IP Library Granted Patent US 7,301,828
Granted Patent B2
US 7,301,828 · App. 11/363,366 · Granted Nov 27, 2007

Decoding techniques for read-only memory

Assignee: Agere Systems Inc.
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Quick Facts
Patent No.
US 7,301,828
App. No.
11/363,366
Granted
Nov 27, 2007
Kind
B2
Abstract

A memory circuit includes a number of bit line structures, each including at least three bit lines; a number of word lines that intersect with the bit line structures at a number of sites; and a number of switching devices located at the sites. A number of column sense logic units are also provided, corresponding to the bit line structures. Each of the column sense logic units includes a first logic gate and a second logic gate. The first logic gate has a first input connected with a first one of the bit lines and a second input connected with a second one of the bit lines. The second logic gate has a first input interconnected with a third one of the bit lines, and a second input interconnected with the second one of the bit lines.

Claims (103)

1. A memory circuit, comprising:

a plurality of bit line structures, each of said bit line structures comprising at least three bit lines;

a plurality of word lines, said word lines intersecting with said bit line structures at a plurality of sites;

a plurality of switching devices, individual ones of said switching devices being located at selected ones of said sites and being connected between an adjacent one of said word lines and a selected one of said bit lines of an adjacent one of said bit line structures for selective electrical conduction therebetween upon activation by said adjacent one of said word lines; and

a plurality of column sense logic units, each of said column sense logic units being associated with a corresponding one of said bit line structures, each of said column sense logic units in turn comprising:

a first logic gate having a first input electrically interconnected with a first one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with a second one of said bit lines in said corresponding one of said bit line structures; and

a second logic gate having a first input electrically interconnected with a third one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with said second one of said bit lines in said corresponding one of said bit line structures.

2. The memory circuit of claim 1 , wherein said circuit is formed as an integrated circuit.

3. The memory circuit of claim 1 , wherein:

with respect to a given one of said column sense logic units, said first one of said bit lines is designated as A, said second one of said bit lines is designated as C, and said third one of said bit lines is designated as B; and

each of said sites is configured to store at least two bits of information, said information being encoded according to the following table:

bit line A

bit line B

bit line C

bit 0

bit 1

inactive

inactive

inactive

0

0

active

inactive

inactive

0

1

inactive

active

inactive

1

0

inactive

inactive

active

1

1.

4. The memory circuit of claim 3 , wherein said first logic gate is configured to decode said bit 1 and said second logic gate is configured to decode said bit 0 .

5. The memory circuit of claim 3 , wherein each of said first logic gates and each of said second logic gates has an output, further comprising a column multiplexer electrically interconnected with said outputs of said first and second logic gates, said column multiplexer being configured to select which of said column sense logic units to read from.

6. The memory circuit of claim 5 , wherein said outputs of said logic gates are available to said multiplexer substantially immediately following said activation of said adjacent one of said word lines.

7. The memory circuit of claim 3 , wherein said switching devices comprise field effect transistors (FETs).

8. The memory circuit of claim 7 , wherein said FETs comprise n-type FETs (NFETS).

9. The memory circuit of claim 8 , wherein said “inactive” entry in said table denotes a logical “high” state and said “active” entry in said table denotes a logical “low” state.

10. The memory circuit of claim 9 , wherein said “low” state is achieved via pull-down through a corresponding one of said NFETs.

11. The memory circuit of claim 3 , wherein said first and second logic gates comprise NAND gates.

12. The memory circuit of claim 1 , wherein said individual ones of said switching devices are connected between said adjacent one of said word lines and said selected one of said bit lines of said adjacent one of said bit line structures via a programmable contact window.

13. The memory circuit of claim 1 , wherein said circuit is formed as an integrated circuit.

14. A semiconductor wafer comprising a plurality of integrated circuits, at least one of the plurality of integrated circuits comprising:

a plurality of bit line structures, each of said bit line structures comprising at least three bit lines;

a plurality of word lines, said word lines intersecting with said bit line structures at a plurality of sites;

a plurality of switching devices, individual ones of said switching devices being located at selected ones of said sites and being connected between an adjacent one of said word lines and a selected one of said bit lines of an adjacent one of said bit line structures for selective electrical conduction therebetween upon activation by said adjacent one of said word lines;

a plurality of column sense logic units, each of said column sense logic units being associated with a corresponding one of said bit line structures, each of said column sense logic units in turn comprising:

a first logic gate having a first input electrically interconnected with a first one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with a second one of said bit lines in said corresponding one of said bit line structures; and

a second logic gate having a first input electrically interconnected with a third one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with said second one of said bit lines in said corresponding one of said bit line structures.

