IP Library Granted Patent US 7,846,814
Granted Patent B2
US 7,846,814 · App. 12/165,475 · Granted Dec 7, 2010

Semiconductor layer structure and method of making the same

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Quick Facts
Patent No.
US 7,846,814
App. No.
12/165,475
Granted
Dec 7, 2010
Kind
B2
Abstract

A method of forming a semiconductor structure includes providing a substrate and providing a detach region which is carried by the substrate. A device structure which includes a stack of crystalline semiconductor layers is provided, wherein the detach region is positioned between the device structure and substrate. The stack is processed to form a vertically oriented semiconductor device.

Claims (31)

1. A method of forming a semiconductor structure, comprising:

providing a substrate;

providing a detach region which is carried by the substrate; and

providing a device structure which includes a stack of crystalline semiconductor layers;

wherein the detach region is positioned between the device structure and substrate.

2. The method of claim 1 , wherein the stack of crystalline semiconductor layers includes a first layer with a first conductivity type positioned between second and third layers with opposite conductivity types.

3. The method of claim 2 , wherein the first layer has a graded doping concentration.

4. The method of claim 1 , wherein the device structure is formed by ion implantation.

5. The method of claim 1 , wherein the detach region is formed after forming the device structure.

6. The method of claim 1 , wherein the device structure consists of the stack of crystalline semiconductor layers.

7. The method of claim 1 , wherein the device structure consists essentially of the stack of crystalline semiconductor layers.

8. A method of forming a semiconductor structure, comprising:

providing a substrate which consists essentially of single crystalline semiconductor material;

providing a detach region which is carried by the substrate; and

providing a device structure which consists essentially of a stack of crystalline semiconductor layers;

wherein the detach region is positioned between the device structure and substrate.

9. The method of claim 8 , wherein the stack of doped semiconductor layers includes a p+np+ junction.

10. The method of claim 8 , wherein the stack of doped semiconductor layers includes a n+pn+ junction.

11. The method of claim 8 , wherein a portion of the device structure has a graded doping concentration.

12. The method of claim 8 , wherein the detach region is formed before the device structure.

13. The method of claim 8 , further including forming a mesa structure from the device structure.

14. The method of claim 8 , wherein the detach region does not include semiconductor material.

15. A method of forming a semiconductor structure, comprising:

providing a first semiconductor substrate;

providing a detach region which is carried by the first semiconductor substrate, and

providing a stack of crystalline semiconductor layers which is carried by the first semiconductor substrate, the detach region being positioned between the first semiconductor substrate and the stack.

16. The method of claim 15 , further including coupling a second semiconductor substrate to the stack of crystalline semiconductor layers using bonding.

17. The method of claim 16 , further including detaching the first semiconductor substrate using the detach region.

18. The method of claim 17 , further including forming a mesa structure with the stack of crystalline semiconductor layers, the mesa structure being formed after the second semiconductor substrate is bonded to the stack of crystalline semiconductor layers.

19. The method of claim 18 , further including forming a vertically oriented semiconductor device with the mesa structure.

20. The method of claim 15 , wherein the stack consists essentially of semiconductor material.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Apr 27, 2018
From: DAEHONG TECHNEW CORPORATION
To: BESANG INC.
Reel/Frame 045658/0353 →
SECURITY AGREEMENT Recorded May 8, 2013
From: BESANG INC.
To: DAEHONG TECHNEW CORPORATION
Reel/Frame 030373/0668 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2011
From: LEE, SANG-YUN
To: BESANG, INC.
Reel/Frame 025695/0105 →
Continuity (3)
Division 1109249900 · Mar 29, 2005
Continuation In Part 1087396900 · Jun 21, 2004
Related Publication 20080261380A1 · Oct 23, 2008