Method and apparatus for angular-resolved spectroscopic lithography characterization
An apparatus and method to determine a property of a substrate by measuring, in the pupil plane of a high numerical aperture lens, an angle-resolved spectrum as a result of radiation being reflected off the substrate. The property may be angle and wavelength dependent and may include the intensity of TM- and TE-polarized light and their relative phase difference.
1. A scatterometer, comprising:
a lens configured to direct a radiation beam from a radiation source toward a pattern formed on a substrate; and
a detector located in a pupil plane of the lens and configured to detect an angle-resolved spectrum of the radiation beam reflected from the pattern,
wherein a property of the substrate is measured using the detector by measuring asymmetries between intensities of corresponding diffraction orders diffracted from the pattern in the reflected angle-resolved spectrum.
2. The scatterometer according to claim 1 , wherein a numerical aperture of the lens is at least 0.9.
3. The scatterometer according to claim 1 , wherein a numerical aperture of the lens is at least 0.95.
4. The scatterometer according to claim 1 , wherein the detector is configured to measure at least one of (a) an intensity of a transverse magnetic and a transverse electric polarized light and (b) a phase difference between the transverse magnetic and the transverse electric polarized light.
5. The scatterometer according to claim 1 , wherein asymmetries between intensities of corresponding diffraction orders diffracted from the pattern are a property of the reflected angle-resolved spectrum, wherein the property of the substrate is further measured by measuring, in the pupil plane of the lens, another property of the reflected angle-resolved spectrum at a plurality of wavelengths substantially simultaneously.
6. The scatterometer according to claim 5 , wherein the plurality of wavelengths each has a spacing of at least twice a bandwidth of the plurality of wavelengths.
7. The scatterometer according to claim 1 , further comprising an extended broadband radiation source configured to provide the radiation beam to the surface of the substrate, the radiation beam having a wavelength of at least 50 nm.
8. The scatterometer according to claim 1 , wherein the asymmetries are related to an extent of an overlay between two misaligned periodic structures.
9. The scatterometer of claim 1 , further comprising a non-polarizing beam splitter and a tilted mirror configured to couple off a portion of the radiation beam emitted from a radiation source for a separate measurement with the detector.
10. A scatterometer, comprising:
a high numerical aperture lens configured to direct a radiation beam from a radiation source toward a substrate;
a detector located in a pupil plane of the high numerical aperture lens and configured to detect an angle-resolved spectrum of the radiation beam reflected a surface of the substrate; and
a wavelength multiplexer located between a radiation source configured to provide the radiation beam and the substrate and a wavelength demultiplexer located between the substrate and the detector,
wherein a property of the substrate is measured using the detector by measuring an asymmetry in the reflected angle-resolved spectrum at a plurality of angles substantially simultaneously.
11. The scatterometer according to claim 10 , wherein the wavelength multiplexer comprises a dispersive element placed at a back-projected object plane.
12. The scatterometer according to claim 11 , wherein the dispersive element is one of a grating and a prism adapted to accommodate N discrete wavelengths each having a spacing of at least twice a bandwidth of the plurality of wavelengths.
13. The scatterometer according to claim 10 , wherein a surface area of the radiation source is split into N parts that are each coupled to the wavelength multiplexer, where N is a number of discrete wavelengths.
14. The scatterometer according to claim 10 , wherein the wavelength demultiplexer comprises a dispersive element placed at the pupil plane.
15. The scatterometer according to claim 1 , further comprising an optical wedge in an object plane configured to achieve a pre-defined separation of the reflected angle-resolved spectrum in the pupil plane.
16. The scatterometer according to claim 1 , wherein a portion of the radiation beam is used to measure an intensity of the radiation beam.
17. The scatterometer according to claim 1 , the detector is adapted to compensate for fluctuations in an intensity pattern of the reflected radiation beam.
18. The scatterometer according to claim 1 , further comprising a pupil stop configured to limit a size of a portion of the radiation beam.
19. A scatterometer, comprising:
a lens configured to direct a radiation beam from a radiation source toward a pattern formed on a substrate; and
a space between the substrate and the lens comprising a liquid,
wherein a property of the substrate is measured using a detector by measuring asymmetries between intensities of corresponding diffraction orders in an angle-resolved spectrum of a radiation beam diffracted from the pattern, at a plurality of angles and a plurality of wavelengths substantially simultaneously.
20. The scatterometer according to claim 19 , wherein the liquid is water.
21. The scatterometer according to claim 19 , wherein a numerical aperture of the lens is at least 0.9.
22. The scatterometer according to claim 19 , wherein a numerical aperture of the lens is at least 0.95.
23. The scatterometer according to claim 19 , wherein the detector is configured to measure at least one of (a) an intensity of a transverse magnetic and a transverse electric polarized light and (b) a phase difference between the transverse magnetic and the transverse electric polarized light.
24. The scatterometer of claim 19 , further comprising a non-polarizing beam splitter and a tilted minor configured to couple off a portion of the radiation beam emitted from a radiation source for a separate measurement with the detector.
25. A scatterometer, comprising:
a high numerical aperture lens configured to direct a radiation beam from a radiation source toward a substrate;
a space between the substrate and the high numerical aperture lens comprising a liquid;
a wavelength multiplexer located between a radiation source, configured to provide the radiation beam, and the substrate; and
a wavelength demultiplexer located between the substrate and the detector located in a pupil plane of the high numerical aperture lens, and configured to measure another property of the reflected spectrum,
wherein a property of the substrate is measured using a detector by measuring an asymmetry in an angle-resolved spectrum of a radiation beam reflected from a surface of the substrate, at a plurality of angles and a plurality of wavelengths substantially simultaneously.
26. A scatterometer, comprising:
a lens configured to direct a radiation beam from a radiation source toward a pattern formed on a substrate; and
an edge adapted to be placed in one of opposite halves of an intermediate object plane associated with the lens,
wherein a property of the substrate is measured by a detector by measuring asymmetries between intensities of corresponding diffraction orders in an angle-resolved spectrum of a radiation beam diffracted from the pattern, at a plurality of angles and a plurality of wavelengths substantially simultaneously.
27. The scatterometer of claim 26 , further comprising a non-polarizing beam splitter and a tilted mirror configured to couple off a portion of the radiation beam emitted from a radiation source for a separate measurement with the detector.
28. The scatterometer according to claim 26 , wherein the edge is a Foucault knife edge.
29. The scatterometer according to claim 26 , wherein a numerical aperture of the lens is at least 0.9.
30. The scatterometer according to claim 26 , wherein a numerical aperture of the lens is at least 0.95.
31. The scatterometer according to claim 26 , wherein wherein the detector is configured to measure at least one of (a) an intensity of a transverse magnetic and a transverse electric polarized light and (b) a phase difference between the transverse magnetic and the transverse electric polarized light.
32. A scatterometer, comprising:
a high numerical aperture lens configured to direct a radiation beam from a radiation source toward a substrate;
an edge adapted to be placed in one of opposite halves of an intermediate object plane associated with the high numerical aperture lens;
a wavelength multiplexer located between a radiation, source configured to provide the radiation beam, and the substrate; and
a wavelength demultiplexer located between the substrate and the detector located in a pupil plane of the high numerical aperture lens, and configured to measure the property of the reflected spectrum,
wherein a property of the substrate is measured by a detector by measuring an asymmetry in an angle-resolved spectrum of a radiation beam reflected from a surface of the substrate, at a plurality of angles and a plurality of wavelengths substantially simultaneously.