch indicator layer;
performing at least one etching process to form an opening in said second dielectric layer; and
stopping said at least one etching process based upon optically detecting byproducts from etching at least a portion of said deposited silicon oxide based etch indicator layer.
6. The method of claim 5 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a TEOS containing atmosphere.
7. The method of claim 5 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a silane and a nitrogen oxide containing atmosphere.
8. The method of claim 5 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a silane and oxygen containing atmosphere.
9. The method of claim 5 , wherein said first dielectric layer is formed by a deposition process and wherein said first dielectric layer and said silicon oxide based etch indicator layer are formed in situ in a single deposition chamber.
10. The method of claim 5 , wherein forming said first dielectric layer includes exposing said substrate to an oxygen and trimethylsilane containing atmosphere to deposit hydrogen-containing silicon-oxy-carbide (SiCOH).
11. The method of claim 10 , wherein a plasma is excited in said oxygen and trimethylsilane containing atmosphere.
12. The method of claim 7 , wherein said first dielectric layer is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed while substantially maintaining said sub-atmospheric pressure atmosphere.
13. The method of claim 8 , wherein said first dielectric layer is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed while substantially maintaining said sub-atmospheric pressure atmosphere.
14. The method of claim 9 , wherein said first dielectric layer is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed while substantially maintaining said sub-atmospheric pressure atmosphere.
15. The method of claim 5 , wherein said first and second dielectric layers are formed by plasma-enhanced chemical vapor deposition.
16. The method of claim 5 , wherein said silicon oxide based etch indicator layer is formed by plasma-enhanced chemical vapor deposition.
17. The method of claim 5 , wherein at least one of said first and second dielectric layers are formed by a spin-on process.
18. A method of forming a low-k dielectric layer stack, the method comprising:
providing a substrate having formed thereabove a barrier layer;
forming a first layer of hydrogen-containing silicon-oxy-carbide (SiCOH) with a first thickness;
depositing a silicon oxide based etch indicator layer on said first layer;
forming a second layer of hydrogen-containing silicon-oxy-carbide (SiCOH) on said deposited etch indicator layer;
performing at least one etching process to form an opening in said second dielectric layer; and
stopping said at least one etching process based upon optically detecting byproducts from etching at least a portion of said deposited silicon oxide based etch indicator layer.
19. The method of claim 18 , wherein said first layer of hydrogen-containing silicon-oxy-carbide (SiCOH), said deposited silicon oxide based etch indicator layer and said second layer of hydrogen-containing silicon-oxy-carbide (SiCOH) are formed by performing at least one deposition process in situ in a single deposition chamber.
20. The method of claim 18 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a TEOS containing atmosphere.
21. The method of claim 18 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a silane and a nitrogen oxide containing atmosphere.
22. The method of claim 18 , wherein depositing said silicon oxide based etch indicator layer includes depositing silicon dioxide in a silane and oxygen containing atmosphere.
23. The method of claim 21 , wherein said first layer of hydrogen-containing silicon-oxy-carbide (SiCOH) is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed by performing a deposition process while substantially maintaining said sub-atmospheric pressure atmosphere.
24. The method of claim 22 , wherein said first layer of hydrogen-containing silicon-oxy-carbide (SiCOH) is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed by performing a deposition process while substantially maintaining said sub-atmospheric pressure atmosphere.
25. The method of claim 18 , wherein said first layer of hydrogen-containing silicon-oxy-carbide (SiCOH) is formed in a sub-atmospheric pressure atmosphere and said silicon oxide based etch indicator layer is formed by performing a deposition process while substantially maintaining said sub-atmospheric pressure atmosphere.
26. The method of claim 18 , wherein said first and second layers of hydrogen-containing silicon-oxy-carbide (SiCOH) are formed by plasma-enhanced chemical vapor deposition.
27. A method of forming a metallization structure of a semiconductor device, the method comprising:
providing a substrate having formed thereabove a low-k dielectric layer stack including a barrier layer, a first and a second layer of hydrogen-containing silicon-oxy-carbide (SiCOH) and a deposited silicon oxide based etch indicator layer disposed between said first and second layers;
forming a via in said dielectric layer stack;
etching a trench around said via while observing an optical emission spectrum of at least one of a cyanide (CN) and a carbon monoxide (CO) compound emitted as a result of at least partially etching said deposited silicon oxide based etch indicator layer; and
discontinuing said etching on the basis of information extracted from said optical emission spectrum.
28. The method of claim 27 , wherein said first and second layers of hydrogen-containing silicon-oxy-carbide (SiCOH) and said silicon oxide based etch indicator layer are formed by performing at least one deposition process in situ in a single deposition chamber.
29. The method of claim 27 , wherein a thickness of said etch indicator layer is in the range of approximately 5-40 nm.