Exhaustive diagnosis of bridging defects in an integrated circuit including multiple nodes using test vectors and IDDQ measurements
View Patent ↗A method, system and computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes are disclosed. Quiescent power supply current (I DDQ ) of the integrated circuit (IC) is measured under multiple test vectors. Logic states of the nodes on the IC are also obtained under the multiple test vectors. The nodes are partitioned into sets based on their logic states under low-current test vectors. Large sets are further divided into subsets (“state-count subsets”) based on the logic states of nodes under high-current test vectors. For large sets, explicit evaluation under the I DDQ bridge fault model is performed only on pairs of nodes belonging to subsets having complementary state counts, to save system resources in computation. Exhaustive diagnosis considering all pairs of nodes on the IC is thus feasibly achieved due to the saving of system resources.
1. A method for diagnosing a bridging defect in an integrated circuit including multiple nodes, the method comprising:
obtaining quiescent power supply current (I DDQ ) measurements of the integrated circuit under multiple test vectors;
categorizing each of the obtained I DDQ measurements as one of a defect value and a non-defect value;
obtaining a logic state of each of the multiple nodes under each of the multiple test vectors;
determining whether two of the multiple nodes constitute a complementary pair of nodes; and
diagnosing whether a bridging defect exists between the determined complementary pair of nodes.
2. The method of claim 1 , further comprising determining whether two of the multiple nodes are at a same logic state under a test vector that yield an I DDQ measurement of the non-defect value.
3. The method of claim 2 , wherein the complementary pair determining is only performed on nodes that are at the same logic state under all test vectors that yield an I DDQ measurement of the non-defect value.
4. The method of claim 1 , wherein the complementary pair determining first determines a complementary pair for a node that is at a same logic state under all the test vectors that yield I DDQ measurements of the defect value.
5. The method of claim 1 , further comprising partitioning the multiple nodes into sub-groups based on the obtained logic states of the multiple nodes under test vectors that yield I DDQ measurements of the non-defect value.
6. The method of claim 1 , wherein the diagnosing includes determining whether logic states of the two nodes of the complementary pair are opposite to each other under each of test vectors that yield I DDQ measurements of the defect value.
7. The method of claim 1 , wherein the diagnosing includes determining whether the two nodes of the complementary pair are physically proximate to each other.
8. A system for diagnosing a bridging defect in an integrated circuit including multiple nodes, the system comprising:
means for measuring quiescent power supply current (I DDQ ) of the integrated circuit under multiple test vectors;
means for categorizing each of the obtained I DDQ measurements as one of a defect value and a non-defect value;
means for obtaining a logic state of each of the multiple nodes under each of the multiple test vectors;
means for determining whether two of the multiple nodes constitute a complementary pair of nodes; and
means for diagnosing whether a bridging defect exists between the determined complementary pair of nodes.
9. The system of claim 8 , further comprising means for determining whether two of the multiple nodes are at a same logic state under a test vector that yield an I DDQ measurement of the non-defect value.
10. The system of claim 9 , wherein the complementary pair determining means determines a complementary pair only among nodes that are at the same logic state under all test vectors that yield an I DDQ measurement of the non-defect value.
11. The system of claim 8 , wherein the complementary pair determining means determines a complementary pair for a node that is at a same logic state under all the test vectors that yield I DDQ measurements of the defect value.
12. The system of claim 8 , further comprising means for partitioning the multiple nodes into sub-groups based on the obtained logic states of the multiple nodes under test vectors that yield I DDQ measurements of the non-defect value.
13. The system of claim 8 , wherein the diagnosing means determines whether logic states of the two nodes of the complementary pair are opposite to each other under each of test vectors that yield I DDQ measurements of the defect value.
14. The system of claim 8 , wherein the diagnosing means controls determining whether the two nodes of the complementary pair are physically proximate to each other.
15. A computer program product for diagnosing a bridging defect in an integrated circuit including multiple nodes, the computer program product comprising:
computer usable program code configured to:
obtain quiescent power supply current (I DDQ ) measurements of the integrated circuit under multiple test vectors;
categorize each of the obtained I DDQ measurements as one of a defect value and a non-defect value;
obtain a logic state of each of the multiple nodes under each of the multiple test vectors;
determine whether two of the multiple nodes constitute a complementary pair of nodes; and
diagnose whether a bridging defect exists between the determined complementary pair of nodes.
16. The program product of claim 15 , wherein the program code is further configured to determine whether two of the multiple nodes are at a same logic state under a test vector that yield an I DDQ measurement of the non-defect value.
17. The program product of claim 16 , wherein the program code is further configured to determine a complementary pair only among nodes that are at the same logic state under all test vectors that yield an I DDQ measurement of the non-defect value.
18. The program product of claim 15 , wherein the program code is further configured to determine a complementary pair for a node that is at a same logic state under all the test vectors that yield I DDQ measurements of the defect value before determining a complementary pair for other nodes.
19. The program product of claim 15 , wherein the program code is further configured to partition the multiple nodes into sub-groups based on the obtained logic states of the multiple nodes under test vectors that yield I DDQ measurements of the non-defect value.
20. The program product of claim 15 , wherein the program code is further configured to determine whether logic states of the two nodes of the complementary pair are opposite to each other under each of test vectors that yield I DDQ measurements of the defect value.
21. The program product of claim 15 , wherein the program code is further configured to control determining whether the two nodes of the complementary pair are physically proximate to each other.
22. A method of generating a system for diagnosing a bridging defect in an integrated circuit including multiple nodes, the method comprising: providing a computer infrastructure operable to:
obtain quiescent power supply current (I DDQ ) measurements of the integrated circuit under multiple test vectors;
categorize each of the obtained I DDQ measurements as one of a defect value and a non-defect value;
obtain a logic state of each of the multiple nodes under each of the multiple test vectors;
determine whether two of the multiple nodes constitute a complementary pair of nodes; and
diagnose whether a bridging defect exists between the determined complementary pair of nodes.
23. The method of claim 22 , wherein the computer infrastructure is further operable to determine whether two of the multiple nodes are at a same logic state under a test vector that yield an I DDQ measurement of the non-defect value.
24. The method of claim 23 , wherein the computer infrastructure is further operable to determine a complementary pair only among nodes that are at the same logic state under all test vectors that yield an I DDQ measurement of the non-defect value.
25. The method of claim 22 , wherein the computer infrastructure is further operable to determine a complementary pair for a node that is at a same logic state under all the test vectors that yield I DDQ measurements of the defect value before determining a complementary pair for other nodes.
26. The method of claim 22 , wherein the computer infrastructure is further operable to partition the multiple nodes into sub-groups based on the obtained logic states of the multiple nodes under test vectors that yield I DDQ measurements of the non-defect value.
27. The method of claim 22 , wherein the computer infrastructure is further operable to determine whether logic states of the two nodes of the complementary pair are opposite to each other under each of test vectors that yield I DDQ measurements of the defect value.
28. The method of claim 22 , wherein the computer infrastructure is further operable to control determining whether the two nodes of the complementary pair are physically proximate to each other.