15. A computing apparatus, comprising:

a memory;

an input output device; and

at least one processor, coupled to said memory and said input output device and operative to execute instructions, at least some of said instructions being stored in said memory;

wherein said memory in turn comprises:

a plurality of bit line structures, each of said bit line structures comprising at least three bit lines;

a plurality of word lines, said word lines intersecting with said bit line structures at a plurality of sites;

a plurality of switching devices, individual ones of said switching devices being located at selected ones of said sites and being connected between an adjacent one of said word lines and a selected one of said bit lines of an adjacent one of said bit line structures for selective electrical conduction therebetween upon activation by said adjacent one of said word lines; and

a plurality of column sense logic units, each of said column sense logic units being associated with a corresponding one of said bit line structures, each of said column sense logic units in turn comprising:

a first logic gate having a first input electrically interconnected with a first one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with a second one of said bit lines in said corresponding one of said bit line structures; and

a second logic gate having a first input electrically interconnected with a third one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with said second one of said bit lines in said corresponding one of said bit line structures.

16. A method of operating a memory circuit, comprising the steps of:

providing a memory circuit comprising:

a plurality of bit line structures, each of said bit line structures comprising at least three bit lines;

a plurality of word lines, said word lines intersecting with said bit line structures at a plurality of sites;

a plurality of switching devices, individual ones of said switching devices being located at selected ones of said sites and being connected between an adjacent one of said word lines and a selected one of said bit lines of an adjacent one of said bit line structures for selective electrical conduction therebetween upon activation by said adjacent one of said word lines;

a plurality of column sense logic units, each of said column sense logic units being associated with a corresponding one of said bit line structures, each of said column sense logic units in turn comprising:

a first logic gate having an output and having a first input electrically interconnected with a first one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with a second one of said bit lines in said corresponding one of said bit line structures; and

a second logic gate having an output and having a first input electrically interconnected with a third one of said bit lines in said corresponding one of said bit line structures and a second input electrically interconnected with said second one of said bit lines in said corresponding one of said bit line structures; and

a column multiplexer electrically interconnected with said outputs of said first and second logic gates, said column multiplexer being configured to select which of said column sense logic units to read from;

activating a given one of said word lines; and

making said outputs of said logic gates available to said multiplexer substantially immediately following activation of said given one of said word lines.

17. The method of claim 16 , further comprising the additional step of selecting which of said column sense logic units to read from, with said multiplexer.

18. The method of claim 17 , wherein, with respect to a given one of said column sense logic units, said first one of said bit lines is designated as A, said second one of said bit lines is designated as C, and said third one of said bit lines is designated as B, and each of said sites is configured to store at least two bits of information;

further comprising the additional step of decoding said outputs of said logic gates according to the following table:

bit line A

bit line B

bit line C

bit 0

bit 1

inactive

inactive

inactive

0

0

active

inactive

inactive

0

1

inactive

active

inactive

1

0

inactive

inactive

active

1

1.

Assignments (10)
CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER PREVIOUSLY RECORDED AT REEL: 047357 FRAME: 0302. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 22, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048674/0834 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED ON REEL 047195 FRAME 0658. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047357/0302 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047195/0658 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: AGERE SYSTEMS LLC
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035365/0634 →
CERTIFICATE OF CONVERSION Recorded Aug 29, 2014
From: AGERE SYSTEMS INC.
To: AGERE SYSTEMS LLC
Reel/Frame 033663/0948 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2006
From: DUDECK, DENNIS E.; EVANS, DONALD A.; PHAM, HAI Q.; WERNER, WAYNE E.; WOZNIAK, RONALD J.
To: AGERE SYTEMS INC.
Reel/Frame 017642/0244 →
Continuity (1)
Related Publication 20070201281A1 · Aug 30, 2007