IP Library Granted Patent US 8,004,075
Granted Patent B2
US 8,004,075 · App. 11/739,122 · Granted Aug 23, 2011

Semiconductor power module including epoxy resin coating

Assignee: Hitachi, Ltd.
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Quick Facts
Patent No.
US 8,004,075
App. No.
11/739,122
Granted
Aug 23, 2011
Kind
B2
Abstract

Use of Pb-free solder has become essential due to the environmental problem. A power module is formed by soldering substrates with large areas. It is known that in Sn-3Ag-0.5Cu which hardly creeps and deforms with respect to large deformation followed by warpage of the substrate, life is significantly shortened with respect to the temperature cycle test, and the conventional module structure is in the situation having difficulty in securing high reliability. Thus, the present invention has an object to select compositions from which increase in life can be expected at a low strain rate. In Sn solder, by doping In by 3 to 7% and Ag by 2 to 4.5%, the effect of delaying crack development at a low strain rate is found out, and as a representative composition stable at a high temperature, Sn-3Ag-0.5Cu-5In is selected. Further, for enhancement of reliability, a method for partially coating a solder end portion with a resin is shown.

Claims (23)

1. A semiconductor power module including a base substrate, a ceramic insulating substrate, and a semiconductor chip, wherein the base substrate, the ceramic insulating substrate and the semiconductor chip are connected to one another with solder, and wherein a gel filler is filled into the semiconductor power module to cover portions of said base substrate, said ceramic insulating substrate and the semiconductor chip,

wherein epoxy resin is coated on a perimeter of an end portion of the solder connected to the ceramic insulating substrate and the base substrate and coated on a perimeter of an end portion of the ceramic insulating substrate and a part of a surface of the base substrate in such a manner as to wrap them.

2. The semiconductor power module according to claim 1 ,

wherein dimple groove work is applied to a part of the base substrate and epoxy resin is coated on the part of the surface of the base substrate in such a manner as to wrap the dimple groove work.

3. The semiconductor power module according to claim 2 ,

wherein the gel filler comprises a silicon gel.

4. The semiconductor power module according to claim 1 or 2 ,

wherein a highly thermal conductive metal plate is soldered to a top surface of the semiconductor chip so that an electrode is obtained from a surface of the highly thermal conductive metal plate, and an undersurface of the thermal conductive metal plate, a perimeter of the semiconductor chip, a perimeter of a solder portion, a top of the ceramic insulating substrate in the perimeter, and a top of an electrode on the ceramic insulating substrate are coated with epoxy resin.

5. The semiconductor power module according to claim 4 ,

wherein the gel filler comprises a silicon gel.

6. The semiconductor power module according to claim 1 ,

wherein epoxy resin is at least partially coated on corner portions of the solder end portion of the ceramic insulating substrate.

7. The semiconductor power module according to claim 6 ,

wherein dimple groove work is applied to the surfaces of the base substrate coated with the epoxy resin.

8. The semiconductor power module according to claim 7 ,

wherein the gel filler comprises a silicon gel.

9. The semiconductor power module according to claim 6 ,

wherein the gel filler comprises a silicon gel.

10. The semiconductor power module according to claim 1 ,

wherein a periphery of the semiconductor chip is coated with a polyimide resin in advance before it is coated with the epoxy resin.

11. The semiconductor power module according to claim 10 ,

wherein the gel filler comprises a silicon gel.

12. The semiconductor power module according to claim 1 , wherein the gel filler comprises a silicon gel.

Assignments (3)
CHANGE OF NAME Recorded Apr 30, 2025
From: HITACHI POWER SEMICONDUCTOR DEVICE LTD.
To: MINEBEA POWER SEMICONDUCTOR DEVICE INC.
Reel/Frame 071142/0232 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2014
From: HITACHI, LTD.
To: HITACHI POWER SEMICONDUCTOR DEVICE, LTD.
Reel/Frame 034153/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2007
From: SOGA, TASAO; KAWASE, DAISUKE; SUZUKI, KAZUHIRO; MORISAKI, EIICHI; SAITO, KATSUAKI; SHIMOKAWA, HANAE
To: HITACHI, LTD.
Reel/Frame 019198/0266 →
Priority Claims (2)
JP 2006-120028 · Apr 25, 2006 · national
JP 2006-160421 · Jun 9, 2006 · national
Continuity (1)
Related Publication 20070246833A1 · Oct 25, 2007