Granted Patent B2

US 7,869,050 · App. 12/540,986 · Granted Jan 11, 2011

Assignee: Eoir Technologies, Inc.

Abstract

Claims (32)

1. A method for determining a background noise level, said method comprising:

receiving interferogram data;

determining at least one measure of interferogram quality;

generating a background noise level based on said interferogram data and at least one measure of interferogram quality.

2. The method of claim 1 , further comprising accumulating said received interferogram data.

3. The method of claim 2 , wherein said accumulating step includes generating at least one composite interferogram.

4. The method of claim 2 , wherein said accumulating step excludes said received interferogram data determined to have a quality less than a threshold quality.

5. The method of claim 1 , wherein said background noise level is represented as a set of threshold interferogram intensity values.

6. The method of claim 1 , wherein said background noise level is represented as a composite interferogram.

7. The method of claim 1 , wherein said generating step includes comparing received interferograms from at least two time periods.

8. The method of claim 1 , wherein said generating step includes comparing received interferograms from at least two spatial locations.

9. The method of claim 1 , wherein said method is repeated to determine A dynamic background noise level.

10. The method of claim 1 , further comprising:

partitioning at least one region of an interferogram from said interferogram data; and

excluding, from an accumulation of interferogram data, at least one portioned region of said interferogram determined to have a quality less than a threshold quality.

11. A method for identifying at least one chemical from sample interferogram data, said method comprising:

receiving interferogram data;

determining at least one measure of interferogram quality;

generating a background noise level based on said interferogram data and at least one measure of interferogram quality;

receiving sample interferogram data from a material under study;

comparing said sample interferogram data to said background noise level; and

comparing said sample interferogram data to at least one reference interferogram to identify at least one chemical indicated by said interferogram data.

12. The method of claim 11 , wherein said background noise level comprises a composite interferogram.

13. The method of claim 11 , wherein said comparing to a background noise level step comprises generating a ratio interferogram between said received interferogram data and said background noise level.

14. The method of claim 13 , wherein said ratio interferogram is compared to said at least one reference interferogram.

15. The method of claim 11 , further comprising determining at least one quality measure of said sample interferogram data.

16. The method of claim 15 , further comprising excluding sample interferogram data determined to have a quality measure less than a threshold quality measure from further comparisons.

17. The method of claim 11 , further comprising determining a percent composition of chemicals identified in said comparing to at least one reference interferogram.

18. The method of claim 11 , wherein said comparing to a background noise level step comprises determining if an intensity of at least one fringe of said received interferogram data exceeds a background intensity measure of said background noise level.

19. The method of claim 11 , wherein said comparing to at least one reference interferogram step comprises comparing selected partitions of said received interferogram data and said at least one reference interferogram.

20. The method of claim 19 , wherein said partitions are selected according to at least one of fringe position, fringe intensity, fringe shape, fringe intensity, fringe area, and background noise level.

21. The method of claim 20 , wherein said partitions exclude at least a portion of noise from said interferogram data.

Assignments (8)

Continuity (2)