IP Library › Granted Patent US 6,974,558
Granted Patent B2
US 6,974,558 · App. 09/925,427 · Granted Dec 13, 2005

Susbstrate material for mounting a semiconductor device, substrate for mounting a semiconductor device, semiconductor device, and method of producing the same

Assignee: Sumotomo Electric Industries, Ltd.
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Quick Facts
Patent No.
US 6,974,558
App. No.
09/925,427
Granted
Dec 13, 2005
Kind
B2
Abstract

To provide a substrate material made of an aluminum/silicon carbide composite alloy which has a thermal conductivity of 100 W/m×K or higher and a thermal expansion coefficient of 20×10 −6 /° C. or lower and is lightweight and compositionally homogeneous. A substrate material made of an aluminum/silicon carbide composite ally which comprises Al—SiC alloy composition parts and non alloy composition part and dispersed therein from 10 to 70% by weight silicon carbide particles, and in which the fluctuations of silicon carbide concentration in the Al—SiC alloy composition parts therein are within 1% by weight. The substrate material is produced by sintering a compact of an aluminum/silicon carbide starting powder at a temperature not lower than 600° C. in a non-oxidizing atmosphere.

Claims (21)

1. A method of producing a substrate made of an aluminum/silicon carbide composite alloy by the sintering method, comprising the steps of:

mixing an aluminum powder and silicon carbide powder to form an aluminum/silicon carbide starting powder having a silicon carbide content of from 10 to 70% by weight;

compacting the aluminum/silicon carbide starting powder to form a compact;

sintering the compact at a temperature of 600° C. or higher in a non-oxidizing atmosphere for aluminum to thereby obtain a pre-formed substrate made of an aluminum/silicon carbide composite alloy; and

forming a coating layer on a surface of the pre-formed substrate to thereby obtain the substrate.

2. The method of producing a substrate as claimed in claim 1 , wherein the step of forming a coating layer is:

heating the substrate in an oxidizing atmosphere; or exposing the substrate to a steam atmosphere.

3. The method of producing a substrate as claimed in claim 1 , wherein the step of forming a coating layer comprises steps of:

forming a layer of a metal having a Young's modulus of 15,000 kg/mm 2 or lower on the substrate material;

polishing the metal layer;

and plating the polished metal layer with at least one metal selected from nickel and gold.

4. The method of producing a substrate as claimed in claim 1 , wherein the step of forming a coating layer comprises steps of:

forming a layer of a metal having a melting point of 600° C. or lower on the substrate surface;

heating the metal layer to a temperature not higher than 600° C.; and plating the metal layer with at least one metal selected from nickel and gold.

5. The method of producing a substrate as claimed in claim 1 , wherein the step of forming a coating layer comprises steps of:

forming a layer of at least one organic resin selected from an epoxy resin, a silicone resin, a polyimide resin, and the like each containing a metallic filler or not on the substrate surface.

6. The method of producing a substrate as claimed in claim 5 , wherein the step of forming a coating layer further comprises steps of:

plating a metal layer made of at least one metal selected from nickel and gold on the layer of organic resin.

7. The method of producing a substrate as claimed in claim 6 , wherein the forming step of a layer of a metal having a Young's modulus of 15,000 kg/mm 2 or lower on the substrate is conducted by barrel plating.

8. The method of producing a substrate as claimed in claim 7 , wherein the barrel plating is conducted in a container which contains metal spheres having a particle diameter of from 0.1 to 10 mm and having the same composition as the deposit to be formed.

9. The method of producing a substrate as claimed in claim 8 , wherein the spheres contained in the container for use in barrel plating have a surface area which is at least two times that of the corresponding true spheres.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2001
From: YAMAGATA, SHINICHI; IMAMURA, MAKOTO; TAKANO, YOSHISHIGE; HIROSE, YOSHIYUKI; ABE, YUGAKU; FUKUI, AKIRA; TAKIKAWA, TAKATOSHI
To: SUMITOMO ELECTRIC INDUSTRIES, LTD.
Reel/Frame 012070/0671 →
Priority Claims (3)
JP P. 8-175730 · Jun 14, 1996 · national
JP P. 9-84906 · Apr 3, 1997 · national
JP P.9-136164 · May 9, 1997 · national
Continuity (3)
Division 0969216200 · Oct 20, 2000
Division 0887454300 · Jun 13, 1997
Related Publication 20020034651A1 · Mar 21, 2002