Magnetic sensor including a free layer having perpendicular to the plane anisotropy
A magnetic sensor includes a reference layer having a first magnetization direction and a free layer assembly having an effective magnetization direction substantially perpendicular to the first magnetization direction and substantially perpendicular to a plane of each layer of the free layer assembly. A spacer layer is between the reference layer and the free layer, and a signal enhancement layer is exchange coupled to the free layer assembly on a side opposite the spacer layer.
1. A magnetic sensor comprising:
a reference layer having a first magnetization direction;
a free layer assembly having an effective magnetization direction substantially perpendicular to the first magnetization direction and substantially perpendicular to a plane of each layer of the free layer assembly;
a spacer layer between the reference layer and the free layer; and
a signal enhancement layer exchange coupled to the free layer assembly on a side opposite the spacer layer.
2. The magnetic sensor of claim 1 , wherein the free layer assembly comprises at least one layer comprised of TbFeCoX, wherein X is selected from the group consisting of Al, Y, Nd, Dy, and Sm.
3. The magnetic sensor of claim 1 , wherein the free layer assembly includes a stack of one or more bilayers.
4. The magnetic sensor of claim 3 , wherein the one or more bilayers are selected from the group consisting of a Co/Pt bilayer, a Co/Pd bilayer, a Co/Ni bilayer, and a Cu/Ni bilayer.
5. The magnetic sensor of claim 1 , wherein the free layer assembly has an effective anisotropic magnetic field of at least about 1.0 kOe.
6. The magnetic sensor of claim 1 , wherein the signal enhancement layer comprises CoFe.
7. The magnetic sensor of claim 1 , and further comprising:
an exchange coupling tuning layer between the free layer and the signal enhancement layer.
8. A magnetic sensor comprising:
a reference layer having a first magnetization direction;
a free layer assembly having an effective magnetization direction substantially perpendicular to the first magnetization direction and substantially perpendicular to a plane of each layer of the free layer assembly; and
a spacer layer between the reference layer and the free layer,
wherein the reference layer, free layer assembly, and spacer layer define a substantially planar surface, and wherein the reference layer extends away from the substantially planar surface further than any layer of the free layer assembly.
9. The magnetic sensor of claim 8 , wherein the free layer assembly comprises at least one layer comprised of TbFeCoX, wherein X is selected from the group consisting of Al, Y, Nd, Dy, and Sm.
10. The magnetic sensor of claim 8 , wherein the free layer assembly includes a stack of one or more bilayers.
11. The magnetic sensor of claim 10 , wherein the one or more bilayers are selected from the group consisting of a Co/Pt bilayer, a Co/Pd bilayer, a Co/Ni bilayer, and a Cu/Ni bilayer.
12. The magnetic sensor of claim 8 , wherein the free layer assembly has an effective anisotropic magnetic field of at least about 1.0 kOe.
13. The magnetic sensor of claim 8 , and further comprising:
a signal enhancement layer exchange coupled to the free layer assembly on a side opposite the spacer layer.
14. The magnetic sensor of claim 13 , wherein the signal enhancement layer comprises CoFe.
15. The magnetic sensor of claim 13 , and further comprising:
an exchange coupling tuning layer between the free layer and the signal enhancement layer.
16. A magnetic sensor comprising:
a reference layer having a first magnetization direction;
a free layer assembly having an effective magnetization direction substantially perpendicular to the first magnetization direction and substantially perpendicular to a plane of each layer of the free layer assembly;
a spacer layer between the reference layer and the free layer; and
a signal enhancement layer exchange coupled to the free layer assembly on a side opposite the spacer layer,
wherein the reference layer, free layer assembly, and spacer layer each have a first side that together define a substantially planar surface, wherein the reference layer, free layer assembly, and spacer layer each have a second side opposite the first side, and wherein the second side of the reference layer is at least as far from the substantially planar surface than the second side of the free layer assembly.
17. The magnetic sensor of claim 16 , wherein the free layer assembly comprises at least one layer comprised of TbFeCoX, wherein X is selected from the group consisting of Al, Y, Nd, Dy, and Sm.
18. The magnetic sensor of claim 16 , wherein the free layer assembly includes a stack of one or more bilayers.
19. The magnetic sensor of claim 18 , wherein the one or more bilayers are selected from the group consisting of a Co/Pt bilayer, a Co/Pd bilayer, a Co/Ni bilayer, and a Cu/Ni bilayer.
20. The magnetic sensor of claim 16 , and further comprising:
an exchange coupling tuning layer between the free layer and the signal enhancement layer.